IEC 61300-3-47-2014 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47 Examinations and measurements - End face geometry.pdf

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1、 IEC 61300-3-47 Edition 1.0 2014-07 INTERNATIONAL STANDARD Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules using interferometry IEC 61300-3-47:2014-07(e

2、n) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, wit

3、hout permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Com

4、mittee for further information. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Intern

5、ational Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalog

6、ue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/s

7、earchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publica

8、tions. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equi

9、valent terms in 14 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 55 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued

10、 since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 61

11、300-3-47 Edition 1.0 2014-07 INTERNATIONAL STANDARD Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules using interferometry INTERNATIONAL ELECTROTECHNICAL

12、COMMISSION Q ICS 33.180.20 PRICE CODE ISBN 978-2-8322-1708-5 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 61300-3-47:2014 IEC 2014 CONTENTS FOREWORD . 3 1 Scope 5 2 Term

13、s and definitions 5 3 Measurement by interferometer . 7 3.1 General . 7 3.2 Ferrule/connector holder . 7 3.3 Optical interferometric system . 8 3.4 Microscope with camera 8 4 Requirements for the interferometer 8 4.1 XY calibration (radius of curvature) . 8 4.2 Z calibration (fibre height) . 8 4.3 A

14、lignment of ferrule axis with the interferometers optical axis (apex offset calibration) 8 4.4 Tilt and key angle . 8 5 Measurement method 8 5.1 General . 8 5.2 Measurement regions . 9 5.3 Measurement procedure for the radius of curvature 9 5.4 Measurement procedure for the dome eccentricity (apex o

15、ffset) 10 5.5 Measurement procedure for fibre height 10 6 Details to be specified . 13 Annex A (normative) Calibration for the interferometer . 14 A.1 XY calibration . 14 A.2 Z calibration 14 A.3 Alignment of the ferule axis with the optical axis of the interferometer (“apex offset calibration”) . 1

16、4 A.4 Tilt and key angle . 14 Annex B (informative) Measurement procedure for end face “angle error” of angled convex polished ferrules . 15 Annex C (informative) Formula for calculating ferrule end face geometry . 17 Figure 1 Radius of curvature of a spherically polished ferrule end face 5 Figure 2

17、 Apex offset of a spherically polished ferrule end face . 6 Figure 3 Fibre height of a spherically polished ferrule end face 6 Figure 4 Ferrule end face angle for spherically polished ferrules 7 Figure 5 Interferometer 7 Figure 6 Ferrule end face and measurement regions . 9 Figure 7 Ferrule end face

18、 surface 11 Figure 8 Fitting region and averaging region of the ferrule end face surface 11 Figure 9 Converted end face surface of the ferrule . 12 Figure 10 Converted ferrule end face surface without the extracting region 12 Figure B.1 Example of key error calculated from interference pattern for a

19、 convex polished ferrule . 15 IEC 61300-3-47:2014 IEC 2014 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules

20、 using interferometry FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning

21、standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their prep

22、aration is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

23、 with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant

24、subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the techn

25、ical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum exte

26、nt possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide

27、conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its

28、directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses ar

29、ising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention i

30、s drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61300-3-47 has been prepared by subcommittee 86B: Fibre optic interconnecting

31、devices and passive components, of IEC technical committee 86: Fibre optics. This standard merges IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and IEC 61300-3-23. After publication of this standard IEC 61300-3-15, IEC 61300-3-16, IEC 61300-3-17 and IEC 61300-3-23 will be withdrawn. 4 IEC 61300-3-4

32、7:2014 IEC 2014 The text of this standard is based on the following documents: FDIS Report on voting 86B/3773/FDIS 86B/3805/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in acc

33、ordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61300 series, published under the general title, Fibre optic interconnecting and passive components Basic test and measurement procedures, can be found on the IEC website. The committee has decided that the contents of this

