IEC 61745-2017 End-face image analysis procedure for the calibration of optical fibre geometry test sets《光学纤维几何参数测量装置校准端面影像分析程序》.pdf

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1、 IEC 61745 Edition 2.0 2017-07 INTERNATIONAL STANDARD NORME INTERNATIONALE End-face image analysis procedure for the calibration of optical fibre geometry test sets Procdure danalyse dimage dextrmit pour ltalonnage de dispositifs dessais de gomtrie des fibres optiques IEC 61745:2017-07(en-fr) THIS P

2、UBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writ

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10、ne and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in 16 additional languages. Also known as the International Electrotechn

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19、 sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61745 Edition 2.0 2017-07 INTERNATIONAL STANDARD NORME INTERNATIONALE End-face image analysis procedure for the calibration of optical fibre geometry test sets Procdure danalyse dimage dextrmit pour ltalonnage de dis

20、positifs dessais de gomtrie des fibres optiques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 33.180.01 ISBN 978-2-8322-4614-6 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique International

21、e Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 61745:2017 IEC 2017 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope 8 2 Normative references 8 3 Terms and def

22、initions 8 4 General information and preparation for calibration . 11 4.1 Geometrical parameters of optical fibres . 11 4.2 Description of geometry test sets 11 4.3 Calibration standard requirements 12 5 Calibration . 12 5.1 General . 12 5.2 Rationale for calibration of geometry test sets . 12 5.2.1

23、 General . 12 5.2.2 Verification of calibration state . 13 5.3 Calibration procedure 14 5.3.1 General advice and organization 14 5.3.2 Test requirements 14 5.3.3 Calibration standard requirements . 14 5.3.4 Determination of calibration factors 14 5.4 Check calibration procedure 16 5.5 Spatial linear

24、ity . 16 5.6 Calibration of core/cladding concentricity error measurement 17 5.7 Calibration of non-circularity measurement . 17 6 Evaluation of uncertainties 17 6.1 General . 17 6.2 Evaluation of uncertainty in test set calibration . 18 6.2.1 General . 18 6.2.2 Uncertainty in scaling factor . 18 6.

25、2.3 Uncertainty in offset correction factor 19 6.3 Evaluation of uncertainty in fibre measurement . 20 6.3.1 General . 20 6.3.2 Determination of u Op,I,F21 6.3.3 Determination of u I,F21 6.4 Evaluation of uncertainty in chromium mask measurement 21 6.4.1 General . 21 6.4.2 Determination of u Op,I,C.

26、 21 6.4.3 Determination of u I,C21 6.5 Summary 22 7 Documentation 22 7.1 Records 22 Annex A (normative) Mathematical basis for measurement uncertainty calculations . 23 A.1 General . 23 A.2 Type A evaluation of uncertainty . 23 A.3 Type B evaluation of uncertainty . 23 A.4 Determining the combined s

27、tandard uncertainty 24 A.5 Reporting 25 IEC 61745:2017 IEC 2017 3 Annex B (informative) Derivation of calibration factors . 26 B.1 Derivation of scaling factors 26 B.2 Derivation of correction offset factor . 27 Annex C (informative) Examples for the determination of calibration factors 29 C.1 Examp

28、le of determination of scaling factor 29 C.2 Example of determination of offset correction factor 29 Annex D (informative) Calculation of uncertainties . 30 D.1 General . 30 D.1.1 Overview . 30 D.1.2 Examples of type B evaluation of uncertainty . 30 D.2 Combining sources of uncertainty . 30 D.2.1 Ge

29、neral . 30 D.2.2 Example of combining several sources of uncertainty 31 D.3 Students t distribution 31 Annex E (informative) Worked examples for the determination of uncertainties 33 E.1 General . 33 E.2 Example of determination of scaling factor uncertainty 33 E.3 Example of determination of correc

30、tion offset uncertainty . 33 E.4 Example of determination of fibre measurement uncertainty 34 E.5 Example of determination of chromium mask measurement uncertainty 34 Annex F (informative) Generation of working standards . 35 F.1 Generation of working standards . 35 F.1.1 General . 35 F.1.2 Measurem

31、ent conditions 35 F.2 Procedure for generation of working standards . 35 F.2.1 In the case where the infant artefact is a fibre 35 F.2.2 In the case where the infant artefact is a chromium-on-glass artefact 35 Annex G (informative) Estimation of uncertainty in the measurement of core/cladding concen

32、tricity error 36 G.1 Method of estimating uncertainty in concentricity error measurement 36 G.1.1 General . 36 G.1.2 Determination of u . 36 G.1.3 Determination of u OP36 G.1.4 Determination of CB . 36 G.1.5 Determination of u CB. 38 G.2 Correcting for concentricity bias 38 Annex H (informative) Est

33、imation of uncertainty in the measurement of non-circularity 39 H.1 Method of estimating uncertainty in non-circularity measurement 39 H.2 Determination of u . 39 H.3 Determination of u Op39 H.4 Determination of NCB 39 H.4.1 General . 39 H.4.2 Method A: uncalibrated artefact . 40 H.4.3 Method B: cal

34、ibrated artefact . 40 H.5 Determination of u NCB. 40 Bibliography 41 Figure 1 Example of a calibration chain and the accumulation of uncertainties . 13 4 IEC 61745:2017 IEC 2017 Figure B.1 Representation of a grid calibration mask . 26 Figure B.2 Representation of an annulus calibration mask . 27 Fi

35、gure B.3 Derivation of correction offset . 28 Table D.1 Values of t for specified confidence level . 32 Table G.1 Measured values for angular positions . 37 IEC 61745:2017 IEC 2017 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ END-FACE IMAGE ANALYSIS PROCEDURE FOR THE CALIBRATION OF OPTICAL FIBRE GE

36、OMETRY TEST SETS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning stand

37、ardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparati

38、on is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with

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41、content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent po

42、ssible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide confo

43、rmity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its direc

44、tors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising

45、 out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is dra

46、wn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61745 has been prepared by IEC technical committee 86: Fibre optics. This second ed

47、ition cancels and replaces the first edition, published in 1998, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) removal of the limitation of single mode optical fibre geometry test sets to include multi

48、mode; b) addition of a new annex as mathematical basis. 6 IEC 61745:2017 IEC 2017 The text of this International Standard is based on the following documents: CDV Report on voting 86/510/CDV 86/516/RVC Full information on the voting for the approval of this International Standard can be found in the

49、 report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfirmed, withdrawn, replaced by a revised

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