IEC 61987-11-2016 Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 11 Lists of properties (LOPs) of measuring equipm.pdf

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1、 IEC 61987-11 Edition 2.0 2016-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Industrial-process measurement and control Data structures and elements in process equipment catalogues Part 11: Lists of properties (LOPs) of measuring equipment for electronic data exchange Generic structures Mesure et c

2、ommande des processus industriels Structures de donnes et lments dans les catalogues dquipement de processus Partie 11: Listes des proprits (LOP) dquipements de mesure pour lchange lectronique de donnes Structures gnriques IEC 61987-11:2016-12(en-fr) colour inside THIS PUBLICATION IS COPYRIGHT PROTE

3、CTED Copyright 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs m

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7、19 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The te

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19、franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si

20、vous avez des questions contactez-nous: csciec.ch. IEC 61987-11 Edition 2.0 2016-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Industrial-process measurement and control Data structures and elements in process equipment catalogues Part 11: Lists of properties (LOPs) of measuring equipment for elect

21、ronic data exchange Generic structures Mesure et commande des processus industriels Structures de donnes et lments dans les catalogues dquipement de processus Partie 11: Listes des proprits (LOP) dquipements de mesure pour lchange lectronique de donnes Structures gnriques INTERNATIONAL ELECTROTECHNI

22、CAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 25.040.40; 35.100.20 ISBN 978-2-8322-3692-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an

23、authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 61987-11:2016 IEC 2016 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope 9 2 Normative references 9 3 Terms and definitions 10 3.1 Terms and definitions concernin

24、g measuring instruments . 10 3.2 Terms and definitions concerning relationships . 11 4 General . 13 4.1 Characterization scheme. 13 4.2 Aspects . 13 4.3 Rules for the construction of LOPs with block structure . 15 4.3.1 Block order 15 4.3.2 Position of cardinality properties 15 4.3.3 Naming of block

25、s created by cardinality . 15 4.3.4 Characterizing property . 15 4.3.5 Validity 15 4.4 OLOP and DLOP 15 4.5 Operating conditions . 16 4.6 Measuring equipment configuration . 17 5 Operating list of properties (OLOP) 18 5.1 Generic block structure . 18 5.2 Base conditions 19 5.3 Process case 19 5.3.1

26、General . 19 5.3.2 Process case variables 19 5.3.3 Other process case variable 20 5.4 Operating conditions for device design 20 5.4.1 General . 20 5.4.2 Installation design conditions . 20 5.4.3 Environmental design conditions 20 5.4.4 Process design conditions . 21 5.4.5 Pressure-temperature design

27、 conditions 21 5.5 Process equipment . 22 5.5.1 General . 22 5.5.2 Line or nozzle 22 5.6 Physical location . 22 5.6.1 General . 22 5.6.2 Available power supply 22 5.6.3 Process criticality classification . 23 5.6.4 Area classification . 23 6 Device list of properties (DLOP) 23 6.1 General . 23 6.1.1

28、 Generic block structure 23 6.1.2 Relationship to IEC 61987-1 25 6.1.3 Multivariable devices . 25 6.2 Identification . 26 IEC 61987-11:2016 IEC 2016 3 6.3 Application 26 6.4 Function and system design 26 6.4.1 General . 26 6.4.2 Dependability . 26 6.5 Input . 26 6.5.1 General . 26 6.5.2 Measured var

29、iable . 26 6.5.3 Auxiliary input 27 6.6 Output. 28 6.6.1 General . 28 6.6.2 output . 29 6.7 Digital communication . 30 6.7.1 General . 30 6.7.2 Digital communication interface . 30 6.8 Performance . 30 6.8.1 General . 30 6.8.2 Reference conditions for the device . 30 6.8.3 Performance variable . 30

30、6.9 Rated operating conditions . 32 6.9.1 General . 32 6.9.2 Installation conditions 32 6.9.3 Environmental design ratings . 33 6.9.4 Process design ratings 33 6.9.5 Pressure-temperature design ratings . 34 6.10 Mechanical and electrical construction 34 6.10.1 General . 34 6.10.2 Overall dimensions

31、and weight 34 6.10.3 Structural design . 35 6.10.4 Explosion protection design approval . 35 6.10.5 Codes and standards approval 35 6.11 Operability 35 6.11.1 General . 35 6.11.2 Basic configuration 35 6.11.3 Parametrization . 35 6.11.4 Adjustment 35 6.11.5 Operation 35 6.11.6 Diagnosis 35 6.12 Powe

32、r supply 36 6.13 Certificates and approvals. 36 6.14 Component part identifications 36 7 Composite devices 36 7.1 Structure of composite devices . 36 7.2 Aspects of components . 38 8 Additional aspects . 38 8.1 Administrative information . 38 8.2 Calibration and test . 39 8.3 Accessories 39 8.4 Devi

33、ce documents supplied. 39 8.5 Packaging and shipping 39 4 IEC 61987-11:2016 IEC 2016 8.6 Digital communication parametrization 39 8.7 Example of a composite device with aspects . 39 Annex A (informative) Device type dictionary Classification of process measuring equipment according to measuring char

34、acteristics 41 Bibliography 60 Figure 1 Characterisation of measuring equipment 13 Figure 2 Simplified UML scheme of device, LOPs and aspects 14 Figure 3 Assignment of OLOPs and DLOPs for equipment used to measure one type of measured variable 16 Figure 4 Structure of a composite device . 37 Figure

35、5 Example for the structure of an LOP for a composite device showing different aspects related to different sub-components . 40 Table 1 Structure of the block “Operating conditions for device design” in the OLOP . 17 Table 2 Structure of the block “Rated operating conditions” in the DLOP . 17 Table

36、3 Generic block structure of an OLOP 18 Table 4 Generic block structure of a DLOP 24 Table 5 DLOP structure for composite devices . 37 Table A.1 Classification scheme for process measuring equipment 41 IEC 61987-11:2016 IEC 2016 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL-PROCESS MEASUR

37、EMENT AND CONTROL DATA STRUCTURES AND ELEMENTS IN PROCESS EQUIPMENT CATALOGUES Part 11: Lists of properties (LOPs) of measuring equipment for electronic data exchange Generic structures FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization co

38、mprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International St

39、andards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this pr

40、eparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two org

41、anizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the for

42、m of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpreta

43、tion by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or re

44、gional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried ou

45、t by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committee

46、s for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the

47、 Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held

48、responsible for identifying any or all such patent rights. International Standard IEC 61987-11 has been prepared by subcommittee 65E: Devices and integration in enterprise systems, of IEC technical committee 65: Industrial-process measurement, control and automation. This second edition cancels and

49、replaces the first edition published in 2012. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) The classification in Table A.1 has been amended to reflect the changes in the classification scheme of process measuring equipment in the CDD due to the development of IEC 61987-14, IEC 61987-

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