1、 IEC 62496-2-1 Edition 1.0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical circuit boards Part 2-1: Measurements Optical attenuation and isolation Cartes circuits optiques Partie 2-1: Mesures Affaiblissement et isolation optiques IEC 62496-2-1:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED
2、 Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs membe
3、r National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction r
4、servs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeu
5、r. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Em
6、ail: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publ
7、ications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number
8、, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by
9、 email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary onlin
10、e. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Ele
11、ctrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu
12、. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rf
13、rence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications paru
14、es. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Eg
15、alement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch
16、 Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62496-2-1 Edition 1.0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical circuit boards Part 2-1: Measurements Optical attenuation and isolation Cartes circuits optiques Partie 2-1: Mesures Affaiblissement et isolation optiques INTERNATIONAL
17、ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE V ICS 33.180.01 PRICE CODE CODE PRIX ISBN 978-2-88912-572-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 62496-2-1 IEC:2011 CONTENTS FOREWOR
18、D . 4 1 Scope . 6 2 Normative references . 6 3 Precautions 6 4 Apparatus . 7 4.1 Launch conditions and source (S) . 7 4.2 Power-meter (D) 7 4.3 Optical fibre (OF) 8 4.4 Mode filter (MF) . 8 4.5 Optical direction changing device (OD) 9 4.6 Temporary joint (TJ) 9 5 Procedure 10 5.1 Pre-conditioning 10
19、 5.2 Visual inspection . 11 5.3 Connectivity inspection 11 5.4 OCB configurations and measurement methods 11 5.5 Attenuation measurement with a power-meter . 13 5.5.1 General . 13 5.5.2 Cut-back method . 13 5.5.3 Insertion method (A) 15 5.5.4 Insertion method (B) 23 5.6 Isolation measurement with a
20、power-meter 25 5.6.1 Insertion method (C) 26 5.6.2 Insertion method (D) 31 5.7 Mirror loss measurement . 32 6 Details to be specified 33 Bibliography 34 Figure 1 Launch apparatus for butt-joint connection, (a) without OD, (b) with OD 10 Figure 2 Cut-back method Configuration A 14 Figure 3 Cut-back m
21、ethod Configuration B 15 Figure 4 Insertion method (A) Configuration A 16 Figure 5 Insertion method (A), multi port sequential measurements Configuration A 17 Figure 6 Insertion method (A) Configuration B 18 Figure 7 Insertion method (A) Configuration C-1 . 19 Figure 8 Insertion method (A) Configura
22、tion C-2 . 20 Figure 9 Insertion method (A) Configuration D 21 Figure 10 Insertion method (A) Configuration E . 22 Figure 11 Insertion method (A) Configuration E . 23 Figure 12 Insertion method (B) Configuration A . 24 Figure 13 Insertion method (B) Configuration C-1 . 25 Figure 14 Insertion method
23、(C) Configuration A 26 Figure 15 Insertion method (C) Configuration B 27 Figure 16 Insertion method (C) Configuration C-1 . 28 62496-2-1 IEC:2011 3 Figure 17 Insertion method (C) Configuration D 29 Figure 18 Insertion method (C) Configuration E 30 Figure 19 Insertion method (C) Configuration E 31 Fi
24、gure 20 Insertion method (D) Configuration A 32 Figure 21 Mirror loss measurement 33 Table 1 Preferred source and launch conditions . 7 Table 2 Preferred launching and receiving fibres . 8 Table 3 Measurement methods of attenuations 11 Table 4 Measurement methods of isolations 12 4 62496-2-1 IEC:201
25、1 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL CIRCUIT BOARDS Part 2-1: Measurements Optical attenuation and isolation FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC Natio
26、nal Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Public
27、ly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governm
28、ental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on
29、technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted
30、by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international u
31、niformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
32、 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should e
33、nsure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage o
34、f any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the
35、referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. I
36、nternational Standard IEC 62496-2-1 has been prepared by IEC technical committee 86: Fibre optics. The text of this standard is based on the following documents: FDIS Report on voting 86/396/FDIS 86/401/RVD Full information on the voting for the approval of this standard can be found in the report o
37、n voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 62496 series, published under the general title Optical circuit boards can be found on the IEC website. 62496-2-1 IEC:2011 5 The committee has de
38、cided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amen
39、ded. 6 62496-2-1 IEC:2011 OPTICAL CIRCUIT BOARDS Part 2-1: Measurements Optical attenuation and isolation 1 Scope IEC 62496-2-1 describes the various methods to measure the optical attenuation and isolation of optical circuit boards (OCBs). 2 Normative references The following referenced documents a
40、re indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60793-2-10, Optical fibres - Part 2-10: Product specifications - Sectional specif
41、ication for category A1 multimode fibres IEC 60793-2-50, Optical fibres - Part 2-50: Product specifications - Sectional specification for class B single-mode fibres IEC 60825-1, Safety of laser products Part 1: Equipment classification and requirements IEC 61300-1, Fibre optic interconnecting device
42、s and passive components Basic test and measurement procedures Part 1: General and guidance IEC 61300-3-1:2003, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-1: Examinations and measurements Visual examination IEC 61300-3-4, Fibre optic inter
43、connecting devices and passive components Basic test and measurement procedures Part 3-4: Examinations and measurements Attenuation IEC 62496-1:2008, Optical circuit boards Part 1: General IEC 62614, Fibre optics Launch condition requirements for measuring multimode attenuation ISO 3599, Vernier cal
44、lipers reading to 0,1 and 0,05 mm ISO 6906, Vernier callipers reading to 0,02 mm 3 Precautions The requirements of IEC 60825-1 and the following test requirements shall be met. The position of the fibres in the test should be fixed during the measurement to avoid changes in attenuation caused by ben
45、ding loss. 62496-2-1 IEC:2011 7 4 Apparatus 4.1 Launch conditions and source (S) For multimode measurements, a restricted launch, not an overfilled launch, shall be used. Encircled flux, which is given in IEC 62614, shall be available for the purposes of launching fibre qualification in case of a 50
46、 or 62,5 graded index launch fibre. The required launch conditions can be achieved by including appropriate equipment inside the light source, or by applying mode filters on or in series with the launch cord. For single-mode measurements, the launch condition shall be in accordance with Annex B of I
47、EC 61300-1. The source unit consists of an optical emitter, the associated drive electronics and fibre pigtail. Preferred source and launch conditions are given in Table 1. Table 1 Preferred source and launch conditions No. Type Centre wavelength nm Spectral width nm Stability at 23 o C dB/h Output
48、power Launch conditions Source type S1 Multimode 660 30 30 0,05 aTBD Laser diode or LED S2 Multimode 780 30 30 0,05 aTBD Laser diode or LED S3 Multimode 850 30 30 0,05 aIEC 62614 Laser diode or LED S4 Multimode 980 30 30 0,05 aTBD Laser diode or LED S5 Multimode 1 300 30 30 0,05 aIEC 62614 Laser diode or LED S6 Single-mode 1 310 30 10 0,05 aIEC 61300-1, Annex B.2.2 Laser diode or LED S7 Single-mode 1 550 30 10 0,05 aIEC 61300-1, Annex B.2.2 Laser diode or LED a The source output power shall be 20 dB above the minimum measured power level. NOTE 1 Due to their long coheren