34、publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this

35、 publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. IE

36、C 61300-3-47:2014 IEC 2014 5 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules using interferometry 1 Scope This part of IEC 61300 describes a procedure t

37、o measure the end face geometry of a spherically polished ferrule or connector. Within this standard the words “ferrule” and “connector” can be used interchangeably. 2 Terms and definitions For the purposes of this document, the following terms and definitions apply. 2.1 radius of curvature B radius

38、 of curvature of the portion of the spherically polished ferrule end face which is domed for physical contact Note 1 to entry: It is assumed that the end face is spherical, although in practice the end face is often aspherical (see Figure 1). B IEC Figure 1 Radius of curvature of a spherically polis

39、hed ferrule end face 2.2 apex offset C distance between the axis of the ferrule and the line parallel to the axis which passes through the vertex (or highest point on the dome), formed by spherically polishing the ferrule, as shown in Figure 2 6 IEC 61300-3-47:2014 IEC 2014 Apex or highest point on

40、dome Apex offset (C) Ferrule Axis of ferrule IEC Figure 2 Apex offset of a spherically polished ferrule end face 2.3 fibre height average distance between the fibre end face and a virtual spherical surface which is fitted to the spherically polished ferrule end face (see Annex C) Note 1 to entry: It

41、 is assumed that a circular region of the ferrule end face, which is centred to the ferrule axis, is spherical although in practice the end face is often aspherical. A positive value indicates fibre undercut (see Figure 3a). A negative value indicates fibre protrusion (see Figure 3b). Fibre height V

42、irtual spherical surface Spherically polished ferrule end face Ferrule Fibre Adhesive +A IEC Figure 3a Fibre height +A -A IEC Figure 3b Fibre height A (protrusion) Figure 3 Fibre height of a spherically polished ferrule end face IEC 61300-3-47:2014 IEC 2014 7 2.4 end face angle angle ( ) between the

43、 plane perpendicular to the axis of the ferrule, and the straight line tangent to the polished surface at the fibre centre in the direction of the nominal angle (see Figure 4) Figure 4 Ferrule end face angle for spherically polished ferrules 3 Measurement by interferometer 3.1 General A typical inte

44、rferometer configuration is shown in Figure 5. The apparatus consists of a suitable ferrule/connector holder, an optical interferometric system combined with a microscope and a camera. Figure 5 Interferometer 3.2 Ferrule/connector holder This is a suitable device to hold the ferrule/connector in a f

45、ixed alignment position with respect to the optical axis of the interferometer. The holder is designed such that the portion of the ferrule closest to the end face is secured by the holder. The ferrule shall be aligned by holding it over a distance of at least twice the ferrule diameter. The ferrule

46、s axis should be adjustable in order to make it parallel to the optical axis of the interferometer. Alternatively, IEC Plane perpendicular to this fibre axis Ferrule Fibre axis Straight line tangent to the polished surface Holder Ferrule Mirror Light source Beam splitter Object Lens Camera X Z IEC Y

47、 8 IEC 61300-3-47:2014 IEC 2014 this can be carried out by positioning the reference mirror of the interferometer. For angled polished ferrules adjustments are necessary to align the polish angle axis with the optical axis of the interferometer. 3.3 Optical interferometric system A suitable optical

48、interferometric system (for example a Michelson interferometer) displays an image with interference fringes of the ferrules end face. 3.4 Microscope with camera The image of the end face is projected on to the camera with a minimum field of view of 250 m. Software processes the image(s) and calculat

49、es the required parameters. 4 Requirements for the interferometer 4.1 XY calibration (radius of curvature) The interferometer shall have the ability to measure the radius of curvature with measurement uncertainty better than 0,1 mm for radii from 5 mm to 30 mm. See Annex A. 4.2 Z calibration (fibre height) The interferometer shall have the ability to measure the fibre height with measurement uncertainty better than 10 nm. See Annex A. 4.3 Alignm

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