1、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61000-4-13Premire ditionFirst edition2002-03Compatibilit lectromagntique (CEM) Partie 4-13:Techniques dessai et de mesure Essais dimmunit basse frquenceaux harmoniques et inter-harmoniquesincluant les signaux transmis sur le rseaulectrique alternatifElec
2、tromagnetic compatibility (EMC) Part 4-13:Testing and measurement techniques Harmonics and interharmonics includingmains signalling at a.c. power port,low frequency immunity testsNumro de rfrenceReference numberCEI/IEC 61000-4-13:2002PUBLICATION FONDAMENTALE EN CEMBASIC EMC PUBLICATIONCopyright Inte
3、rnational Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-Numrotation des publicationsDepuis le 1er janvier 1997, les publications de la CEIsont numrotes partir de 60000. Ainsi, la CEI 34-1devient la C
4、EI 60034-1.Editions consolidesLes versions consolides de certaines publications de laCEI incorporant les amendements sont disponibles. Parexemple, les numros ddition 1.0, 1.1 et 1.2 indiquentrespectivement la publication de base, la publication debase incorporant lamendement 1, et la publication deb
5、ase incorporant les amendements 1 et 2.Informations supplmentairessur les publications de la CEILe contenu technique des publications de la CEI estconstamment revu par la CEI afin quil reflte ltatactuel de la technique. Des renseignements relatifs cette publication, y compris sa validit, sont dispo-
6、nibles dans le Catalogue des publications de la CEI(voir ci-dessous) en plus des nouvelles ditions,amendements et corrigenda. Des informations sur lessujets ltude et lavancement des travaux entreprispar le comit dtudes qui a labor cette publication,ainsi que la liste des publications parues, sontgal
7、ement disponibles par lintermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEILe catalogue en ligne sur le site web de la CEI(www.iec.ch/catlg-f.htm) vous permet de faire desrecherches en utilisant de nombreux critres,comprenant des recherches textuelles, par comitdtude
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10、 919 03 00Publication numberingAs from 1 January 1997 all IEC publications areissued with a designation in the 60000 series. Forexample, IEC 34-1 is now referred to as IEC 60034-1.Consolidated editionsThe IEC is now publishing consolidated versions of itspublications. For example, edition numbers 1.
11、0, 1.1and 1.2 refer, respectively, to the base publication,the base publication incorporating amendment 1 andthe base publication incorporating amendments 1and 2.Further information on IEC publicationsThe technical content of IEC publications is keptunder constant review by the IEC, thus ensuring th
12、atthe content reflects current technology. Informationrelating to this publication, including its validity, isavailable in the IEC Catalogue of publications(see below) in addition to new editions, amendmentsand corrigenda. Information on the subjects underconsideration and work in progress undertake
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16、9 03 00.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61000-4-13Premire ditionFirst edition2002-03Compatibilit lectromagntique (C
17、EM) Partie 4-13:Techniques dessai et de mesure Essais dimmunit basse frquenceaux harmoniques et inter-harmoniquesincluant les signaux transmis sur le rseaulectrique alternatifElectromagnetic compatibility (EMC) Part 4-13:Testing and measurement techniques Harmonics and interharmonics includingmains
18、signalling at a.c. power port,low frequency immunity testsPour prix, voir catalogue en vigueurFor price, see current catalogue IEC 2002 Droits de reproduction rservs Copyright - all rights reservedAucune partie de cette publication ne peut tre reproduite niutilise sous quelque forme que ce soit et p
19、ar aucun procd,lectronique ou mcanique, y compris la photocopie et lesmicrofilms, sans laccord crit de lditeur.No part of this publication may be reproduced or utilized in anyform or by any means, electronic or mechanical, includingphotocopying and microfilm, without permission in writing fromthe pu
20、blisher.International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.chCODE PRIXPRICE CODE UCommission Electrotechnique InternationaleInternational Electrotechnical Commi
21、ssion PUBLICATION FONDAMENTALE EN CEMBASIC EMC PUBLICATIONCopyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 2 61000-4-13 CEI:2002SOMMAIREAVANT-PROPOS 4INTRODUCTION.81 Domaine dap
22、plication et objet 102 Rfrences normatives .103 Dfinitions 124 Gnralits.144.1 Description du phnomne 144.2 Sources.145 Niveaux dessai 165.1 Niveaux dessai harmonique 165.2 Niveaux dessai pour inter-harmoniques et transmission de signaux .206 Instruments dessai.226.1 Gnrateur dessai 226.2 Contrle des
23、 caractristiques du gnrateur 267 Montage dessai268 Procdures dessai .288.1 Procdure dessai288.2 Excution de lessai.289 Evaluation des rsultats dessai 4010 Rapport dessai.40Annexe A (informative) Rseau dimpdance entre source de tension et EST .48Annexe B (informative) Point de rsonance 50Annexe C (in
24、formative) Classes denvironnement lectromagntique52Bibliographie.54Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-61000-4-13 IEC:2002 3 CONTENTSFOREWORD.5lNTRODUCTlON .91 Scope
