IEC 62226-3-1-2007 Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field ind.pdf

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1、 INTERNATIONAL STANDARD IECCEINORME INTERNATIONALE62226-3-1First editionPremire dition2007-05Exposure to electric or magnetic fields in the low and intermediate frequency range Methods for calculating the current density and internal electric field induced in the human body Part 3-1: Exposure to ele

2、ctric fields Analytical and 2D numerical models Exposition aux champs lectriques ou magntiques basse et moyenne frquence Mthodes de calcul des densits de courant induit et des champs lectriques induits dans le corps humain Partie 3-1: Exposition des champs lectriques Modles analytiques et numriques

3、2D Reference number Numro de rfrence IEC/CEI 62226-3-1:2007 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical

4、, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address

5、below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopi

6、e et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la

7、CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electr

8、ical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/s

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11、t us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies appare

12、ntes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalo

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14、velles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des

15、 questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 INTERNATIONAL STANDARD IECCEINORME INTERNATIONALE62226-3-1First editionPremire dition2007-05Exposure to electric or magnetic fields in the low and intermediate frequency rang

16、e Methods for calculating the current density and internal electric field induced in the human body Part 3-1: Exposure to electric fields Analytical and 2D numerical models Exposition aux champs lectriques ou magntiques basse et moyenne frquence Mthodes de calcul des densits de courant induit et des

17、 champs lectriques induits dans le corps humain Partie 3-1: Exposition des champs lectriques Modles analytiques et numriques 2D XA Commission Electrotechnique InternationaleInternational Electrotechnical Commission PRICE CODE CODE PRIX For price, see current cataloguePour prix, voir catalogue en vig

18、ueur 2 62226-3-1 IEC:2007 CONTENTS FOREWORD.5 INTRODUCTION.7 1 Scope.8 2 Exposure to electric field 8 3 General procedure11 3.1 Shape factor11 3.2 Procedure .11 4 Human body models.12 4.1 General .12 4.2 Surface area .12 4.3 Semi-spheroidal model13 4.4 Axisymmetrical body model .15 5 Calculation of

19、induced current 16 5.1 General .16 5.2 Semi-spheroid .16 5.3 Axisymmetrical models20 5.4 Comparison of the analytical and numerical models 27 6 Influence of electrical parameters.27 6.1 General .27 6.2 Influence of permittivity .27 6.3 Influence of conductivity28 6.4 Non-homogeneous conductivity.28

20、7 Measurement of currents induced by electric fields.28 7.1 General .28 7.2 Current flowing to the ground 28 Annex A (normative) Analytical solutions for a spheroid in a uniform electric field30 Annex B (normative) Human body axisymmetrical model .33 Annex C (informative) Child body model 38 Annex D

21、 (informative) Example of use of this standard 40 Annex E (informative) Numerical calculation methods44 Bibliography52 Figure 1 Illustration of the phenomenon of currents induced by electric field in a human body standing on the ground .10 Figure 2 Potential lines of the electric field generated by

22、an energised wire in the absence of any objects (all distances in metres) .10 Figure 3 A realistic body model12 Figure 4 Scheme of the semi-spheroid simulating a human being standing on a zero potential plane 13 Figure 5 Equivalent spheroid radius, R, versus height, L, and for different mass, M 15 F

23、igure 6 The axisymmetrical body model for the reference man (left) and woman (right)15 62226-3-1 IEC:2007 3 Figure 7 Conductive spheroid exposed to electric field.16 Figure 8 Calculation of the shape factor for electric field KEfor an spheroid exposed to an unperturbed electric field17 Figure 9 Curr

24、ent density JSinduced by an unperturbed electric field (1 kV/m, 50 Hz) in a spheroid versus parameter L/R (values in A/m).18 Figure 10 Dimensions and mesh of the semi-spheroid .19 Figure 11 Distortion of power frequency electric field lines close to the conductive semi-spheroid .19 Figure 12 Calcula

25、ted induced current density JA(h) in the body standing in a vertical 50 Hz electric field of 1 kV/m 21 Figure 13 Computation domain 23 Figure 14 Mesh of the man body model and distortion of power frequency electric field lines close to model.23 Figure 15 Distribution of potential lines and 50 Hz ele

