1、 IEC 60384-21 Edition 2.0 2011-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Fixed capacitors for use in electronic equipment Part 21: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 Condensateurs fixes utiliss dans les quipements lectroniques Partie
2、 21: Spcification intermdiaire Condensateurs multicouches fixes dilectriques en cramique pour montage en surface, de Classe 1 IEC60384-21:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication
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17、ALE Fixed capacitors for use in electronic equipment Part 21: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1 Condensateurs fixes utiliss dans les quipements lectroniques Partie 21: Spcification intermdiaire Condensateurs multicouches fixes dilectriqu
18、es en cramique pour montage en surface, de Classe 1 INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE W ICS 31.060.10 PRICE CODE CODE PRIX ISBN 978-2-88912-822-8 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Ele
19、ctrotechnique Internationale 2 60384-21 IEC:2011 CONTENTS FOREWORD . 5 1 General 7 1.1 Scope 7 1.2 Object . 7 1.3 Normative references 7 1.4 Information to be given in a detail specification . 7 1.4.1 Outline drawing and dimensions 8 1.4.2 Mounting . 8 1.4.3 Rating and characteristics . 8 1.4.4 Mark
20、ing . 9 1.5 Terms and definitions 9 1.6 Marking . 10 1.6.1 Information for marking 10 1.6.2 Marking on the body 10 1.6.3 Requirements for marking 10 1.6.4 Marking of the packaging . 10 1.6.5 Additional marking . 10 2 Preferred ratings and characteristics 10 2.1 Preferred characteristics . 10 2.1.1 P
21、referred climatic categories . 10 2.2 Preferred values of ratings 11 2.2.1 Rated temperature (TR) . 11 2.2.2 Rated voltage (UR) 11 2.2.3 Category voltage (UC) . 11 2.2.4 Preferred values of nominal capacitance and associated tolerance values . 11 2.2.5 Temperature coefficient () . 12 2.2.6 Dimension
22、s . 14 3 Quality assessment procedures 14 3.1 Primary stage of manufacture 14 3.2 Structurally similar components . 14 3.3 Certified records of released lots . 14 3.4 Qualification approval 14 3.4.1 Qualification approval on the basis of the fixed sample size procedures 14 3.4.2 Tests . 15 3.5 Quali
23、ty conformance inspection . 19 3.5.1 Formation of inspection lots . 19 3.5.2 Schedule . 20 3.5.3 Delayed delivery 20 3.5.4 Assessment levels . 20 4 Test and measurement procedures . 21 4.1 Preliminary drying . 21 4.2 Measuring conditions 22 4.3 Mounting . 22 4.4 Visual examination and check of dimen
24、sions . 22 4.4.1 Visual examination 22 60384-21 IEC:2011 3 4.4.2 Requirements 22 4.5 Electrical tests . 24 4.5.1 Capacitance 24 4.5.2 Tangent of loss angle (tan ) . 24 4.5.3 Insulation resistance 24 4.5.4 Voltage proof . 25 4.6 Temperature coefficient () and temperature cycle drift . 26 4.6.1 Prelim
25、inary drying 26 4.6.2 Measuring conditions . 26 4.6.3 Requirements 26 4.7 Shear test . 26 4.8 Substrate bending test 27 4.8.1 Initial measurement . 27 4.8.2 Final inspection . 27 4.9 Resistance to soldering heat . 27 4.9.1 Initial measurement . 27 4.9.2 Test conditions 27 4.9.3 Recovery . 28 4.9.4 F
26、inal inspection, measurements and requirements 28 4.10 Solderability 29 4.10.1 Test conditions 29 4.10.2 Recovery . 30 4.10.3 Final inspection, measurements and requirements 30 4.11 Rapid change of temperature 30 4.11.1 Initial measurement . 30 4.11.2 Number of cycles . 30 4.11.3 Recovery . 30 4.11.
