IEC 60947-5-4-2002 Low-voltage switchgear and controlgear - Part 5-4 Control circuit devices and switching elements Method of assessing the performance of low-e.pdf

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1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 60947-5-4 Deuxime dition Second edition 2002-10 Appareillage basse tension Partie 5-4: Appareils et lments de commutation pour circuits de commande Mthode dvaluation des performances des contacts basse nergie Essais spciaux Low-voltage switchgear a

2、nd controlgear Part 5-4: Control circuit devices and switching elements Method of assessing the performance of low-energy contacts Special tests Numro de rfrence Reference number CEI/IEC 60947-5-4:2002Numrotation des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes p

3、artir de 60000. Ainsi, la CEI 34-1 devient la CEI 60034-1. Editions consolides Les versions consolides de certaines publications de la CEI incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de

4、base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Informations supplmentaires sur les publications de la CEI Le contenu technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements re

5、latifs cette publication, y compris sa validit, sont dispo- nibles dans le Catalogue des publications de la CEI (voir ci-dessous) en plus des nouvelles ditions, amendements et corrigenda. Des informations sur les sujets ltude et lavancement des travaux entrepris par le comit dtudes qui a labor cette

6、 publication, ainsi que la liste des publications parues, sont galement disponibles par lintermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEI Le catalogue en ligne sur le site web de la CEI (http:/www.iec.ch/searchpub/cur_fut.htm) vous permet de faire des recherches

7、en utilisant de nombreux critres, comprenant des recherches textuelles, par comit dtudes ou date de publication. Des informations en ligne sont galement disponibles sur les nouvelles publications, les publications rempla- ces ou retires, ainsi que sur les corrigenda. IEC Just Published Ce rsum des d

8、ernires publications parues (http:/www.iec.ch/online_news/justpub/jp_entry.htm) est aussi disponible par courrier lectronique. Veuillez prendre contact avec le Service client (voir ci-dessous) pour plus dinformations. Service clients Si vous avez des questions au sujet de cette publication ou avez b

9、esoin de renseignements supplmentaires, prenez contact avec le Service clients: Email: custserviec.ch Tl: +41 22 919 02 11 Fax: +41 22 919 03 00 Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred

10、to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1

11、 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity, is available in the IEC Catalogue of publi

12、cations (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the following

13、: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (http:/www.iec.ch/searchpub/cur_fut.htm) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On-line information is also available on

14、recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications (http:/www.iec.ch/online_news/justpub/jp_entry.htm) is also available by email. Please contact the Customer Service Centre (see below) for further

15、 information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 .NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 60947-5-4 Deuxime

16、dition Second edition 2002-10 Appareillage basse tension Partie 5-4: Appareils et lments de commutation pour circuits de commande Mthode dvaluation des performances des contacts basse nergie Essais spciaux Low-voltage switchgear and controlgear Part 5-4: Control circuit devices and switching element

17、s Method of assessing the performance of low-energy contacts Special tests Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2002 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque fo

18、rme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permiss

19、ion in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE T Commission Electrotechnique Internationale Inte

20、rnational Electrotechnical Commission 2 60947-5-4 CEI:2002 SOMMAIRE AVANT-PROPOS . 4 INTRODUCTION 8 1 Domaine dapplication et objet 10 2 Rfrences normatives .10 3 Dfinitions et liste des symboles utiliss .12 3.1 Dfinitions .12 3.2 Liste des symboles utiliss 16 4 Principes gnraux .18 5 Mthode gnrale

21、dessai.20 6 Caractristiques gnrales .22 6.1 Mthodes de mesure .22 6.2 Squences des oprations.24 6.3 Caractristiques lectriques.28 6.4 Caractristiques des oprations.30 7 Caractrisation des dfauts 32 7.1 Mthode de base.32 7.2 Surveillance de la charge (figure 3) .32 8 Conditions dambiance32 8.1 Condit

22、ions normales 32 8.2 Prconditionnement.34 8.3 Conditions particulires .34 9 Mthodes de dclaration.34 9.1 Critre de dfaillance.34 9.2 Annonce du taux de dfaillance .34 10 Informations fournir dans le rapport dessai .38 Annexe A (normative) Informations fournir par le constructeur .42 Bibliographie.48

