1、 IEC 61280-2-3 Edition 1.0 2009-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic communication subsystem test procedures Part 2-3: Digital systems Jitter and wander measurements Procdures dessai des sous-systmes de tlcommunications fibres optiques Partie 2-3: Systmes numriques Mesures des
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16、 vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61280-2-3 Edition 1.0 2009-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic communication subsystem test procedures Part 2-3: Digital systems Jitt
17、er and wander measurements Procdures dessai des sous-systmes de tlcommunications fibres optiques Partie 2-3: Systmes numriques Mesures des gigues et des drapages INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 33.180.01 PRICE CODE CODE PRIX ISBN 2-8318-1079
18、-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 61280-2-3 IEC:2009 CONTENTS FOREWORD.5 1 Scope.7 1.1 Types of jitter measurements 7 1.2 Types of wander measurements 7 2 Normative references .7 3 Te
19、rms and definitions .7 4 General considerations.11 4.1 Jitter generation 11 4.1.1 Timing jitter .11 4.1.2 Alignment jitter 11 4.1.3 Other effects12 4.2 Effects of jitter on signal quality.12 4.3 Jitter tolerance 12 4.4 Waiting time jitter 13 4.5 Wander .14 5 Jitter test procedures14 5.1 General cons
20、iderations14 5.1.1 Analogue method 14 5.1.2 Digital method .14 5.2 Common test equipment15 5.3 Safety .16 5.4 Fibre optic connections .17 5.5 Test sample 17 6 Jitter tolerance measurement procedure.17 6.1 Purpose 17 6.2 Apparatus17 6.3 BER penalty technique 17 6.3.1 Equipment connection .17 6.3.2 Eq
21、uipment settings18 6.3.3 Measurement procedure18 6.4 Onset of errors technique18 6.4.1 Equipment connection .18 6.4.2 Equipment settings19 6.4.3 Measurement procedure19 6.5 Jitter tolerance stressed eye receiver test .20 6.5.1 Purpose.20 6.5.2 Apparatus20 6.5.3 Sinusoidal jitter template technique .
22、20 7 Measurement of jitter transfer function .21 7.1 General .21 7.2 Apparatus21 7.3 Basic technique.22 7.3.1 Equipment connection .22 7.3.2 Equipment settings22 7.3.3 Measurement procedure22 7.4 Analogue phase detector technique.23 61280-2-3 IEC:2009 3 7.4.1 Equipment connections23 7.4.2 Equipment
23、settings23 7.4.3 Measurement procedure24 7.4.4 Measurement calculations .24 8 Measurement of output jitter.24 8.1 General .24 8.2 Equipment connection .24 8.2.1 Equipment settings24 8.2.2 Measurement procedure24 8.2.3 Controlled data25 9 Measurement of systematic jitter 25 9.1 Apparatus25 9.2 Basic
24、technique.25 9.2.1 Equipment connection .25 9.2.2 Equipment settings26 9.2.3 Measurement procedure26 10 BERT scan technique .27 10.1 Apparatus29 10.2 Basic technique.29 10.2.1 Equipment connection .29 10.2.2 Equipment settings29 10.2.3 Measurement process .29 11 Jitter separation technique .30 11.1
25、Apparatus31 11.2 Equipment connections .31 11.3 Equipment settings31 11.4 Measurement procedure32 11.4.1 Sampling oscilloscope: 32 11.4.2 Real-time oscilloscope.32 12 Measurement of wander .33 12.1 Apparatus33 12.2 Basic technique.33 12.2.1 Equipment connection .33 12.2.2 Equipment settings34 12.2.3
26、 Measurement procedure35 13 Measurement of wander TDEV tolerance35 13.1 Intent.35 13.2 Apparatus35 13.3 Basic technique.35 13.4 Equipment connection .35 13.4.1 Wander TDEV tolerance measurement for the test signal of EUT 35 13.4.2 Wander TDEV tolerance measurement for timing reference signal of EUT.
27、36 13.5 Equipment settings36 13.6 Measurement procedure37 14 Measurement of wander TDEV transfer 37 14.1 Apparatus37 14.2 Equipment connection .37 4 61280-2-3 IEC:2009 14.2.1 Wander TDEV transfer measurement for the test signal of EUT.37 14.2.2 Wander TDEV transfer measurement for timing reference s
28、ignal of EUT.37 14.3 Equipment settings38 14.4 Measurement procedure38 15 Test results 38 15.1 Mandatory information.38 15.2 Available information.39 Bibliography40 Figure 1 Jitter generation.11 Figure 2 Example of jitter tolerance13 Figure 3 Jitter and wander generator .15 Figure 4 Jitter and wande
29、r measurement .16 Figure 5 Jitter stress generator 16 Figure 6 Jitter tolerance measurement configuration: bit error ratio (BER) penalty technique18 Figure 7 Jitter tolerance measurement configuration: Onset of errors technique 19 Figure 8 Equipment configuration for stressed eye tolerance test.20 F
30、igure 9 Measurement of jitter transfer function: basic technique.22 Figure 10 Measurement of Jitter transfer: analogue phase detector technique .23 Figure 11 Output jitter measurement25 Figure 12 Systematic jitter measurement configuration: basic technique 26 Figure 13 Measurement of the pattern-dep
31、endent phase sequence xi 27 Figure 14 BERT scan bathtub curves (solid line for low jitter, dashed line for high jitter).28 Figure 15 Equipment setup for the BERT scan.29 Figure 16 Dual Dirac jitter model31 Figure 17 Equipment setup for jitter separation measurement31 Figure 18 Measurement of time in
32、terval error.32 Figure 19 Synchronized wander measurement configuration34 Figure 20 Non-synchronized wander measurement configuration.34 Figure 21 Wander TDEV tolerance measurement configuration for the test signal of EUT 36 Figure 22 Wander TDEV tolerance measurement configuration for the timing si
33、gnal of EUT 36 Figure 23 Wander TDEV transfer measurement configuration for the test signal of EUT 37 Figure 24 Wander TDEV transfer measurement configuration for the timing signal of EUT 38 61280-2-3 IEC:2009 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIBRE OPTIC COMMUNICATION SUBSYSTEM TEST PRO
34、CEDURES Part 2-3: Digital systems Jitter and wander measurements FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote internationa
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44、ication of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61280-2-3 has been prepared by subc
45、ommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre optics. This bilingual version, published in 2010-02, corresponds to the English version. The text of this standard is based on the following documents: FDIS Report on voting 86C/885/FDIS 86C/905/RVD Full info
46、rmation on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The French version of this standard has not been voted upon. 6 61280-2-3 IEC:2009 A list of all parts of the IEC 61280-2 series, published under the general title Fibre optic co
47、mmunication subsystem test procedures Digital systems, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the speci
48、fic publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its c
49、ontents. Users should therefore print this document using a colour printer. 61280-2-3 IEC:2009 7 FIBRE OPTIC COMMUNICATION SUBSYSTEM TEST PROCEDURES Part 2-3: Digital systems Jitter and wander measurements 1 Scope This part of IEC 61280 specifies methods for the measurement of the jitter and wander parameters associated with the transmission and
