1、 IEC 62129-2 Edition 1.0 2011-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Calibration of wavelength/optical frequency measurement instruments Part 2: Michelson interferometer single wavelength meters talonnage des appareils de mesure de longueur donde/appareil de mesure de la frquence optique Par
2、tie 2: Appareils de mesure de longueur donde unique interfromtre de Michelson IEC 62129-2:2011 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in a
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16、s donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62129-2 Edition 1.0 2011-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Calibration of wavelength/optic
17、al frequency measurement instruments Part 2: Michelson interferometer single wavelength meters talonnage des appareils de mesure de longueur donde/appareil de mesure de la frquence optique Partie 2: Appareils de mesure de longueur donde unique interfromtre de Michelson INTERNATIONAL ELECTROTECHNICAL
18、 COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 33.180.30 PRICE CODE CODE PRIX ISBN 978-2-88912-523-4 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 62129-2 IEC:2011 CONTENTS FOREWORD .
19、4 INTRODUCTION . 6 1 Scope . 7 2 Normative references 7 3 Terms and definitions . 7 4 Preparation for calibration . 11 4.1 Organization 11 4.2 Traceability 11 4.3 Advice for measurements and calibrations . 11 4.4 Recommendations to customers 12 5 Single wavelength calibration 12 5.1 General . 12 5.2
20、 Establishing calibration conditions 12 5.3 Calibration procedure 13 5.3.1 General . 13 5.3.2 Measurement configuration 13 5.3.3 Detailed procedure. 15 5.3.4 Stability test (if necessary) . 15 5.3.5 “On/Off repeatability“ measurement (optional if a specification is available) . 16 5.3.6 Wavelength d
21、ependence measurement (optional) 18 5.3.7 Connector repeatability measurement (optional) . 19 5.4 Calibration uncertainty . 20 5.5 Reporting the results . 21 6 Absolute power calibration 21 Annex A (normative) Mathematical basis 22 Annex B (informative) Rejection of outliers . 25 Annex C (informativ
22、e) Example of a single wavelength calibration 27 Annex D (informative) ITU wavelength bands . 30 Annex E (informative) Atomic and molecular reference transitions 31 Annex F (informative) Reference locked laser example . 42 Annex G (informative) Balance between accuracy and calibration time 44 Biblio
23、graphy 46 Figure 1 Example of a traceability chain 10 Figure 2 Wavelength meter measurement using a lock quality monitor signal 14 Figure 3 Wavelength meter measurement using a reference wavelength meter . 14 Figure F.1 Typical measurement arrangement to lock laser to gas absorption line . 43 Table
24、1 Typical parameters to calculate the “On/Off repeatability“ measurement duration 17 Table B.1 Critical values Z cas a function of sample size N . 26 Table C.1 Type A uncertainty contributions for a stability measurement 27 Table C.2 Uncertainty contributions for a “On/Off repeatability“ measurement
25、 . 28 62129-2 IEC:2011 3 Table C.3 Uncertainty budget for wavelength dependence 28 Table C.4 Uncertainty budget for the wavelength meter calibration 29 Table D.1 The ITU-T bands in different units 30 Table E.1 Helium-neon laser lines 32 Table E.2 Centre vacuum wavelengths for Acetylene 12 C 2 H 233
26、Table E.3 Frequency and vacuum wavelength values for the v 1+ v 3 and v 1+ v 2+ v 4+ v 5bands of 13 C 2 H 235 Table E.4 List of H 13 CN transitions . 38 Table E.5 List of 12 C 16 O transitions 40 Table E.6 Excited state optogalvanic transitions . 41 Table G.1 Summary of choices . 45 4 62129-2 IEC:20
27、11 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS Part 2: Michelson interferometer single wavelength meters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all
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38、or identifying any or all such patent rights. International Standard IEC 62129-2 has been prepared by IEC technical committee 86: Fibre optics. The text of this standard is based on the following documents: FDIS Report on voting 86/395/FDIS 86/399/RVD Full information on the voting for the approval
39、of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 62129-2 IEC:2011 5 The list of all parts in the IEC 62129 series, published under the general title, Calibration of wavelength/opti
40、cal frequency Measurement instruments, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this
41、date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should the
42、refore print this document using a colour printer. 6 62129-2 IEC:2011 INTRODUCTION Wavelength meters, often based on the Michelson interferometer, are designed to measure the wavelength of an optical source as accurately as possible. Although the wavelength meters contain an internal absolute refere
43、nce, typically a Helium-Neon laser, calibration is required to achieve the highest accuracies. The instrument is typically used to measure wavelengths other than that of the internal reference. Corrections are made within the instrument for the refractive index of the surrounding air. A precise desc
44、ription of the calibration conditions must therefore be an integral part of the calibration. This international standard defines all of the steps involved in the calibration process: establishing the calibration conditions, carrying out the calibration, calculating the uncertainty, and reporting the
45、 uncertainty, the calibration conditions and the traceability. The calibration procedure describes how to determine the ratio between the value of the input reference wavelength (or the optical frequency) and the wavelength meters result. This ratio is called correction factor. The measurement uncer
46、tainty of the correction factor is combined following Annex A from uncertainty contributions from the reference meter, the test meter, the setup and the procedure. The calculations go through detailed characterization of individual uncertainties. It is important to know that: a) estimations of the i
47、ndividual uncertainties are acceptable; b) a detailed uncertainty analysis is only necessary once for each wavelength meter type under test, and that all subsequent calibrations can be based on this one-time analysis; c) some of the individual uncertainties can simply be considered to be part of a c
48、hecklist, with an actual value which can be neglected. A number of optical frequency references can be used to provide a traceable optical frequency. These are based on absorption by gas molecules under low pressure and using excited-state opto-galvanic transitions in atoms. Annex E lists the lines.
49、 62129-2 IEC:2011 7 CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS Part 2: Michelson interferometer single wavelength meters 1 Scope This part of IEC 62129 is applicable to instruments measuring the vacuum wavelength or optical frequency emitted from sources that are typical for the fibre-optic communications industry. These sources include Distributed Feedba
