1、 IEC 60512-17-3Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 17-3: Cable clamping tests Test 17c: Cable clamp resistance to cable pull (tensile) Connecteurs pour quipements lectroniques Essais et mesures Partie 17-3: Ess
2、ais de maintien des cbles Essai 17c: Rsistance de la pince de maintien des cbles au tirage IEC60512-17-3:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in
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16、us donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-17-3Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equi
17、pment Tests and measurements Part 17-3: Cable clamping tests Test 17c: Cable clamp resistance to cable pull (tensile) Connecteurs pour quipements lectroniques Essais et mesures Partie 17-3: Essais de maintien des cbles Essai 17c: Rsistance de la pince de maintien des cbles au tirage INTERNATIONAL EL
18、ECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE EICS 31.220.01 PRICE CODECODE PRIXISBN 978-2-88910-956-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-17-3 IEC:2010 INTERNATIONAL ELECTR
19、OTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 17-3: Cable clamping tests Test 17c: Cable clamp resistance to cable pull (tensile) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all n
20、ational electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Techn
21、ical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work
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25、 user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publicat
26、ion shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independen
27、t certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any perso
28、nal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative refe
29、rences cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for
30、 identifying any or all such patent rights. International Standard IEC 60512-17-3 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 17c of IEC 6051
31、2-9, issued in 1992. The structure of IEC 60512 series is explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2156/FDIS 48B/2190/RVD Full information on the voting for the approval of this standard can be found in the report on votin
32、g indicated in the above table. 60512-17-3 IEC:2010 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website.
33、 The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a rev
34、ised edition, or amended. 4 60512-17-3 IEC:2010 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 17-3: Cable clamping tests Test 17c: Cable clamp resistance to cable pull (tensile) 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testin
35、g connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the ability of a cable-clamping device to prevent longitudinal movement of the cable/wi
36、re bundle. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1,
37、Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination 3 Preparation of the specimen The specimen shall consist of the specified cable/wire bundle fitted in the normal manner to its associated component or sub-assembly by means of the cab
38、le-clamping device. The specimen shall be prepared and mounted in accordance with the detail specification. 4 Test method This test shall be done by means of a suitable device to measure and control the forces, e.g. a universal materials testing machine. With the specimen rigidly mounted in such an
39、attitude that the cable/wire bundle is in a vertical position, a specified tensile force shall be applied axially to the free end of the cable/wire bundle. This force shall be increased gradually at a rate not exceeding 20 N/s until the specified value is reached. The maximum value shall be maintain
40、ed for 1 min, unless otherwise specified in the detail specification. 5 Final measurements The specimen shall be examined visually in accordance with IEC 60512-1-1, test 1a at the junction of the cable/wire bundle and the clamping device and at the junction of the clamping device and the component o
41、r sub-assembly. 60512-17-3 IEC:2010 5 6 Requirements There shall be no damage such as would impair operation and the cable/wire bundle shall be displaced by not more than the amount specified in the detail specification. 7 Details to be specified When this test is required by the detail specificatio
42、n, the following details shall be specified: a) preparation of the specimen and type of cable/wire bundle to be used; b) mounting of the specimen; c) force to be applied; d) requirements for final measurements, e.g. maximum displacement of the cable/wire bundle; e) any deviation from the standard te
43、st method. _ 6 60512-17-3 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 17-3: Essais de maintien des cbles Essai 17c: Rsistance de la pince de maintien des cbles au tirage AVANT-PROPOS 1) La Commission Electrotechnique Internat
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