1、 IEC 60512-21-1Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 21-1: RF resistance tests Test 21a: RF shunt resistance Connecteurs pour quipements lectroniques Essais et mesures Partie 21-1: Essais de rsistance aux frquenc
2、es radiolectriques Essai 21a: Rsistance parallle aux frquences radiolectriques IEC60512-21-1:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or
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16、s commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-21-1Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests
17、and measurements Part 21-1: RF resistance tests Test 21a: RF shunt resistance Connecteurs pour quipements lectroniques Essais et mesures Partie 21-1: Essais de rsistance aux frquences radiolectriques Essai 21a: Rsistance parallle aux frquences radiolectriques INTERNATIONAL ELECTROTECHNICAL COMMISSIO
18、N COMMISSION ELECTROTECHNIQUE INTERNATIONALE DICS 31.220.01 PRICE CODECODE PRIXISBN 978-2-88910-954-8 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-21-1 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _
19、CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 21-1: RF resistance tests Test 21a: RF shunt resistance FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Co
20、mmittees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Ava
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29、ced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Internat
30、ional Standard IEC 60512-21-1 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 21a of IEC 60512-9, issued in 1992. The structure of the IEC 60512
31、series is explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2151/FDIS 48B/2186/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-21-1 IEC:2
32、010 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of
33、this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-21-1 IEC:2010
34、CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 21-1: RF resistance tests Test 21a: RF shunt resistance 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used
35、 for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to determine the value of RF shunt resistance which degrades the quality factor of an L/C circuit when a connector is connected in parallel. This value is expressed in terms
36、 of a parallel damping resistance. 2 Preparation of the specimen The specimen shall be prepared and mounted according to the detail specification. 3 Test method The R.F. shunt resistance shall be measured with suitable measuring equipment. The measuring points shall be specified in the detail specif
37、ication. The measuring error shall not exceed 10 %. The test frequency shall be specified in the detail specification. The preferred frequencies are: 1 MHz, 10 MHz, 30 MHz and 100 MHz. 4 Requirements The value of RF shunt resistance shall be not less than the value specified in the detail specificat
38、ion. 5 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) preparation and mounting of the specimen; b) measuring points; c) measuring frequency; d) minimum value of RF shunt resistance; e) any deviation from the standard test
39、method. _ 6 60512-21-1 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 21-1: Essais de rsistance aux frquences radiolectriques Essai 21a: Rsistance parallle aux frquences radiolectriques AVANT-PROPOS 1) La Commission Electrotechn
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