27、4 Final inspection, measurements and requirements 30 4.12 Climatic sequence . 31 4.12.1 Initial measurement . 31 4.12.2 Dry heat 31 4.12.3 Damp heat, cyclic, Test Db, first cycle . 31 4.12.4 Cold 31 4.12.5 Damp heat, cyclic, Test Db, remaining cycles 31 4.12.6 Final inspection, measurements and requ
28、irements 31 4.13 Damp heat, steady state 32 4.13.1 Initial measurement . 32 4.13.2 Conditions of test 32 4.13.3 Recovery . 33 4.13.4 Final inspection, measurements and requirements 33 4.14 Endurance . 33 4.14.1 Initial measurement . 33 4.14.2 Conditions of test 33 4.14.3 Recovery . 34 4.14.4 Final i
29、nspection, measurements and requirements 34 4.15 Robustness of terminations (only for capacitors with strip termination) 34 4.15.1 Test conditions 34 4.15.2 Final inspection and requirements . 34 4.16 Component solvent resistance (if required) 35 4 60384-21 IEC:2011 4.17 Solvent resistance of the ma
30、rking (if required) . 35 4.18 Accelerated damp heat, steady state (if required) 35 4.18.1 Initial measurement . 35 4.18.2 Conditioning 35 4.18.3 Recovery . 36 4.18.4 Final measurements 36 Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer ca
31、pacitors of ceramic dielectric, Class 1 37 Annex B (informative) Combination of temperature coefficient and tolerance for the reference temperature of 25 C . 38 Bibliography 39 Figure 1 Fault: crack or fissure 22 Figure 2 Fault: crack or fissure 22 Figure 3 Separation or delamination 23 Figure 4 Exp
32、osed electrodes 23 Figure 5 Principal faces . 23 Figure 6 Reflow temperature profile . 28 Figure A.1 Dimensions . 37 Table 1 Preferred tolerance on nominal capacitance 11 Table 2 Nominal temperature coefficient and tolerance 12 Table 3 Combination of temperature coefficient and tolerance . 13 Table
33、4 Fixed sample size test plan for qualification approval Assessment level EZ 16 Table 5 Tests schedule for qualification approval . 17 Table 6a Lot-by-lot inspection 21 Table 6b Periodic tests 21 Table 7 Tangent of loss angle limits . 24 Table 8 Test voltages. 26 Table 9 Temperature cyclic drift lim
34、its 26 Table 10 Reflow temperature profiles for Sn-Ag-Cu alloy . 28 Table 11 Maximum capacitance change . 29 Table 12 Maximum capacitance change . 31 Table 13 Number of damp heat cycles . 31 Table 14 Final inspection measurements and requirements . 32 Table 15 Test conditions for damp heat, steady s
35、tate . 32 Table 16 Final inspection measurements and requirements . 33 Table 17 Endurance test conditions (UC= UR) . 33 Table 18 Endurance test conditions (UC UR) . 34 Table 19 Final inspection measurements and requirements . 34 Table 20 Initial requirements 35 Table 21 Conditioning 35 Table B.1 Com
36、bination of temperature coefficient and tolerance for the reference temperature of 25 C 38 60384-21 IEC:2011 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 21: Sectional specification Fixed surface mount multilayer capacitors of ceramic dielectric
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47、e possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60384-21 has been prepared by IEC technical committee 40: Capacitors and resistors for elec
48、tronic equipment. This second edition cancels and replaces the first edition published in 2004 and contains the following significant technical changes with respect to the previous edition: The test voltage of 1,2 URat UR 1 000 V has been added in 4.5.4 Voltage proof. Detail test conditions have bee
49、n added in 4.7 Shear test and 4.8 Substrate bending test. Test conditions applying lead free solder alloy (Sn-Ag-Cu) have been included in 4.9 Resistance to soldering heat and 4.10 Solderability. A selection of the test conditions according to marketing needs have been stated in 4.13 Damp heat, steady state. The dimensions of 0402 M in Annex A have been ad
