IEC 62058-11-2008 Electricity metering equipment (AC) - Acceptance inspection - Part 11 General acceptance inspection methods《电计量设备(AC).验收检验.第11部分 通用验收检验方法》.pdf

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1、 IEC 62058-11 Edition 1.0 2008-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Electricity metering equipment (AC) Acceptance inspection Part 11: General acceptance inspection methods Equipement de comptage de llectricite (c.a.) Contrle de rception Partie 11: Mthodes gnrales de contrle de rception IE

2、C 62058-11:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, with

3、out permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Comm

4、ittee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la

5、 CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central O

6、ffice 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. A

7、bout IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables y

8、ou to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all n

9、ew publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known

10、 as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax

11、: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu te

12、chnique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des

13、 recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dta

14、ille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que le

15、s termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ

16、 du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62058-11 Edition 1.0 2008-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Electricity metering equipment (AC) Acceptance inspection Part 11: General acceptance inspection methods Equipement de comp

17、tage de llectricite (c.a.) Contrle de rception Partie 11: Mthodes gnrales de contrle de rception INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XC ICS 17.220; 91.140.50 PRICE CODE CODE PRIX ISBN 2-8318-9988-5 Registered trademark of the International Electrotech

18、nical Commission Marque dpose de la Commission Electrotechnique Internationale 2 62058-11 IEC:2008 CONTENTS FOREWORD.6 INTRODUCTION.8 1 Scope.9 2 Normative references .9 3 Terms and definitions .9 3.1 Sources of data.10 3.2 Types of sampling .11 3.3 Specifications, values and test results.11 3.4 Typ

19、es of inspection .12 3.5 Types of acceptance sampling inspection14 3.6 Acceptance sampling inspection system aspects.15 3.7 Acceptance criteria16 3.8 Types of operating characteristic curves18 3.9 Terms relating to operating characteristics 18 3.10 Outgoing quality concepts .21 3.11 Other terms.21 4

20、 Symbols and abbreviations.22 4.1 Symbols 22 4.2 Acronyms 23 5 General 23 5.1 The objectives of acceptance inspection .23 5.2 Acceptance sampling plans, schemes and systems.24 5.3 Practical and economic advantages of using standard sampling plans 24 5.4 Agreement between the parties .25 5.5 Selectio

21、n of sampling schemes and sampling plans 26 5.6 Considerations influencing a selection.27 5.6.1 Long and short production runs .27 5.6.2 Lot-by-lot inspection 28 5.6.3 Isolated lot inspection28 5.6.4 Attributes versus variables 28 5.6.5 Single and double sampling.29 5.6.6 “s” method and “” method.29

22、 5.7 Nonconformity and nonconforming items .29 5.8 Classification of nonconformities .29 5.9 Operating characteristic (OC) curve 30 5.10 Producers risks (PR) and consumers risk (CR) 30 5.11 AQL, PRQ, LQ and CRQ .31 5.12 Switching rules for normal, tightened and reduced inspection31 5.13 Inspection l

23、evel .32 5.14 Sample size code letter .32 5.15 Place of inspection33 5.16 Submission of product for acceptance inspection 33 5.17 Drawing of samples.33 5.18 Acceptability of lots .34 6 100 % inspection34 6.1 Application of the method34 62058-11 IEC:2008 3 6.2 Lot sizes and acceptance numbers34 6.3 A

24、cceptance and non-acceptance.35 7 Lot-by-lot inspection by attributes.35 7.1 Application of the method35 7.2 Drawing of samples.36 7.3 Inspection level .36 7.4 Sampling plans36 7.4.1 Obtaining a sampling plan .36 7.4.2 Single sampling plans36 7.4.3 Double sampling plans 39 7.4.4 Determination of acc

25、eptability40 7.5 Normal, tightened and reduced inspection (see also 5.12).41 7.5.1 Start and continuation of inspection.41 7.5.2 Normal to tightened .41 7.5.3 Tightened to normal.42 7.5.4 Normal to reduced.42 7.5.5 Reduced to normal 43 7.5.6 Discontinuation and resumption of inspection 43 7.6 Operat

26、ing characteristic (OC) curves.43 7.7 Process average .46 7.8 Average outgoing quality (AOQ) 46 7.9 Average outgoing quality limit (AOQL).46 7.10 Consumers risk (CR) 47 7.11 Producers risk (PR) 49 8 Isolated lot inspection.50 8.1 Application of the method50 8.2 Procedures specified.50 8.2.1 Procedur

27、e A 50 8.2.2 Procedure B 50 8.3 Limiting quality 50 8.4 Procedure A 50 8.5 Procedure B 53 8.6 Rules for acceptance and non-acceptance 55 9 Skip-lot inspection55 9.1 Application of the method55 9.2 Manufacturer qualification .56 9.3 Product qualification56 9.4 Detailed procedures 57 10 Lot-by-lot ins

28、pection by variables .57 10.1 Application of the method57 10.2 Choice between the “s” and the “” methods57 10.3 Standard plans 58 10.4 Preliminary operations.58 10.5 Standard multivariate “s” method procedures for independent quality characteristics with combined control 58 10.5.1 General methodolog

