IEC 60747-5-5-2007 Semiconductor devices - Discrete devices - Part 5-5 Optoelectronic devices - Photocouplers《半导体装置.分立装置.第5-5部分 光电子装置.光电耦合器》.pdf

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1、 IEC 60747-5-5Edition 1.0 2007-09INTERNATIONAL STANDARD NORME INTERNATIONALESemiconductor devices Discrete devices Part 5-5: Optoelectronic devices Photocouplers Dispositifs semiconducteurs Dispositifs discrets Partie 5-5: Dispositifs optolectroniques Photocoupleurs IEC60747-5-5:2007 THIS PUBLICATIO

2、N IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

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5、 CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211

6、Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The techn

7、ical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of cr

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9、able on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrote

10、chnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de

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12、CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffre

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14、velles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les la

15、ngues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contacte

16、z-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60747-5-5Edition 1.0 2007-09INTERNATIONAL STANDARD NORME INTERNATIONALESemiconductor devices Discrete devices Part 5-5: Optoelectronic devices Photocouplers Dispositifs semiconducteurs Dispositifs discrets Partie 5-5: Dispositi

17、fs optolectroniques Photocoupleurs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XAICS 31.080.01; 31.260 PRICE CODECODE PRIXISBN 2-8318-8643-0 2 60747-5-5 IEC:2007 CONTENTS FOREWORD.6 1 Scope.8 2 Normative references .8 3 Photocoupler 9 3.1 Semiconductor materi

18、al.9 3.2 Details of outline and encapsulation 9 3.2.1 IEC and/or national reference number of the outline drawing .9 3.2.2 Method of encapsulation: glass/metal/plastic/other 9 3.2.3 Terminal identification and indication of any connection between a terminal and the case 9 3.3 Type of photocouplers.9

19、 3.3.1 DC input photocoupler .9 3.3.2 AC input photocoupler .9 3.3.3 Phototransistor photocoupler .9 3.3.4 Photodarlington photocoupler 9 3.3.5 Photothyristor photocoupler.9 3.3.6 Phototriac photocoupler.10 3.3.7 IC photocoupler .10 3.3.8 FET photocoupler 10 3.3.9 Photodiode photocoupler .10 3.3.10

20、IC input photocoupler 10 3.3.11 Solid state opto relay.10 4 Terms related to ratings and characteristics for photocouplers .10 4.1 Current transfer ratio .10 4.1.1 Static value of the (forward) current transfer ratio hF(ctr).10 4.1.2 Small-signal short-circuit (forward) current transfer ratio hf(ctr

21、).10 4.2 Cut-off frequency fco.10 4.3 Input-to-output capacitance CIO10 4.4 Isolation resistance RIO10 4.5 Isolation voltage 10 4.5.1 DC isolation voltage VIO11 4.5.2 Repetitive peak isolation voltage VIORM.11 4.5.3 Surge isolation voltage VIOSM11 4.6 Terms related to photocouplers with phototriac o

22、utput and/or solid state opto-relay with triac output 11 4.6.1 Repetitive peak voltage .11 4.6.2 Repetitive peak off-state voltage VDRM.11 4.6.3 Repetitive peak reverse voltage VRRM11 4.6.4 RMS on-state current IT(RMS)11 4.6.5 Peak off-state current IDRM11 4.6.6 Peak on-state voltage VTM11 4.6.7 DC

23、off-state current IBD11 4.6.8 DC on-state voltage VT.11 4.6.9 Holding current IH.11 4.6.10 Critical rate of rise of off-state voltage dV/dt 11 60747-5-5 IEC:2007 3 4.6.11 Trigger input current IFT12 4.7 Common mode transient immunity CMTI .12 5 Terms for photocoupler providing protection against ele

24、ctrical shock12 5.1 Safety ratings of a photocoupler for reinforced isolation 12 5.2 Electrical safety requirements of a photocoupler for reinforced isolation12 5.2.1 Partial discharge pd.12 5.2.2 Apparent charge qpd, q .12 5.2.3 Threshold apparent charge qpd(TH), qTH12 5.2.4 Test voltages for the p

25、artial-discharge test of a photocoupler 12 5.2.5 Test voltage Vpd(t), Vt.12 5.2.6 Partial discharge test voltage Vpd(t)13 5.2.7 Initial test voltage Vpd(ini), Vini.13 5.2.8 Apparent charge measuring voltage Vpd(m), Vm.13 5.2.9 Partial-discharge inception voltage Vpd(i), Vi.13 5.2.10 Partial-discharg

26、e extinction voltage Vpd(e), Ve13 5.2.11 Time intervals of the test voltage .13 5.3 Isolation voltages and isolation test voltages for photocouplers providing protection against electrical shock.16 5.3.1 Rated isolation voltage 16 5.4 Limiting values (absolute maximum system) over the operating temp

27、erature range, unless otherwise stated 16 5.4.1 Minimum and maximum storage temperatures Tstg.16 5.4.2 Minimum and maximum ambient or reference-point operating temperatures Tambor Tref16 5.4.3 Maximum soldering temperature Tsld16 5.4.4 Maximum continuous (direct) reverse input voltage VR16 5.4.5 Max

