1、 IEC 61747-10-2 Edition 1.0 2014-09 INTERNATIONAL STANDARD Liquid crystal display devices Part 10-2: Environmental, endurance and mechanical test methods Environmental and endurance IEC 61747-10-2:2014-09(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights
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11、 endurance and mechanical test methods Environmental and endurance INTERNATIONAL ELECTROTECHNICAL COMMISSION Q ICS 31.120 PRICE CODE ISBN 978-2-8322-1846-4 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized d
12、istributor. 2 IEC 61747-10-2:2014 IEC 2014 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms, definitions and symbols 6 4 Standard atmospheric conditions for measurements and tests: 6 5 Test methods . 6 5.1 General . 6 5.2 Rapid change of temperature: two-chamber method . 6 5.3 Specif
13、ied change rate of temperature: one-chamber method . 8 5.4 Storage (at high temperature) . 9 5.5 Storage (at low temperature) 10 5.6 Low air pressure . 11 5.7 Damp heat, steady state . 11 5.8 Damp heat, cyclic (12+12-hour cycle) . 12 5.9 Composite temperature/humidity cyclic test 12 5.10 Light expos
14、ure 15 5.10.1 Simulated solar radiation at ground level . 15 5.10.2 Simulated indoor daylight through window glass 15 5.10.3 Other radiation. 16 5.11 ESD Test 16 Bibliography 17 Figure 1 Temperature profile 7 Figure 2 Temperature profile 9 Figure 3 Preconditioning 13 Figure 4 Conditioning Exposure t
15、o humidity followed by exposure to cold . 14 Figure 5 Conditioning Exposure to humidity not followed by exposure to cold . 15 Table 1 Low test temperature . 6 Table 2 High test temperature 7 Table 3 Low test temperature . 8 Table 4 High test temperature 8 Table 5 Conditions of temperature and humidi
16、ty 11 IEC 61747-10-2:2014 IEC 2014 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 10-2: Environmental, endurance and mechanical test methods Environmental and endurance FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for
17、standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishe
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24、ervices carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC
25、National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attenti
26、on is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC
27、shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-10-2 has been prepared by IEC technical committee 110: Electronic display devices. This first edition of IEC 61747-10-2 cancels and replaces Clauses 1 and 3 of the first edition of IEC 61747
28、-5 published in 1998. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) Examples of the test conditions have been added to each test method; b) References cited have been updated. 4 IEC 61747-10-2
29、:2014 IEC 2014 The text of this standard is based on the following documents: CDV Report on voting 110/528/CDV 110/575A/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accorda
30、nce with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61747 series, published under the general title Liquid crystal display devices, can be found on the IEC website. NOTE It is intended that the other clauses of IEC 61747-5:1998 will be replaced by new parts in the IEC 61747 serie
31、s. The details of the intended changes are given in Annex D of IEC 61747-30-1:2012. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publicati
32、on. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IEC 61747-10-2:2014 IEC 2014 5 LIQUID CRYSTAL DISPLAY DEVICES Part 10-2: Environmental, endurance and mechanical test me
33、thods Environmental and endurance 1 Scope and object This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes into account, wherever possible, the environmental test methods outlined in IEC 60068. NOTE Devices include cells and modules. The object of this stan
34、dard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices. In case of contradiction between this standard and a relevant specification, the latter should govern. 2 Normative references The fo
35、llowing documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068 (al
