1、 IEC 62059-31-1 Edition 1.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Electricity metering equipment Dependability Part 31-1: Accelerated reliability testing Elevated temperature and humidity Equipements de comptage de llectricit Sret de fonctionnement Partie 31-1: Essais de fiabilit acclr
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16、avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62059-31-1 Edition 1.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Electricity metering equipment Dependability Part 31-1: Accelerated reliability testing
17、 Elevated temperature and humidity Equipements de comptage de llectricit Sret de fonctionnement Partie 31-1: Essais de fiabilit acclrs Temprature et humidit leves INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XC ICS 29.240; 91.140.50 PRICE CODE CODE PRIX ISBN 2
18、-8318-1002-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 62059-31-1 IEC:2008 CONTENTS FOREWORD.5 INTRODUCTION.7 1 Scope.8 2 Normative references .8 3 Terms and definitions .9 4 Symbols, acronyms and abbreviatio
19、ns14 5 Description of quantitative accelerated life tests .15 5.1 Introduction .15 5.2 The life distribution15 5.3 The life-stress model.15 6 The Weibull distribution 16 6.1 Introduction .16 6.2 Graphical representation .16 6.3 Calculation of the distribution parameters19 6.3.1 Input data to be used
20、.19 6.3.2 Ranking of the time to failure.19 6.3.3 Reliability / unreliability estimates20 6.3.4 Calculation of the parameters21 7 The life-stress model 25 7.1 General .25 7.2 Linear equation of the acceleration factor26 7.3 Calculation of parameters n and E a .27 8 The quantitative accelerated life
21、testing method .28 8.1 Selection of samples .28 8.2 The steps to check product life characteristics 28 8.3 Procedure for terminating the maximum stress level test .29 8.4 Procedure to collect time to failure data and to repair meters 29 9 Definition of normal use conditions.29 9.1 Introduction .29 9
22、.2 Temperature and humidity conditions 30 9.2.1 Equipment for outdoor installation .30 9.2.2 Equipment for indoor installation .31 9.3 Temperature correction due to variation of voltage and current .31 9.3.1 Definition of the normal use profile of voltage and current .32 9.3.2 Measurement of the met
23、er internal temperature at each current and voltage 32 9.3.3 Calculation of the meter average internal temperature.32 9.4 Other conditions34 10 Classification and root cause of failures .34 11 Presentation of the results34 11.1 Information to be given34 11.2 Example35 12 Special cases .35 12.1 Cases
24、 of simplification 35 12.1.1 Minor evolution of product design 35 62059-31-1 IEC:2008 3 12.1.2 Verification of production batches35 12.2 Cases when additional information is needed 35 12.2.1 The parameter changes significantly from maximum stress level to medium or low stress level 35 12.2.2 Fault m
25、ode different between stress levels 35 Annex A (informative) Basic statistical background 36 Annex B (informative) The characteristics of the Weibull distribution38 Annex C (informative, see also draft IEC 62308) Life-stress models 42 Annex D (normative) Rank tables.44 Annex E (normative) Values of
26、the Gamma function (n) .47 Annex F (normative) Calculation of the minimum duration of the maximum stress level test .48 Annex G (informative) Example54 Bibliography84 INDEX 85 Figure 1 Weibull unreliability representation example with = 3 000, = 1,1, = 10 000.19 Figure 2 Example of graphical represe
27、ntation of F(t) in the case of Weibull distribution25 Figure 3 Example of regional climatic conditions30 Figure 4 Calculation of average year use conditions 31 Figure A.1 The probability density function 36 Figure A.2 The reliability and unreliability functions .37 Figure B.1 Effect of the parameter
28、 on the Weibull probability density function ) (t f 39 Figure B.2 Effect of the parameter on the Weibull probability density function ) (t f 40 Figure F.1 Unreliability at normal use conditions49 Figure F.2 Unreliability at maximum stress level 50 Figure G.1 Graphical representation of display failu
29、res for each stress level63 Figure G.2 Graphical representation of Q2 failures for each stress level 64 Figure G.3 Graphical representation of U1 failures for each stress level 65 Figure G.4 Example of climate data .67 Figure G.5 Graphical representation of all failures at normal use conditions 76 F
30、igure G.6 Final cumulative distribution with confidence intervals 81 Figure G.7 Reliability function extrapolated to normal use conditions .82 Figure G.8 Reliability function extrapolated to normal use conditions (First portion magnified).83 Table 1 Construction of ordinate (Y) 17 Table 2 Constructi
31、on of abscissa (t-) 17 Table 3 Equations format entered into a spreadsheet 18 Table 4 Example with = 3 000, = 1,1, = 10 00018 Table 5 Example of ranking process of times to failure.20 Table 6 Unreliability estimates by median rank 21 Table 7 Example of unreliability estimation for Weibull distributi
32、on.24 4 62059-31-1 IEC:2008 Table 8 Example of 90 % confidence bounds calculation for Weibull distribution24 Table 9 Values of the linear equation.27 Table 10 Example of procedure for temperature correction 33 Table G.1 Failures logged at 85 C with RH = 95 % .57 Table G.2 Failures logged at 85 C wit
33、h RH = 85 % .59 Table G.3 Failures logged at 85 C with RH = 75 % .60 Table G.4 Failures logged at 75 C with RH = 95 % .61 Table G.5 Failures logged at 65 C with RH = 95 % .62 Table G.6 Best fit Weibull distributions for display failures .63 Table G.7 Best fit Weibull distributions for Q2 failures64
34、Table G.8 Best fit Weibull distributions for U1 failures65 Table G.9 Values of the linear equation for display failures66 Table G.10 Values of the linear equation for Q2 failures 66 Table G.11 Values of the linear equation for other failures.66 Table G.12 Normal use profile of voltage and current.67
35、 Table G.13 Measurement of the internal temperature.69 Table G.14 Arrhenius acceleration factors compared to temperature measured at U nand 0,1 I max , for display failures .70 Table G.15 Arrhenius acceleration factors compared to temperature measured at U nand 0,1 I max , for Q2 failures71 Table G.
36、16 Arrhenius acceleration factors compared to temperature measured at U nand 0,1 I max , for U1 failures 72 Table G.17 Display failures extrapolated to normal use conditions.74 Table G.18 Q2 failures extrapolated to normal use conditions75 Table G.19 U1 failures extrapolated to normal use conditions
37、76 Table G.20 Best fit Weibull distributions at normal use conditions77 Table G.21 Display failures 90 % confidence bounds calculation .78 Table G.22 Q2 failures 90 % confidence bounds calculation 79 Table G.23 U1 failures 90 % confidence bounds calculation 80 62059-31-1 IEC:2008 5 INTERNATIONAL ELE
38、CTROTECHNICAL COMMISSION _ ELECTRICITY METERING EQUIPMENT DEPENDABILITY Part 31-1: Accelerated reliability testing Elevated temperature and humidity FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnica
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48、on. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62059-31 has been prepared by IEC technical committee 13: Electrical energy measurement, tariff- and load control. The text of this standard is based on the following documents: FDIS RVD 13/1437A/FDIS 13/1444/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Thi
