1、 INTERNATIONAL STANDARD IEC 61000-4-33First edition 2005-09Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters Reference number IEC 61000-4-33:2005(E) BASIC EMC PUBLICATION Publication numbering As from 1 January 1
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8、 03 00 INTERNATIONAL STANDARD IEC 61000-4-33First edition 2005-09Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or utilize
9、d in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03
10、00 E-mail: inmailiec.ch Web: www.iec.ch For price, see current catalogue PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission XB BASIC EMC PUBLICATION 2 61000433 IEC:2005(E) CONTENTS FOREWORD4 INTRODUCTION6 1 Scope7 2 Normative references7 3 Terms and defin
11、itions8 4 Measurement of highpower transient responses.9 4.1 Overall measurement concepts and requirements9 4.2 Representation of a measured response.12 4.3 Measurement equipment.12 4.4 Measurement procedures27 5 Measurement of low frequency responses.27 6 Calibration procedures28 6.1 Calibration of
12、 the entire measurement channel28 6.2 Calibration of individual measurement channel components.31 6.3 Approximate calibration techniques37 Annex A (normative) Methods of characterizing measured responses.40 Annex B (informative) Characteristics of measurement sensors45 Annex C (normative) HPEM measu
13、rement procedures59 Annex D (informative) Twoport representations of measurement chain components62 Bibliography.69 Figure 1 Illustration of a typical instrumentation chain for measuring highpower transient responses10 Figure 2 Illustration of a balanced sensor and cable connecting to an unbalanced
14、(coaxial) line where I out+ I in= I 1 .16 Figure 3 Examples of some simple baluns 4b.18 Figure 4 A typical circuit for an inline attenuator in the measurement chain.18 Figure 5 Illustration of the typical attenuation of a nominal 20 dB attenuator for a 50 system, as a function of frequency.19 Figure
15、 6 Typical circuit diagram for an inline integrator.20 Figure 7 Plot of the transfer function of the integrating circuit of Figure 6.20 Figure 8 Illustration of the frequency dependent perunitlength signal transmission of a standard coaxial cable, and a semirigid coaxial line21 Figure 9 Illustration
16、 of sensor cable routing in regions not containing EM fields24 Figure 10 Treatment of sensor cables when located in a region containing EM fields25 Figure 11 Conforming cables to local system shielding topology.26 Figure 12 Correct and incorrect methods of cable routing.27 Figure 13 The doubleended
17、TEM Cell for providing a uniform field illumination for probe calibration29 Figure 14 Illustration of the singleended TEM cell and associated equipment30 Figure 15 Dimensions of a small test fixture for probe calibration3061000433 IEC:2005(E) 3 Figure 16 Electrical representation of a measurement ch
18、ain, (a) with the Efield sensor represented by a general Thevenin circuit, and (b) the Norton equivalent circuit for the same sensor31 Figure 17 Example of a simple Efield probe.34 Figure 18 Plot of the real and imaginary parts of the input impedance, Z i , for the E field sensor of Figure 1734 Figu
19、re 19 Plot of the magnitude of the shortcircuit current flowing in the sensor input for different angles of incidence, as computed by an antenna analysis code.35 Figure 20 Plot of the magnitude of the effective height of the sensor for different angles of incidence.36 Figure 21 High frequency equiva
20、lent circuit of an attenuator element39 Figure A.1 Illustration of various parameters used to characterize the pulse component of a transient response waveform R(t)41 Figure A.2 Illustration of an oscillatory waveform frequently encountered in high power transient EM measurements.41 Figure A.3 Examp
21、le of the calculated spectral magnitude of the waveform of Figure A.2.44 Figure B.1 Illustration of a simple Efield sensor, together with its Norton equivalent circuit46 Figure B.2 Magnitude and phase of the normalized frequency function ) ( F for the field sensor47 Figure B.3 Illustration of a simp
22、le Bfield sensor, together with its Thevenin equivalent circuit49 Figure B.4 Illustration of an Efield sensor over a ground plane used for measuring the vertical electric field, or equivalently, the surface charge density50 Figure B.5 Illustration of the halfloop Bdot sensor used for measuring the t
23、angential magnetic field, or equivalently, the surface current density52 Figure B.6 Simplified concept for measuring wire currents.53 Figure B.7 Construction details of a current sensor.54 Figure B.8 Example of the measured sensor impedance magnitude of a nominal 1 current sensor55 Figure B.9 Geomet
24、ry of the inline Idot current sensor55 Figure B.10 Design concept for a coaxial cable current sensor.56 Figure B.11 Shape and dimensions of a CIP10 coaxial cable current sensor.57 Figure B.12 Configuration of a coaxial cable Idot current sensor57 Figure D.1 Voltage and current relationships for a ge
25、neral twoport network.62 Figure D.2 Voltage and current definitions for the chain parameters63 Figure D.3 Cascaded twoport networks.64 Figure D.4 Representation of the of a simple measurement chain using the chain parameter matrices.64 Figure D.5 Simple equivalent circuit for the measurement chain.6
26、5 Figure D.6 A simple twoport network modelled by chain parameters65 Table A.1 Examples of time waveform pnorms.42 Table A.2 Time waveform norms used for highpower transient waveforms42 Table D.1 Chain parameters for simple circuit elements.66 4 61000433 IEC:2005(E) INTERNATIONAL ELECTROTECHNICAL CO
27、MMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 433: Testing and measurement techniques Measurement methods for highpower transient parameters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical
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37、 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000433 has been prepared by subcommittee 77C: High power tran
38、sient phenomena, of IEC technical committee 77: Electromagnetic compatibility. It has the status of a basic EMC publication in accordance with IEC Guide 107. The text of this standard is based on the following documents: FDIS Report on voting 77C/156/FDIS 77C/160/RVD Full information on the voting f
39、or the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.61000433 IEC:2005(E) 5 The committee has decided that the contents of this publication will remain unchanged until t
40、he maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a
41、later date. 6 61000433 IEC:2005(E) INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of t
42、he environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines In
43、stallation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts and published either as International Standards or as technical specifications or technical reports, some of which have already been published as se
44、ctions. Others will be published with the part number followed by a dash and a second number identifying the subdivision (example: 6100061).61000433 IEC:2005(E) 7 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 433: Testing and measurement techniques Measurement methods for highpower transient parameters 1
45、 Scope This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from highpower transient electromagnetic parameters. These responses can include: the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident
46、 plus scattered fields within a system under test); the currentI (e.g., induced by a transient field or within a system under test); the voltageV (e.g., induced by a transient field or within a system under test); the chargeQ induced on a cable or other conductor. NOTE The chargeQ on the conductor i
47、s a fundamental quantity that can be defined at any frequency. The voltage V, however, is a defined (e.g., secondary) quantity, which is valid only at low frequencies. At high frequencies, the voltage cannot be defined as the line integral of the Efield, since this integral is pathdependent. Thus, f
48、or very fast rising pulses (having a large highfrequency spectral content) the use of the voltage as a measurement observable is not valid. In this case, the charge is the desired quantity to be measured. These measured quantities are generally complicated timedependent waveforms, which can be described approximately by several scalar parameters, or “observables”. These parameters include: the peak amplitude of the response, the waveform risetime, the waveform falltime (or duration), the pulse width, and mathematically defined norms obtained from the waveform.
