1、 IEC 61988-5Edition 1.0 2009-11INTERNATIONAL STANDARD NORME INTERNATIONALEPlasma display panels Part 5: Generic specification Panneaux daffichage plasma Partie 5: Spcification gnrique IEC61988-5:2009 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC, Geneva, Switzerland All rights reserved.
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16、on 1.0 2009-11INTERNATIONAL STANDARD NORME INTERNATIONALEPlasma display panels Part 5: Generic specification Panneaux daffichage plasma Partie 5: Spcification gnrique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE TICS 31.260 PRICE CODECODE PRIXISBN 2-8318-1071-
17、1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61988-5 IEC:2009 CONTENTS FOREWORD.4 1 Scope.6 2 Normative references .6 3 Order of precedence.7 4 Terminology, units, symbols and abbreviations.7 5 Standard enviro
18、nmental conditions.8 6 Marking 8 6.1 Device identification code8 6.2 Device traceability code 8 6.3 Packing .8 7 Quality assessment procedures8 7.1 General .8 7.2 Eligibility for qualification and/or capability approval8 7.3 Primary stage of manufacture8 7.4 Commercially confidential information .9
19、7.5 Formation of inspection lots.9 7.6 Structurally similar devices9 7.7 Subcontracting 9 7.8 Incorporated components 9 7.9 Validity of release9 8 Qualification approval procedure 9 8.1 Qualification approval testing 9 8.2 Granting of qualification approval 9 8.3 Quality conformance inspection requi
20、rements9 8.3.1 General .9 8.3.2 Division into groups and subgroups .10 8.3.3 Inspection requirements 12 8.3.4 Supplementary procedure for reduced inspection 12 8.3.5 Sampling requirements for small lots .13 8.3.6 Certified records of released lots (CRRL) 13 8.3.7 Delivery of device subjected to dest
21、ructive or non-destructive tests.13 8.3.8 Delayed deliveries .13 8.3.9 Supplementary procedure for deliveries.13 8.4 Statistical sampling procedures .13 8.4.1 AQL sampling plans.14 8.4.2 LTPD sampling plans.14 8.5 Endurance tests 14 8.6 Endurance tests where the failure rate is specified14 8.6.1 Gen
22、eral .14 8.6.2 Selection of samples .14 8.6.3 Failure.14 8.6.4 Endurance test time and sample size 14 8.6.5 Procedure to be used when the number of observed failures exceeds the acceptance number .14 8.7 Accelerated test procedures 15 9 Capability approval procedures 15 61988-5 IEC:2009 3 10 Test an
23、d measurement procedures.15 10.1 Standard conditions and general precautions 15 10.1.1 Standard conditions.15 10.1.2 General precautions 15 10.1.3 Precision of measurements .16 10.2 Physical examination.16 10.2.1 Visual examination 16 10.2.2 Dimensions .16 10.3 Electrical and optical measurements .1
24、6 10.4 Climatic and mechanical tests .16 10.5 Alternative test methods16 10.6 Endurance.16 Annex A (normative) Lot tolerance percentage defective (LTPD) sampling plans .17 Annex B (informative) General description of specifications .22 Table A.1 LTPD sampling plans .19 Table A.2 Hypergeometric sampl
25、ing plans for small lot size of 200 or less .20 Table A.3 AQL and LTPD sampling plans.21 4 61988-5 IEC:2009 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PLASMA DISPLAY PANELS Part 5: Generic specification FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for
26、standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishe
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33、rvices carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC N
34、ational Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attentio
35、n is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC s
36、hall not be held responsible for identifying any or all such patent rights. International Standard IEC 61988-5 has been prepared by IEC technical committee 110: Flat panel display devices. The text of this standard is based on the following documents: FDIS Report on voting 110/182/FDIS 110/191/RVD F
37、ull information on the voting for the approval on this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 61988 series, under the general title Plasma disp
38、lay panels, can be found on the IEC website. 61988-5 IEC:2009 5 The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this
39、 date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. 6 61988-5 IEC:2009 PLASMA DISPLAY PANELS Part 5: Generic specification 1 Scope This generic specification for plasma display panels specifies general procedures for quality assessment to be used in the
40、IECQ-CECC system and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the editio
41、n cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027 (all parts), Letter symbols to be used in electrical technology IEC 60050 (all parts), International electrotechnical vocabulary IEC 60410:1973, Sampling plans and pro
42、cedures for inspection by attributes IEC 60617, Graphical symbols for diagrams IEC 60747-1, Semiconductor devices Part 1: General IEC 61988-1, Plasma display panels Part 1: Terminology and letter symbols IEC 61988-2-1, Plasma display panels Part 2-1: Measuring methods Optical IEC 61988-2-2, Plasma d
43、isplay panels Part 2-2: Measuring methods Optoelectrical IEC 61988-3-1, Plasma display panels Part 3-1: Mechanical interface IEC 61988-4, Plasma display panels Part 4: Climatic and mechanical testing methods IECQ 01, IEC Quality Assessment System for Electronic components (IECQ) Basic Rules QC 00100
44、2 (all parts), IEC Quality Assessment System for Electronic components (IECQ) Rules of Procedure ISO 1000:1992, SI units and recommendations for the use of their multiples and of certain other units ISO 2859-1, Sampling procedures for inspection by attributes Part 1: Sampling schemes indexed by acce
45、ptance quality limit (AQL) for lot-by-lot inspection ISO 2859-10, Sampling procedures for inspection by attributes Part 10: Introduction to the ISO 2859 series of standards for sampling for inspection by attributes ISO 3534-2, Statistics Vocabulary and symbols Part 2: Applied statistics 61988-5 IEC:
46、2009 7 3 Terms, definitions, units, symbols and abbreviations 3.1 Terms and definitions For the purpose of this document, the following terms and definitions given in IEC 61988-1, IEC 60050 series, IECQ 01, and ISO 3534-2 apply. NOTE Special terms for statistical quality control are given in IECQ 01
47、 and ISO 3534-2. 3.2 Units, symbols and abbreviations Units, graphical and letter symbols shall, wherever possible, be taken from IEC 60027, IEC 60617 and ISO 1000:1992. Any other units, symbols or terminology peculiar to one of the devices covered by this generic specification shall be taken from t
48、he relevant IEC or ISO standards (see Clause 2) or derived in accordance with the principles of the standards listed above. In this document following abbreviations are used: AQL: Acceptance quality level (see 8.4.1) LTPD: Lot tolerance percentage defectives (see 8.4.2) SI: Supervising Inspectorate
49、DMR: Designated Management Representative 4 Order of precedence The documents are ranked in the following order of authority: a) Detail specifications b) Blank detail specifications c) Sectional specifications d) Generic specifications e) Basic specifications f) IECQ rules of procedure g) Any other international (e.g. IEC) documents to which reference is made h) National documents. The
