1、 IEC 61445 Edition 1.0 2012-06 INTERNATIONAL STANDARD Digital Test Interchange Format (DTIF) IEC 61445:2012(E) IEEE Std 1445-1998 IEEE Std 1445 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 1999 IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent 35.060 PRICE CODE ISBN 97
2、8-2-83220-105-3 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1445 Contents1. Overview 1 1.1 Scope 1 1.2 Purpose. 1 1.3 Application. 1 2. References 2 3. Denitions and acronyms 2 3.1 Denitions 2 3.2 Acronyms. 4 4. Data organization overview of the DTI
3、F standard environment 4 4.1 UUT Model Group. 5 4.2 Stimulus and Response Group. 5 4.3 Fault Dictionary Group 5 4.4 Probe Group. 5 5. File specications. 6 5.1 HEADER le . 7 5.2 STIMULUS le . 9 5.3 PO_RESPONSE le 10 5.4 PI_NAMES le 11 5.5 PO_NAMES le 12 5.6 MAIN_MODEL le. 13 5.7 COMPONENT_TYPE le. 14
4、 5.8 USER_NODE le 15 5.9 INPUT_PIN_NAMES le . 16 5.10 OUTPUT_PIN_NAMES le . 17 5.11 NEAR_FROMS_POINTERS le 18 5.12 NEAR_FROMS le . 19 5.13 EVENT le 20 5.14 SETTLED_STATE_ONLY le 22 5.15 SETTLED_STATE_ any IEC National Committee interested in the subject dealt with may participate in this preparatory
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20、tirely their own responsibility. - iv - IEC 61445:2012 IEEE Std 1445-1998 International Standard IEC 61445/ IEEE Std 1445-1998 has been processed through IEC technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documen
21、ts: IEEE Std FDIS Report on voting IEEE Std 1445-1998 93/321/FDIS 93/328/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of
22、this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IEC 61445:2012 IEEE St
23、d 1445-199 - v -The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1999 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 March 1999. Printed in the United States of America. IEEE Std
24、 1445-1998(R2009) IEEE Standard for Digital Test Interchange Format (DTIF) Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Reaffirmed 9 December 2009 Approved 8 December 1998 IEEE-SA Standards Board Reaffirmed 8 July 2004 Approved 16 November 1999 Americ
25、an National Standards Institute Abstract: The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This informati
26、on can be broadly grouped into data that defines the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe. Keywords: automatic test equipment (ATE), digital automated test program generator (DATPG), digital test interchange format (DTIF), Fault Dictionary data - vi - IEC 61445:20
27、12 IEEE Std 1445-1998 This introduction is not part of IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF). A digital automated test program generator (DATPG) produces test pattern and diagnostic data that can be used for testing printed circuit assemblies on automatic test
28、equipment (ATE). The use of several DATPGs, all with individual output formats, created a need for many unique post-processors to be developed and maintained for the life of the ATE. These post-processors supported the link from specic DATPGs to specic testers. The proliferation of unique formats an
29、d post-processors created logistical support problems and therefore identied a need for standardization. A DATPG and ATE independent output data format is required to limit the number of post-processors (one for each ATE) requiring life cycle support. The digital test interchange format (DTIF) was c
30、hosen because of its wide use and because it was becoming known in industry as the de facto standard. This document provides the basis to standardize digital test information for use on ATE. The digital test information consists of the unit under test (UUT) Model information, Stimulus and Response d
31、ata, Fault Dictionary data, and Probe data. DTIF is unique from other standards such as IEEE P1450 (Draft 0.95, dated July 1998), 1Draft Standard Test Interface Language (STIL) for Digital Test Vector Data, and IEEE Std 1029.1-1991, IEEE Standard for Waveform and Vector Exchange Specication (WA VES)
32、. STIL is being developed to standardize the output interface of existing computer-aided engineering (CAE) tools with the input interface of ATE for integrated circuit (IC) testing only. W A VES is a hardware descriptive language used for dening stimulus and response, and their associated timing for
33、 IC/board-level design. Neither STIL nor WAVES provides for board-level fault diagnostics. A future revision of this standard will consider the use of the information model. 1 IEEE P1450 is an IEEE authorized standards project that was not approved by the IEEE-SA Standards Boardat the time this publ
34、ication went to press. For information about obtaining the draft, contact the IEEE. IEC 61445:2012 IEEE Std 1445-199 - vii - 1. OverviewThe digital test interchange format (DTIF) is designed to provide a mechanism for digital test data inter- change independent of specic digital automated test progr
35、am generators (DATPGs) and test systems. The DTIF provides a neutral database for the development and delivery of digital simulation based test program sets (TPSs). DTIF functionally supports the unit under test (UUT) Model, Stimulus and Response, Fault Dictionary, and Probe databases.1.1 ScopeThis
36、standard denes the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that denes the following: a) UUT Model; b) Stim
37、ulus and Response; c) Fault Dictionary; d) Probe.1.2 PurposeThe purpose of this standard is to provide a standard output format for test data generated by a DATPG. A DATPG produces test patterns and fault diagnostic data for ATE. This data is used in applications such as board-level assemblies where diagnostic data interchange is important.1.3 ApplicationThis standard is primarily intended for use by digital simulator developers/maintainers and TPS developers/ maintainers. IEC 61445:2012 IEEE Std 1445-1998 - 1 -