28、imum collector-emitter voltage, with the base open-circuited VCEO16 5.4.6 Maximum collector-base voltage, where an external base connection is present, with the emitter open-circuited VCBO.16 5.4.7 Maximum emitter-base voltage, where an external base connection is present, with the collector open-ci

29、rcuited VEBO16 5.4.8 Maximum emitter-collector voltage, where no external base connection is present VECO16 5.4.9 Maximum continuous (direct) or repetitive peak isolation voltage VIOor VIORM16 5.4.10 Where appropriate, maximum surge isolation voltage VIOSM16 5.4.11 Maximum continuous collector curre

30、nt IC17 5.4.12 Maximum continuous forward input current IFat an ambient or reference-point temperature of 25 C and derating curve or derating factor.17 5.4.13 Maximum peak forward input current IFMat an ambient or reference-point temperature of 25 C and under specified pulse conditions17 5.4.14 Maxi

31、mum power dissipation Ptrnof the output transistor at an ambient or reference-point temperature of 25 C and a derating curve or derating factor .17 5.4.15 Maximum total power dissipation of the package Ptotat an ambient or reference-point temperature of 25 C and derating curve or derating factor.17

32、4 60747-5-5 IEC:2007 6 Electrical characteristics.17 6.1 Phototransistor output photocoupler 17 6.2 Phototriac output photocoupler or solid state opto-relay 19 7 Photocouplers providing protection against electrical shock19 7.1 Type19 7.2 Ratings (have to be mentioned in a special section in the man

33、ufacturers data sheet)19 7.2.1 Safety ratings 19 7.2.2 Functional ratings19 7.2.3 Rated isolation voltages 19 7.3 Electrical safety requirements .20 7.4 Electrical, environmental and/or endurance test information (supplementary information).20 8 Measuring methods for photocouplers 27 8.1 Current tra

34、nsfer ratio hF(ctr)27 8.2 Input-to-output capacitance CIO28 8.3 Isolation resistance between input and output RIO29 8.4 Isolation test30 8.5 Partial discharges of photocouplers.31 8.6 Collector-emitter saturation voltage VCE(sat)of a photocoupler 34 8.6.1 Collector-emitter saturation voltage (d.c. m

35、ethod)34 8.6.2 Collector-emitter saturation voltage (pulse method) .35 8.7 Switching times ton, toff of a photocoupler 36 8.8 Peak off-state current IDRM37 8.9 Peak on-state voltage VTM.39 8.10 DC off-state current IBD41 8.11 DC on-state voltage VT.42 8.12 Holding current IH.43 8.13 Critical rate of

36、 rise of off-state voltage dV/dt43 8.14 Trigger input current IFT46 8.15 Measuring methods of common mode transient immunity (CMTI) for photocoupler .47 9 Testing methods of electrical rating for phototriac coupler 49 9.1 Repetitive peak off-state voltage VDRM49 9.2 DC off-state voltage VBD50 Annex

37、A (normative) Input/output safety test 51 Bibliography52 Figure 1a Time intervals for method a).14 Figure 1b Time intervals for method b).15 Figure 1 Time intervals of the test voltage15 Figure 2 Test voltage .17 Figure 3 Measurement circuit.27 Figure 4 Measurement circuit for input to output capaci

38、tance.29 Figure 5 Measurement circuit for isolation resistance.29 60747-5-5 IEC:2007 5 Figure 6 Test circuit for withstanding isolation voltage .30 Figure 7 Partial discharge test circuit .31 Figure 8 Complete test arrangement connections for calibration 32 Figure 9 DC measurement circuit.34 Figure

39、10 Pulse measurement circuit .35 Figure 11 Switching time measurement circuit .36 Figure 12 Switching times 37 Figure 13 Measurement circuit for peak off-state current38 Figure 14 Waveforms of the peak off-state voltage and current39 Figure 15 Measurement circuit for peak on-state voltage .40 Figure

40、 16 Waveforms of the peak on-state voltage and current 41 Figure 17 Measurement circuit for d.c. off-state current .41 Figure 18 Measurement circuit for d.c. on-state voltage .42 Figure 19 Measurement circuit for holding current43 Figure 20 Measurement circuit for critical rate of rise of off-state

41、voltage .44 Figure 21 Exponential waveform of the off-voltage (VD).45 Figure 22 Linear pulse form of the off-voltage (VD).45 Figure 23 Measurement circuit for the trigger input current 46 Figure 24 Output terminal voltage versus input forward current46 Figure 25 Common mode transient immunity (CMTI)

42、 measurement circuit for photocoupler.47 Figure 26 Typical waveforms of the common mode pulse (VCM) and optocoupler output (VO).49 Figure A.1 Circuit diagram .51 Table 1 Datasheet characteristics 20 Table 2 Tests and test sequence for photocoupler providing protection against electrical shock.26 Tab

43、le 3 Test conditions27 6 60747-5-5 IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SEMICONDUCTOR DEVICES DISCRETE DEVICES Part 5-5: Optoelectronic devices Photocouplers FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all

44、 national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Tec

45、hnical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory wo

46、rk. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2

47、) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommen

48、dations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any e

49、nd user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides

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