36、l parts), Environmental testing IEC 60068-2-1, Environmental testing Part 2-1: Tests Test A: Cold IEC 60068-2-2, Environmental testing Part 2-2: Tests Test B: Dry heat IEC 60068-2-5, Environmental testing Part 2-5: Tests Test Sa: Simulated solar radiation at ground level and guidance for solar radia
37、tion testing IEC 60068-2-13, Basic environmental testing procedures Part 2-13: Tests Test M: Low air pressure IEC 60068-2-14:1984, Environmental testing Part 2-14: Tests Test N: Change of temperature IEC 60068-2-30, Environmental testing Part 2-30: Tests Test Db: Damp heat, cyclic (12 h + 12 h cycle
38、) IEC 60068-2-38:2009, Environmental testing Part 2-38: Tests Test Z/AD: Composite temperature/humidity cyclic test IEC 60068-2-78, Environmental testing Part 2-78: Tests Test Cab: Damp heat, steady state IEC 60747 (all parts), Semiconductor devices IEC 60747-1, Semiconductor devices Part 1: General
39、 6 IEC 61747-10-2:2014 IEC 2014 IEC 60748-1, Semiconductor devices Integrated circuits Part 1: General ISO 18909:2006, Photography Processed photographic colour films and paper prints Methods for measuring image stability 3 Terms, definitions and symbols For the purposes of this standard, the terms,
40、 definitions and symbols given in IEC 60068, IEC 60747, IEC 60748-1 and IEC 61747-1 apply. 4 Standard atmospheric conditions for measurements and tests: Unless otherwise specified, all tests and measurements shall be carried out under standard atmospheric conditions for testing: Temperature: 15 C to
41、 35 C Relative humidity: 25 % to 85 % RH, where appropriate Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) The absolute humidity of the atmosphere shall not exceed 22 g/m 3 . 5 Test methods 5.1 General The choice of the appropriate tests depends on the type of devices. The relevant specifi
42、cation shall state which tests are applicable. Regarding the change of temperature, test Na, specified in IEC 60068-2-14, is applicable. 5.2 Rapid change of temperature: two-chamber method This test shall be in accordance with test Na, with the following specific requirements: the absolute humidity
43、of the atmosphere shall not exceed 20 g/m 3 ; the lower temperature T Ashall be specified in the relevant specification and shall be chosen from the test temperature of Table 1; the higher temperature T Bshall be specified in the relevant specification and shall be chosen from the test temperature o
44、f Table 2; Table 1 Low test temperature Low temperature T AC 50 3 45 3 40 3 35 3 30 3 25 3 20 3 15 3 10 3 5 3 0 3 IEC 61747-10-2:2014 IEC 2014 7 Table 2 High test temperature High temperature T BC +100 2 +95 2 +90 2 +85 2 +80 2 +75 2 +70 2 +65 2 +60 2 +55 2 +50 2 +45 2 +40 2 +35 2 +30 2 the exposure
45、 time t 1of each of the two temperatures depends upon the thermal capacity of the device. It shall be 3 h, 2 h, 1 h, 30 min or 10 min as specified in the relevant specification. Where no exposure period is prescribed in the relevant specification it is understood to be 3 h; t 2is the time from unloa
46、ding from one chamber to loading to the other chamber. The transition time should be: 2 min to 3 min; 20 s to 30 s; less than 10 s; the first cycle comprises the two exposure times t 1and the two transition times t 2(see Figure 1); the number of cycles shall be 5, 10, 50, 100, 200 unless otherwise s
47、pecified in the relevant specification; initial measurements: an external visual examination; mechanical, electrical and optical tests: as given in the relevant specification; final measurements: an external visual examination; mechanical, electrical, and optical tests: as specified at the initial m
48、easurements and in the relevant specification. A = start of first cycle B = end of first cycle and start of second cycle NOTE The dotted curve is explained in 1.3.1.5 of IEC 60068-2-14:1984. Figure 1 Temperature profile for the two-chamber method A B t 110 t 110 t 1t 2t 2T BT At 1Time t First cycle
49、Temperature in the chamber IEC 8 IEC 61747-10-2:2014 IEC 2014 Example test conditions (for thermal shock test): T a= -40 C, T b= +85 C, t 1= 30 min, t 2= 3 min, 50 cycles T a= -40 C, T b= +85 C, t 1= 30 min, t 2= 3 min, 100 cycles T a= -30 C, T b= +80 C, t 1= 30 min, t 2= 3 min, 100 cycles 5.3 Specified change rate of temperature: one-chamb