26、ctric field magnitude (man model) 24 Figure 16 Computation of induced currents JAalong a vertical axis, and distribution of induced currents in the man model at 50 Hz .24 Figure 17 Mesh of the woman body model and distortion of power frequency electric field lines close to model.25 Figure 18 Distrib

27、ution of potential lines and 50 Hz electric field magnitude (woman model) 26 Figure 19 Computation of induced currents JAalong a vertical axis, and distribution of induced currents in the woman model at 50 Hz .26 Figure A.1 Conductive spheroid exposed to electric field .30 Figure B.1 Normalised axis

28、ymmetrical models. Left: man, Right: woman .35 Figure C.1 Computation of induced currents JZalong a vertical axis, and distribution of induced currents in the 10 years reference child model.39 Figure E.1 Spheroid model.45 Figure E.2 Space potential model 46 Figure E.3 Exemple of charge simulation me

29、thod using rings.47 Figure E.4 Superficial charges integral equation method, cutting of the body into N elements.48 Figure E.5 Mesh of the body using finite element method 49 Figure E.6 Impedance method .50 Figure E.7 Yee-method: Electric and magnetic grids for spatial discretization 51 Table 1 Data

30、 for reference man and reference woman .13 Table 2 Values of arcsin(e) / e for different values of L/R.14 Table 3 Derived data using spheroid model at 50 Hz .20 Table 4 Electric field EBRrequired to produce basic restrictions JBR in the neck at 50 Hz22 Table 5 Comparison of values of the shape facto

31、r for electric field KEand corresponding current densities for an unperturbed 50 Hz electric field of 1 kV/m.27 Table B.1 Measures from antropomorphic survey used to construct vertical dimensions of axisymmetrical model 56 34 4 62226-3-1 IEC:2007 Table B.2 Measures from antropomorphic survey used to

32、 construct the radial dimensions of axisymmetrical model 56 34 Table B.3 Normalised model dimensions36 Table B.4 Axisymmetric model dimensions for reference man and reference woman whose mass and height are defined by ICRP 38 and are given in Table 1.37 Table C.1 Reference values provided by ICRP fo

33、r male and female children38 Table C.2 Dimensions of the reference children (in m excepted SBRin m) .38 Table C.3 Results of analytical method for the reference children 39 Table D.1 Normalised dimensions of the women model41 Table D.2 Calculation of the dimensions for a specific person42 62226-3-1

34、IEC:2007 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ EXPOSURE TO ELECTRIC OR MAGNETIC FIELDS IN THE LOW AND INTERMEDIATE FREQUENCY RANGE METHODS FOR CALCULATING THE CURRENT DENSITY AND INTERNAL ELECTRIC FIELD INDUCED IN THE HUMAN BODY Part 3-1: Exposure to electric fields Analytical and 2D numeric

35、al models FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardizat

36、ion in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is e

37、ntrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Int

38、ernational Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects sinc

39、e each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content

40、of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible i

41、n their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment d

42、eclared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Nati

43、onal Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention i

44、s drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shal

45、l not be held responsible for identifying any or all such patent rights. International Standard IEC 62226-3-1 has been prepared by IEC technical committee 106: Methods for the assessment of electric, magnetic and electromagnetic fields associated with human exposure. This standard is to be used in c

46、onjunction with the first edition of IEC 62226-1:2004, Exposure to electric or magnetic fields in the low and intermediate frequency range Methods for calculating the current density and internal electric field induced in the human body Part 1: General. 6 62226-3-1 IEC:2007 The text of this standard

47、 is based on the following documents: FDIS Report on voting 106/125/FDIS 106/128/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2

48、. This International Standard constitutes Part 3-1 of IEC 62226 series, which will regroup several international standards and technical reports within the framework of the calculation of induced current densities and internal electric fields. A list of all parts of the IEC 62226 series, published under the general title Exposure to electric or magnetic fields in the low and intermediate frequency range Methods for calculating the current density and internal electric field induced in the human body, can be found on the IEC website. The committee has decided that the conte

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