1、 IEC 60444-9 Edition 1.0 2007-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 9: Measurement of spurious resonances of piezoelectric crystal units Mesure des paramtres des rsonateurs quartz Partie 9: Mesure des rsonances parasites des rsonateurs pizo
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16、-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 9: Measurement of spurious resonances of piezoelectric crystal units Mesure des paramtres des rsonateurs quartz Partie 9: Mesure des rsonances parasites des rsonateurs pizolectriques INTERNATIONAL ELEC
17、TROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE P ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-8322-0881-6 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this pu
18、blication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 60444-9 IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 9: Measurement of spurious resonances of piezoe
19、lectric crystal units FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning
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28、) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rig
29、hts. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-9 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and selection. This bilingual version (2013-08) corresponds to the mono
30、lingual English version, published in 2007-02. The text of this standard is based on the following documents: FDIS Report on voting 49/764/FDIS 49/774/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The French ve
31、rsion of this standard has not been voted upon. 60444-9 IEC:2007 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 60444 series, published under the general title Measurement of quartz crystal unit parameters, can be found on the IEC we
32、bsite. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, re
33、placed by a revised edition, or amended. 4 60444-9 IEC:2007 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 9: Measurement of spurious resonances of piezoelectric crystal units 1 Scope This part of IEC 60444 describes two methods for determining the spurious (unwanted) modes of piezoelectric crys
34、tal resonators. It extends the capabilities and improves the reproducibility and accuracy compared to previous methods. The previous methods described in IEC 60283 (1968) were based on the use of a measuring bridge, which applies to non-traceable components such as variable resistors and a hybrid tr
35、ansformer, which are no longer commercially available. Method A (Full parameter determination) Full parameter determination allows the determination of the equivalent parameters of the spurious resonances and is based on the methods described in IEC 60444-5 using the same measurement equipment. It i
36、s the preferred method, which can be applied to the measurement of low and medium impedance spurious resonances up to several k. Method B (Resistance determination) Resistance determination should be used for the determination of high impedance spurious resonances as specified, for example for certa
37、in filter crystals. It uses the same test equipment as method A in conjunction with a test fixture, which consists of commercially available microwave components such as a 180 hybrid coupler and a 10 dB attenuator, which are well-defined in a 50 environment. This method is an improvement to the “ref
38、erence method” of the obsolete IEC 60283. 2 Overview Piezoelectric crystal units show multiple resonances, which can be electrically represented by a parallel connection of a number of series resonant circuits. The one-port equivalent circuit of the complete crystal unit is shown in Figure 1 (taken
39、from IEC 60444-5). 60444-9 IEC:2007 5 G 0C 0C 1C 2C 3L 1L 2L 3R 1R 2R 3IEC 324/07 Figure 1 General one-port equivalent circuit for multiple resonances The total admittance Y totof the equivalent circuit for n resonance modes is therefore Y tot= G 0+ jC 0+ i i Y (1) with Y i= G i+ jB i= 1 ii i 1 R jL
40、 jC + + (i = 1,2,n) (2) Index i = 1 represents the main mode, while i = 2 n represents the spurious resonance modes. The spurious modes are regarded as uncoupled modes. Coupled modes can also be found by the described test methods, however their strong amplitude dependence does not allow for the pre
41、cise determination of their parameters. The attenuation i spur a , of a spurious mode i, is defined as the logarithmic ratio (expressed in dB) of its resistance R i , to the resistance R 1of the main mode: i i spur 10 1 R a 20 log R = (3) Figure 2 shows a typical spectrum for the spurious resonances
42、 of an AT-cut quartz crystal unit as displayed on a spectrum analyzer using a -network according to IEC 60444-1. 6 60444-9 IEC:2007 0 10 20 30 40 50 60 70 80 Attenuation dB 20 900 000 21 000 000 21 100 000 21 200 000 Frequency Hz IEC 325/07 Figure 2 Spectrum of spurious responses NOTE The attenuatio
43、n values measured on a network analyzer depend on the termination resistance of the test fixture used (e.g. 25 for a -network of IEC 60444-1). They are different from the spurious attenuation as computed from equation (3). NOTE The frequencies and attenuation values measured on a network analyzer ar
44、e different if the crystal resonator is connected to a load capacitor. See also note under 3.2.1.2. 3 Measurement methods The following measurement parameters are necessary and should be given in the detail specification: frequency range of the spurious resonances FR spurto be evaluated; level of dr
45、ive. Care must be taken in selecting a suitable measurement (sweep) time. 3.1 Method A (Full parameter determination) The measurement system consists of a -network or an s-parameter test fixture in accordance with IEC 60444-1 and IEC 604445 in conjunction with a network analyzer or an equivalent set
46、up. The admittance of the crystal is measured within the specified frequency range FR spur . The spurious resonances are isolated with the method of successive removal of resonances. From the admittance data, the equivalent circuit parameters of the various resonance modes are computed using one of
47、the evaluation procedures described in IEC 60444-5. 3.1.1 Measurement procedure The technique is described in more detail in 1 1 . The measurement sequence is as follows: a) measurement of the static capacitance C 0as in IEC 60444-5; 1Figures in square brackets refer to the bibliography. 60444-9 IEC
48、:2007 7 b) measurement of the main mode parameters (i = 1) as in IEC 60444-5, the resulting parameters are: series resonance frequency f s= f 1= 1 2 equivalent electrical parameters R 1 , C 1 , and L 1 , and quality factor Q = 1 1 1 1 1 1 1 1 R C R L Q = = (4) c) measurement of the complex admittanc
49、e Y res (f) in the specified frequency range FR spurMeasurement parameters: Assuming Q 2 , Q 3 , Q n Q 1(5) the minimum settling time t setfor each frequency is: t set= 1 1 Q (6) For at least two data points within the resonance bandwidth, the minimum number of data points N is N = spur 1 FR 2 Q (7) The minimum sweep time t swpis then t swp= t set N (8) NOTE If neces
