IEC 61000-4-22-2010 Electromagnetic compability (EMC) - Part 4-22 Testing and measurement techniques - Radiated emissions and immunity measurements in fully ane.pdf

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1、 IEC 61000-4-22 Edition 1.0 2010-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-22: Testing and measurement techniques Radiated emissions and immunity measurements in fully anechoic rooms (FARs) Compatibilit lectromagntique (CEM) Partie 4-22: Techniques des

2、sai et de mesure Mesures de limmunit et des missions rayonnes dans des enceintes compltement anchoques (FAR) IEC 61000-4-22:2010 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise

3、 specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any question

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6、enir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechn

7、ical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you h

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15、 Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Cli

16、ents: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61000-4-22 Edition 1.0 2010-1

17、0 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-22: Testing and measurement techniques Radiated emissions and immunity measurements in fully anechoic rooms (FARs) Compatibilit lectromagntique (CEM) Partie 4-22: Techniques dessai et de mesure Mesures de limmun

18、it et des missions rayonnes dans des enceintes compltement anchoques (FAR) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XA ICS 33.100.10; 33.100.20 PRICE CODE CODE PRIX ISBN 978-2-88912-229-5 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered tra

19、demark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61000-4-22 IEC:2010 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.8 2 Normative references .8 3 Terms and definitions .9 4 FAR applications 10 4.1 Measurand for radiated immunity test

20、ing .10 4.2 Measurand for radiated emission measurements.11 5 FAR validation/calibration procedure 11 5.1 General .11 5.2 Validation set-ups11 5.3 Test facility description15 5.3.1 General .15 5.3.2 Test volume.15 5.3.3 Broadband antenna .15 5.3.4 Antenna cables15 5.3.5 Set-up table.15 5.3.6 Turntab

21、le.16 5.3.7 Automated antenna polarization changer.16 5.3.8 Absorber configuration 16 5.4 Definition of quantities to be determined by the FAR validation procedure.16 5.5 Required sampling positions for FAR validation.17 5.6 FAR validation procedure 18 5.6.1 General .18 5.6.2 Type 1 validation set-u

22、p 18 5.6.3 Type 2 validation set-up 19 5.6.4 Type 3 validation set-up 19 5.6.5 Type 4 validation set-up 20 5.6.6 Calculation of dB C and C s , dBfor all set-up types .20 5.7 Validation requirement 20 6 Test set-up.21 Annex A (normative) Radiated immunity tests26 Annex B (normative) Radiated emission

23、 measurements.31 Annex C (informative) Background on the system transducer factor and simultaneous emissions/immunity validation method 34 Annex D (informative) Measurement uncertainties .37 Bibliography50 Figure 1 Type 1 validation block diagramme 12 Figure 2 Type 2 validation block diagramme 12 Fi

24、gure 3 Type 3 validation block diagramme 13 Figure 4 Type 4 validation block diagramme 13 Figure 5 Locations of the sampling points for FAR validation .18 Figure 6 Example test set-up for table-top equipment 23 61000-4-22 IEC:2010 3 Figure 7 Example test set-up for table-top equipment, top view24 Fi

25、gure 8 Example test set-up for floor-standing equipment.24 Figure 9 Example test set-up for floor-standing equipment, top view25 Figure A.1 Definition of d measurement for immunity tests28 Figure B.1 Definition of d measurementfor emission measurements.32 Figure D.1 Example of influence factors for

26、emission measurements .37 Figure D.2 Example of influences upon the immunity test method44 Table 1 Components required for the different validation set-up types .15 Table 2 Validation criteria 21 Table D.1 Measurement instrumentation uncertainty in a FAR for radiated emission measurements in the fre

27、quency range 30 MHz to 1 000 MHz38 Table D.2 Measurement instrumentation uncertainty in a FAR for radiated emission measurements in the frequency range 1 GHz to 18 GHz.39 Table D.3 Measurement instrumentation uncertainty in a FAR for level setting for immunity testing in the frequency range 30 MHz t

28、o 1 000 MHz .45 Table D.4 Measurement instrumentation uncertainty in a FAR for level setting for immunity testing in the frequency range 1 GHz to 18 GHz 46 4 61000-4-22 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE _ ELECTROMAGNETIC COMPATIB

29、ILITY (EMC) Part 4-22: Testing and measurement techniques Radiated emissions and immunity measurements in fully anechoic rooms (FARs) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (I

30、EC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports

31、, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-

32、 governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of

33、 IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are a

34、ccepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote interna

35、tional uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the

36、 latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users

37、should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other

38、damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use

39、 of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent r

40、ights. International Standard IEC 61000-4-22 has been prepared by CISPR subcommittee A: Radio interference measurements and statistical methods, in cooperation with subcommittee 77B: High frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This standard has the status

41、of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility Guide to the drafting of electromagnetic compatibility publications. 61000-4-22 IEC:2010 5 The text of this standard is based on the following documents: Enquiry draft Report on voting CISPR/A/912/FDIS CISPR/A

42、/923/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series can be found on the IEC websit

43、e under the general title Electromagnetic compatibility (EMC), and of all parts of the CISPR 16 series under the general title Specification for radio disturbance and immunity measuring apparatus and methods. The committee has decided that the contents of this publication will remain unchanged until

44、 the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 61000-4-22 IEC:2010 INTRODUCTION This standard is part of the IE

45、C 61000 series of standards, according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission

46、limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6:

47、 Test set-up Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards, as technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part number followed by a das

48、h and a second number identifying the subdivision (example: IEC 61000-6-1). This part is an international standard that establishes the required test procedures for using fully anechoic rooms for performing radiated immunity testing and radiated emission measurements. The main text of this standard

49、provides all information that is common to both radiated emission measurements and immunity tests in a FAR (fully anechoic room). This includes the description of a FAR, a common set-up for equipment under test (EUT), and a harmonized validation/calibration procedure. The test methods described in this standard are based on the harmonized validation/calibration which

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