25、 and object112 Normative references113 Definitions 134 General 154.1 Description of the phenomenon154.2 Sources.155 Test levels175.1 Harmonics test levels.175.2 Test levels for interharmonics and mains signalling216 Test instrumentation .236.1 Test generator.236.2 Verification of the characteristics
26、 of the generator277 Test set up .278 Test procedures298.1 Test procedure 298.2 Application of the test 299 Evaluation of test results.4110 Test report41Annex A (informative) Impedance network between voltage source and EUT 49Annex B (informative) Resonance point 51Annex C (informative) Electromagne
27、tic environment classes 53Bibliography55Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 4 61000-4-13 CEI:2002COMMISSION LECTROTECHNIQUE INTERNATIONALE_COMPATIBILIT LECTROMAGNTI
28、QUE (CEM) Partie 4-13: Techniques dessai et de mesure Essais dimmunit basse frquence aux harmoniqueset inter-harmoniques incluant les signaux transmissur le rseau lectrique alternatifAVANT-PROPOS1) La CEI (Commission lectrotechnique Internationale) est une organisation mondiale de normalisation comp
29、osede lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet defavoriser la coopration internationale pour toutes les questions de normalisation dans les domaines dellectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normes
30、 internationales.Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par lesujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, enliaison avec la CEI, participent galement aux travaux. La CEI collabore tr
31、oitement avec lOrganisationInternationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations.2) Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsentent, dans la mesuredu possible, un accord international sur les sujets tudis
32、, tant donn que les Comits nationaux intressssont reprsents dans chaque comit dtudes.3) Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publiscomme normes, spcifications techniques, rapports techniques ou guides et agrs comme tels par les Comitsnationau
33、x.4) Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer defaon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normesnationales et rgionales. Toute divergence entre la norme de la CEI et la norme nation
34、ale ou rgionalecorrespondante doit tre indique en termes clairs dans cette dernire.5) La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilitnest pas engage quand un matriel est dclar conforme lune de ses normes.6) Lattention est attire sur le fait que
35、certains des lments de la prsente Norme internationale peuvent fairelobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pourresponsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existenceLa Norme internationale CEI 61
36、000-4-13 a t tablie par le sous-comit 77A: Phnomnesbasse frquence, du comit dtudes 77 de la CEI: Compatibilit lectromagntique.Cette norme a le statut de publication fondamentale en CEM conformment au guide107 de laCEI.Le texte de la prsente norme est issu des documents suivants:FDIS Rapport de vote7
37、7A/368/FDIS 77A/377/RVDLe rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayantabouti lapprobation de cette norme.Cette publication a t rdige selon les Directives ISO/CEI, Partie 3.Les annexes A, B et C sont donnes uniquement titre dinformation.Copyright Internat
38、ional Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-61000-4-13 IEC:2002 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION_ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-13 : Testing and measurement techniques
39、Harmonics and interharmonics including mains signalling ata.c. power port, low frequency immunity testsFOREWORD1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The obje
40、ct of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC Nationa
41、l Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the International Organizationfor Standardization (ISO
42、) in accordance with conditions determined by agreement between the twoorganizations.2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfr
43、om all interested National Committees.3) The documents produced have the form of recommendations for international use and are published in the formof standards, technical specifications, technical reports or guides and they are accepted by the NationalCommittees in that sense.4) In order to promote
44、 international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicate
45、d in the latter.5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6) Attention is drawn to the possibility that some of the elements of this International Standard may be the su
46、bjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 61000-4-13 has been prepared by subcommittee 77A: Lowfrequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.This standard has the status of
47、 a basic EMC publication in accordance with lEC Guide 107.The text of this standard is based on the following documents:FDIS Report on voting77A/368/FDIS 77A/377/RVDFull information on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.This
48、publication has been drafted in accordance with the ISO/IEC Directives, Part 3.Annexes A, B, and C, are for information only.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 6 61000-4-13 CEI:2002Le comit a dcid que le contenu de cette publication ne sera