29、y 58 10.5.2 Sampling plans59 10.5.3 Description of the procedure60 10.5.4 Simplified exact formula for the “s” method with sample size 461 4 62058-11 IEC:2008 10.5.5 Approximate procedure for the “s” method for n 5 .61 10.6 Standard multivariate “” method procedures for independent quality character

30、istics with combined control 64 10.6.1 General methodology 64 10.6.2 Sampling plans65 10.6.3 Description of the procedure65 10.7 Procedure during continuing inspection .66 10.8 Normality and outliers66 10.8.1 Normality.66 10.8.2 Outliers .66 10.9 Records 66 10.9.1 Control charts66 10.9.2 Lots that a

31、re not accepted .66 10.10 Normal, tightened and reduced inspection (see also 5.12) 66 10.11 Discontinuation and resumption of inspection .67 10.12 Switching between the “s” and “ ” methods .68 10.12.1 Estimating the process standard deviation 68 10.12.2 State of statistical control 68 10.12.3 Switch

32、ing from the “s” method to the “ ” method68 10.12.4 Switching from the “ ” method to the “s” method69 10.13 Consumer protection 69 10.14 Operating characteristic curves 69 10.15 Consumers risk (CR) .72 10.16 Producer risk (PR) .74 Annex A (normative) Random numbers76 Annex B (normative) Procedure fo

33、r obtaining s or .79 Bibliography80 Figure 1 Selection procedure of sampling schemes and plans .27 Figure 2 Outline of switching rules .32 Figure 3 OC curves for AQL = 1,0, single sampling plans, normal inspection .44 Figure 4 OC curves for AQL = 1,0, single sampling plans, tightened inspection .44

34、Figure 5 OC curves for single sampling plans, Ac=0 45 Figure 6 Operating characteristic curves for single sampling plans for non-critical nonconformities, procedure B .54 Figure 7 OC curves for normal inspection, AQL = 1,0.69 Figure 8 OC curves for tightened inspection, AQL = 1,0.70 Figure 9 OC curv

35、es for reduced inspection, AQL = 1,0.71 Table 1 Acceptance number Ac for 100 % inspection.34 Table 2 Single sampling plans for normal, tightened and reduced inspection, AQL = 1,0.37 Table 3 Example with lot size = 80, inspection level II37 Table 4 Example with lot size = 400, inspection level II38 T

36、able 5 Example with lot size = 800, inspection level III.38 Table 6 Single sampling plans for critical nonconformities Ac = 0.39 Table 7 Double sampling plans for normal, tightened and reduced inspection, AQL = 1,0 .40 62058-11 IEC:2008 5 Table 8 Calculation of switching scores .43 Table 9 Tabulated

37、 values of OC curves for single sampling, AQL = 1,0 plans 45 Table 10 Tabulated values of OC curves for single sampling, normal inspection, accept zero sampling plans.46 Table 11 Average Outgoing Quality Limit (AOQL) at AQL = 1,047 Table 12 Average Outgoing Quality Limit (AOQL) for Ac = 0 sampling p

38、lans, normal inspection .47 Table 13 Consumers risk quality (CRQ): AQL = 1,0 plans .48 Table 14 Consumers risk quality (CRQ): Accept zero plans.48 Table 15 Producers risk (PR): AQL = 1,0 49 Table 16 Producers risk (PR): Accept zero plans 49 Table 17 Sampling plans for non-critical nonconformities, p

39、rocedure A, LQ = 5,0 .51 Table 18 Sampling plans for critical nonconformities, procedure A.52 Table 19 Probability of acceptance for accept zero plans.52 Table 20 Single sampling plans for non-critical nonconformities, procedure B, LQ = 5,0 54 Table 21 Equivalent sample sizes for single and double s

40、ampling55 Table 22 Equivalent acceptance numbers for single and double sampling55 Table 23 Sample sizes for the “s” method and the “” method with AQL = 1,058 Table 24 Sampling plans for the “s” method .60 Table 25 Values of a n .62 Table 26 Sampling plans for the “” method.65 Table 27 Supplementary

41、acceptability constants for qualifying towards reduced inspection .67 Table 28 Values of c Ufor upper control limit on the sample standard deviation 68 Table 29 Tabulated values of OC curves for normal inspection, AQL = 1,0 70 Table 30 Tabulated values of OC curves for tightened inspection, AQL = 1,

42、0.71 Table 31 Tabulated values of OC curves for reduced inspection, AQL = 1,0.72 Table 32 Consumers risk quality (CRQ): “s” method 73 Table 33 Consumers risk quality (CRQ): “” method .73 Table 34 Producers risk (PR): “s” method74 Table 35 Producers risk (PR): “” method .74 Table A.1 Random numbers.7

43、6 6 62058-11 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRICITY METERING EQUIPMENT (AC) ACCEPTANCE INSPECTION Part 11: General acceptance inspection methods FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all na

44、tional electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Techni

45、cal Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work.

46、 International, governmental and nongovernmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) Th

47、e formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendati

48、ons for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end u

49、ser. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be

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