IEC 61178-3-1993 Quartz crystal units a specification in the IEC quality assessment system for electronic components (IECQ) part 3 sectional specification quali.pdf

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1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 61 178-3 QC 680200 Premire dition First edition 1993-03 Rsonateurs quartz - Spcification dans le Systme CE1 dassurance de la qualit des composants lectroniques (IECQ) Partie 3: Spcification intermdiaire - Homologation Quartz crystal units - A speci

2、fication in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional specification - Qualification approval Numro de rfrence Reference number CEIIIEC 61 178-3: 1993 Numros des publications Numbering Depuis le ler janvier 1997, les publications de la CE1 sont numrotes part

3、ir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publ

4、ication de base incorporant les amendements 1 et 2. Validit de la presente publication Le contenu technique des publications de la CE1 est constamment revu par la CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponib

5、les dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Cite web de la CEI“ Catalogue des publicat

6、ions de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne) Bulletin de la CE1 Disponible la fois au 4te web de la CEI et comme priodique imprim Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulai

7、re Electro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le lecteur consultera la CE1 60027: Symboles littraux 2 utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le mat6riel. Index, r

8、elev et compilation des feuilles individuelles, et la CE1 6061 7: Symboles graphiques pour schmas. * Voir adresse 4te web, sur la page de titre. As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC

9、publications including amendments are available. For example, edition numbers 1 .O, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incor- porating amendment 1 and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content

10、 of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the publication is available in the IEC catalogue. Information on the subjects under consideration and work in progress

11、 undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogue of IEC publications Published yearly with regular updates (On-line catalogue)* IEC Bulletin Available both at t

12、he IEC web site* and as a printed periodical Terminology, graphical and letter symbols For general terminology, readers are referred to IEC 60050: International Electrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are ref

13、erred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 60417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for diagrams. * See web site address on title page. NORME INTERNATIONALE INTERNA

14、TIONAL STANDARD CE1 IEC 61 17813 QC 680200 Premire dition First edition 1993-03 Rsonateurs quartz - Spcification dans le Systme CE1 dassurance de la qualit des composants lectroniques (IECQ) Partie 3: Specification intermdiaire - Homologation Quartz crystal units - A specification in the IEC Quality

15、 Assessment System for Electronic Components (IECQ) Part 3: Sectional specification - Qualification approval O IEC 1993 Droits de reproduction rservs - Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni No part of this publication may be reproduced or utiliz

16、ed in utilise sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical, procd. lectronique ou mcanique. y compris la photo- including photocopying and microfilm. without permission in copie et les microfilms, sans laccord crit de lditeur. writing from the publis

17、her. International Electrotechnical Commission Telefax: +41 22 919 0300 3, rue de Varemb Geneva, Switzerland IEC web site http: /www.iec.ch e-mail: inmailiec.ch N CODE PRIX PRICE CODE Pourprix, voir catalogue en vigueur For price, see current catalogue Commission Electrotechnique Internationale Inte

18、rnational Electrotechnical Commission MefflilYHpoAHafl 3JlKTPOTBXHHVCHaR HOMHCCHR O -2- SOMMAIRE 1 178-3 O CEI:1993 Pages AVANT-PROPOS 4 Articles Gnralits . 1.1 Domaine dapplication 1.2 Rfrences normatives . Valeurs prfrentielles et guide pour les spcifications particulires . 2.1 Caractristiques et

19、valeurs prfrentielles 2.2 Informations formuler dans les spcifications particulires . Procdures dassurance de la qualit 3.1 Aptitude lhomologation . 3.2 Modles associables 3.3 Rapports certifis dessais . 3.4 Homologation . 3.5 Contrle de la conformit de la qualit 6 6 6 6 6 6 10 10 10 10 10 14 1178-3

20、 O IEC: 1 993 -3- CONTENTS Page FOREWORD . 5 Clause Ge ne ral . 1.1 Scope 1.2 Normative references . Preferred ratings and guidance on detail specifications 2.1 Preferred ratings and characteristics . 2.2 Information to be prescribed in detail specifications Quality assessment procedures . 3.1 Eligi

21、bility for qualification approval . 3.2 Structural similarity . 3.3 Certified test records 3.4 Qualification approval . 3.5 Quality conformance inspection 7 7 7 7 7 7 11 11 11 11 11 15 -4- 11 78-3 O CE111 993 DIS COMMISSION LECTROTECHNIQUE INTERNATIONALE Rapport de vote RSONATEURS QUARTZ - SPCIFICAT

22、ION DANS LE SYSTME CE1 DASSURANCE DE LA QUALIT DES COMPOSANTS LECTRONIQUES (IECQ) Partie 3: Spcification intermdiaire - Homologation 49(BC)229 AVANT-PROPOS 49(BC)243 La CE1 (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation compose de lensemble des comits lec

23、trotechniques nationaux (Comits nationaux de la CEI). La CE1 a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales. Leur labor

24、ation est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CE1 collabore troitement avec lOrganisati

25、on Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. Les dcisions ou accords officiels de la CE1 en ce qui concerne les questions techniques, prpars par les comits dtudes O sont reprsents tous les Comits nationaux sintressant ces questions, ex

