1、 IEC 62860 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistors and materials IEC 62860:2013(E) IEEE Std. 1620-2008 IEEE Std 1620 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEEE All rights reserved. IEEE is a registered trademark in the
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18、1620-2008 has been processed through IEC technical committee 113: Nanotechnology standardization for electrical and electronic products and systems, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 1620-2008 113/184
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21、3(E) v IEEE Std 1620-2008 Published by IEC under license from IEEE. 2008 IEEE. All rights reserved. IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials Sponsor Microprocessor Standards Committee of the IEEE Computer Society Approved 26 September 2008 IEEE-SA
22、Standards Board vi IEC 62860:2013(E) IEEE Std 1620-2008 Published by IEC under license from IEEE. 2008 IEEE. All rights reserved. Abstract: Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of pr
23、inted and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly re
24、quired for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET,
25、flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor IEC 62860:2013(E) vii IEEE Std 1620-2008 Published by IEC under license from IEEE. 2008 IEEE. All rights reserved. IEEE Introduction This intr
26、oduction is not part of IEEE Std 1620-2008, IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials. This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistors. Due to the nature of organic
27、 transistors, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error and gives recommended practices in order to minimize and/or characterize the effect of each. Standard reporting practices are included in ord
28、er to minimize confusion in analyzing reported data. Disclosure of environmental conditions and sample size are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of results so that new discoveries may be confirmed m
29、ore efficiently. The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, and manufacturing techniques. These practices were based on standard operating procedures utilized in laboratories worldwide. This standard was ini
30、tiated in 2002 to facilitate the evolution of organic transistors from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices create a means of effective comparison of information and a foundation for manufacturing readiness. Notice to users Laws an
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