1、 IEC 62860-1 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistor-based ring oscillators IEC 62860-1:2013(E) IEEE Std. 1620.1-2006 IEEE Std 1620.1 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2006 IEEE All rights reserved. IEEE is a registered t
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17、e expressly advised that iv IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. International Standard
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21、sued at a later date. IEC 62860-1:2013(E) v IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators Sponsor Microprocessor Standards Committee of the IEEE Compu
22、ter Society Approved 8 June 2006 IEEE-SA Standards Board vi IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. Abstract: Recommended methods and standardized reporting practices for electrical characterization of printed and organic rin
23、g oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for hig
24、h-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring
25、oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator IEC 62860-1:2013(E) vii IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Introduction This introduction is not part
26、 of IEEE Std 1620.1-2006, IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators. This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistor-based ring oscillators. Due to the natur
27、e of organic transistors and circuitry, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error and gives recommended practices in order to minimize and/or characterize the effect of each. Standard reporting pra
28、ctices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and design-of-experiment are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of results, so tha
29、t new discoveries may be confirmed more efficiently. The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, circuitry, and manufacturing techniques. These practices are based on standard operating procedures utilized in
30、 laboratories worldwide. The development of this standard was initiated in 2004 to facilitate the evolution of organic transistor circuitry from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices create a means of effective comparison of informa
31、tion and a foundation for manufacturing readiness. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpreta
32、tions Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard
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34、 validity or scope of those patents that are brought to its attention. viii IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEC 62860-1:2013(E) 1 IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights re
35、served. Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators 1. Overview 1.1 Scope This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing cond
36、itions during characterization. 1.2 Purpose The purpose of this standard is to provide a method for systematically characterizing organic transistor- based ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring o
37、scillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for r
38、eporting data, so that information is clear and consistent throughout the research community and industry. 1.3 Electrical characterization overview 1.3.1 Testing apparatus Testing shall be performed using an electronic device test system with an accuracy and resolution of at least 0.1% of the measur
39、ement values for both signal level and timing or frequency measurements. In order to maintain the necessary accuracy, this test method requires that the instrumentation be calibrated against a known and appropriate set of standards e.g., National Institute of Standards and Technology (NIST). These c
40、alibrations may be performed by the equipment user or as a service by the equipment vendor. Calibration is not performed against a known organic field-effect transistor (OFET), organic circuit, or other FET-type device; the basic instrument operations (e.g., voltage, current, and resistance) are calibrated