26、priment dans la plus grande mesure possible un accord international sur les sujets examins. Ces dcisions constituent des recommandations internationales publies sous forme de normes, de rapports techniques ou de guides et agres comme telles par les Comits nationaux. Dans le but dencourager lunificat

27、ion internationale, les Comits nationaux de la CE1 sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CE1 dans leurs normes nationales et rgionales. Toute divergence entre la norme de la CE1 et la norme nationale ou rgionale correspondante doit

28、tre indique en termes clairs dans cette dernire. Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Le numro QC qui figure sur la page de couverture de la prsente publication est le numro de spcification dans le Systme CE

29、1 dassurance de la qualit des composants lectroniques (IECQ). 1178-3 O IEC : 1 993 -5- DIS 49(C0)229 INTERNATIONAL ELECTROTECHNICAL COMMISSION Report on Voting 49(C0)243 QUARTZ CRYSTAL UNITS - A SPECIFICATION IN THE IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) Part 3: Sectional spe

30、cification - Qualification approval FOREWORD The IEC (International Electrotechnical Commission) is a world-wide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international cooperation on all questi

31、ons concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate

32、in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement betwee

33、n the two organizations. The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on which all the National Committees having a special interest therein are represented, express, as nearly as possible, an international consensus of opinion on the subjects

34、dealt with. They have the form of recommendations for international use published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. In order to promote international unification, IEC National Committees undertake to apply IEC Intern

35、ational Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. International Standard IEC 11 78-3 has been prepared by IEC t

36、echnical committee 49: Piezoelectric and dielectric devices for frequency control and selection. It is partially based on IEC 122-1. It forms part 3 of the specifications in the IEC Quality Assessment System for Electronic Components for quartz crystal units and constitutes the sectional specificati

37、on: Qualification approval. IEC 11 78-1 forms the generic specification. IEC 11 78-2 forms the sectional specification: Capability approval. IEC 11 78-2-1 forms the blank detail specification: Capability approval. IEC 11 78-3-1 forms the blank detail specification: Qualification approval. The text o

38、f this standard is based on the following documents: Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The QC number that appears on the front cover of this publication is the specification number in the IEC Quality As

39、sessment System for Electronic Components (IECQ). 11 78-3 O CEI:1993 -6- RSONATEURS QUARTZ - SPCIFICATION DANS LE SYSTME CE1 DASSURANCE DE LA QUALIT DES COMPOSANTS LECTRONIQUES (IECQ) Partie 3: Spcification intermdiaire - Homologation 1 Gnralits 1.1 Domaine dapplication La prsente partie de la CE1 1

40、178 sapplique aux rsonateurs quartz; lassurance de la qualit de ces rsonateurs est base sur lhomologation du composant. Elle prescrit les caractristiques et valeurs prfrentielles, accompagnes des essais appro- pris et des mthodes de mesure contenus dans la spcification gnrique CE1 1178-1. Par ailleu

41、rs, y figurent les exigences de performance gnrales qui doivent tre employes dans les spcifications particulires pour les rsonateurs quartz. 1.2 Rfrences normatives Les documents normatifs suivants contiennent des dispositions qui, par suite de la rfrence qui y est faite, constituent des disposition

42、s valables pour la prsente partie de la CE1 1178. Au moment de la publication, les ditions indiques taient en vigueur. Tout document normatif est sujet rvision et les parties prenantes aux accords fonds sur la prsente partie de la CE1 1178 sont invites rechercher la possibilit dappliquer les ditions

43、 les plus rcentes des documents normatifs indiqus ci-aprs. Les membres de la CE1 et de IWO possdent le registre des Normes internationales en vigueur. CE1 68: Essais denvironnement* CE1 11 78-1 : 1993, Rsonateurs a quartz - Spcification dans le Systme CE1 dassurance de la qualit des composants lectr

44、oniques (IECQ) - Partie 1: Spcification gnrique CE1 1178-3-1: 1993, Rsonateurs a quartz - Spcification dans le Systeme CE/ dassurance de la qualit des composants lectroniques (IECQ) - Partie 3: Spcification intermdiaire: Homologation - Section 1 : Spcification particulire cadre CE1 QC 001002: 1986,

45、Rgles de procdure du Systeme CE1 dassurance de la qualit des composants lectroniques (IECQ) 2 Valeurs prfrentielles et guide pour les spcifications particulires 2.1 Caractristiques et valeurs prfrentielles Les valeurs donnes dans les spcifications particulires seront choisies de prfrence parmi celle

46、s figurant en 2.3 de la spcification gnrique CE1 1178-1. 2.2 Un guide pour la rdaction des spcifications particulires est donn par la spcification particulire cadre CE1 11 78-3-1. Informations formuler dans les spcifications particulires La rfrence ci-dessus sapplique ldition de rfrence et aux condi

47、tions dessais des articles applicables de la spcification gnrique (CE1 1178-1). 1 1 78-3 O I EC : 1 993 -7- QUARTZ CRYSTAL UNITS - A SPECIFICATION IN THE IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) Part 3: Sectional specification - Qualification approval 1 General 1.1 Scope This p

48、art of IEC 1178 applies to quartz crystal units the quality of which is assessed on the basis of qualification approval. It prescribes the preferred ratings and characteristics, with the appropriate tests and measuring methods contained in the generic specification IEC 1178-1, and gives general performance requirements to be used in detail specifications for quartz crystal units. 1.2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC 1178. At the time of

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