23、 Figure 1 Schma fonctionnel de lquipement dessai 20 Figure 2 Circuit dessai typique pour la mthode de base.22 Figure 3 Circuit dessai pour la surveillance de la charge .24 Figure 4 Diagramme squentiel avec contacts commutant la charge 26 Figure 5 Diagramme squentiel avec contacts ne commutant pas la

24、 charge.28 Tableau 1 Coefficient K cpour un essai tronqu .4060947-5-4 IEC:2002 3 CONTENTS FOREWORD 5 INTRODUCTION 9 1 Scope and object11 2 Normative references11 3 Definitions and list of symbols used 13 3.1 Definitions .13 3.2 List of symbols used 17 4 General principles.19 5 General test method .2

25、1 6 General characteristics .23 6.1 Measurement methods 23 6.2 Sequences of operations .25 6.3 Electrical characteristics29 6.4 Characteristics of operation .31 7 Characterization of defects .33 7.1 Basic method.33 7.2 Monitoring the load (figure 3).33 8 Ambient conditions .33 8.1 Normal conditions3

26、3 8.2 Preconditioning35 8.3 Particular conditions 35 9 Methods of reporting.35 9.1 Failure criterion .35 9.2 Reporting the failure rate .35 10 Information to be provided in the test report39 Annex A (normative) Information to be supplied by the manufacturer .43 Bibliography49 Figure 1 Functional dia

27、gram of the testing equipment.21 Figure 2 Typical test circuit for the basic method23 Figure 3 Test circuit for monitoring a load 25 Figure 4 Sequential diagram with load-switching contacts 27 Figure 5 Sequential diagram without load-switching contacts .29 Table 1 Coefficient K cfor a time-terminate

28、d test 41 4 60947-5-4 CEI:2002 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ APPAREILLAGE BASSE TENSION Partie 5-4: Appareils et lments de commutation pour circuits de commande Mthode dvaluation des performances des contacts basse nergie Essais spciaux AVANT-PROPOS 1) La CEI (Commission lectrotechniqu

29、e Internationale) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de lle

30、ctronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en

31、 liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2) Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsen

32、tent, dans la mesure du possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3) Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, spcifications te

33、chniques, rapports techniques ou guides et agrs comme tels par les Comits nationaux. 4) Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes

34、nationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5) La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un

35、 matriel est dclar conforme lune de ses normes. 6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de te

36、ls droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CEI 60947-5-4 a t tablie par le sous-comit 17B: Appareillage basse tension, du comit dtudes 17 de la CEI: Appareillage. Cette deuxime dition annule et remplace la premire dition parue comme rapport technique en 19

37、96. Elle a dsormais le statut de norme internationale. Le texte de cette norme est issu des documents suivants: FDIS Rapport de vote 17B/1228/FDIS 17B/1254/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Cette publ

38、ication a t rdige selon les Directives ISO/CEI, Partie 2. Quelques lgres modifications, principalement de nature ditoriale, ont t introduites par rapport la premire dition.60947-5-4 IEC:2002 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LOW-VOLTAGE SWITCHGEAR AND CONTROLGEAR Part 5-4: Control circui

39、t devices and switching elements Method of assessing the performance of low-energy contacts Special tests FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The

40、 object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC

41、 National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardi

42、zation (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has re

43、presentation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards, technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4)

44、In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard sha

45、ll be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this Internation

46、al Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60947-5-4 has been prepared by subcommittee 17B: Low-voltage switchgear and controlgear, of IEC technical committee 17: Switchgear and cont

47、rolgear. This second edition cancels and replaces the first edition which was issued as a technical report in 1996. It now has the status of an International Standard. The text of this standard is based on the following documents: FDIS Report on voting 17B/1228/FDIS 17B/1254/RVD Full information on

48、the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. Some slight modifications, mainly of an editorial nature, have been introduced since the first edition. 6 60947-5-4 CEI:2002 Le comit a dcid que le contenu de cette publication ne sera pas modifi avant 2006. A cette date, la publication sera

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