IEC 61747-6-3-2011 Liquid crystal display devices - Part 6-3 Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix.pdf

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1、 IEC 61747-6-3 Edition 1.0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices Part 6-3: Measuring methods for liquid crystal display modules Motion artifact measurement of active matrix liquid crystal display modules Dispositifs daffichage cristaux liquides Partie 6-3

2、 Mthodes de mesure pour les modules daffichage cristaux liquides Mesure de lartefact de mouvement dans les modules daffichage cristaux liquides matrice active IEC 61747-6-3:2011 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless

3、 otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have an

4、y questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication

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6、dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International El

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15、opedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. S

16、ervice Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61747-6-3 Edition 1

17、0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices Part 6-3: Measuring methods for liquid crystal display modules Motion artifact measurement of active matrix liquid crystal display modules Dispositifs daffichage cristaux liquides Partie 6-3: Mthodes de mesure pour

18、 les modules daffichage cristaux liquides Mesure de lartefact de mouvement dans les modules daffichage cristaux liquides matrice active INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE T ICS 31.120 PRICE CODE CODE PRIX ISBN 978-2-88912-586-9 Registered trademark o

19、f the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 61747-6-3 IEC:2011 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Abbreviations . 7 5 Standard measuring conditions . 7 5.1 Temper

20、ature, humidity and pressure conditions . 7 5.2 Illumination condition . 7 6 Standard motion-blur measuring methods . 8 6.1 General . 8 6.2 Direct measurement method 8 6.2.1 Standard measuring process . 8 6.2.2 Test patterns . 8 6.2.3 Analysis method 10 6.3 Indirect measurement method . 12 6.3.1 Tem

21、poral step response 12 6.3.2 High speed camera 15 7 Test report 16 7.1 General . 16 7.2 Items to be reported 16 7.2.1 Environmental conditions . 16 7.2.2 Display parameters 16 7.2.3 Measuring method and conditions . 16 7.2.4 Analysis method 16 Annex A (informative) Subjective test method 18 Annex B

22、informative) Motion contrast degradation 19 Annex C (informative) Dynamic modulation transfer function 21 Bibliography 23 Figure 1 Examples of edge blur test pattern . 8 Figure 2 Example of a pivoting pursuit camera system . 9 Figure 3 Example of a linear pursuit camera system 9 Figure 4 Example of

23、 luminance cross section profile of blurred edge . 11 Figure 5 Example of luminance cross section profile of blurred edge . 11 Figure 6 PBET calculation 12 Figure 7 Set-up to measure the temporal step response 13 Figure 8 Example of a LC response time measurement 14 Figure 9 Example of a motion pict

24、ure response curve derived from the response measurement presented in Figure 8, and a convolution with a one frame wide window function. 15 Figure 10 Example of measurement data reporting 17 Figure B.1 Example of motion contrast degradation test pattern . 19 Figure B.2 Example of motion contrast deg

25、radation due to line spreading 20 Figure C.1 Example of motion contrast degradation . 21 61747-6-3 IEC:2011 3 Figure C.2 Example of DMTF properties for different motion speeds (V) 22 Table 1 Step response data for different luminance transitions 10 4 61747-6-3 IEC:2011 INTERNATIONAL ELECTROTECHNICAL

26、 COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 6-3: Measuring methods for liquid crystal display modules Motion artifact measurement of active matrix liquid crystal display modules FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comp

27、rising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Stan

28、dards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this prep

29、aratory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organ

30、izations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form

31、of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretati

32、on by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regi

33、onal publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out

34、by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees

35、for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the N

36、ormative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held re

37、sponsible for identifying any or all such patent rights. International Standard IEC 61747-6-3 has been prepared by IEC technical committee 110: Flat panel display devices. The text of this standard is based on the following documents: FDIS Report on voting 110/296/FDIS 110/313/RVD Full information o

38、n the voting for the approval on this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 61747-6-3 IEC:2011 5 A list of all parts of the IEC 61747 series, under the general title Liquid crys

39、tal display devices, can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will rem

40、ain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover p

41、age of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 61747-6-3 IEC:2011 LIQUID CRYSTAL DISPLAY DEVICES Part 6-3: Measuring methods for liquid cr

42、ystal display modules Motion artifact measurement of active matrix liquid crystal display modules 1 Scope This part of IEC 61747 applies to transmissive type active matrix liquid crystal displays. This standard defines general procedures for quality assessment related to the motion performance of LC

43、Ds. It defines artifacts in the motion contents and methods for motion artifact measurement. NOTE Motion blur measurement methods and analysis methods introduced in this standard could not be universal tools for all different LCD motion enhancement technologies due to its complexity. Users shall be

44、notified of these circumstances. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) ap

45、plies. IEC 61747-6, Liquid crystal and solid-state display devices Part 6: Measuring methods for liquid crystal modules Transmissive type 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 motion picture response curve a curve, representing the

46、convolution of the temporal step response with a moving window function of 1-frame wide. It shows how the luminance is integrated over time during smooth pursuit eye tracking and combines the effects of the LCD response time and the hold-type characteristics of the device under test 3.2 motion induc

47、ed edge profile luminance profile of an intrinsically sharp moving luminance transition when this transition is followed with smooth pursuit eye tracking along its motion trajectory NOTE The profile can be calculated from the motion picture response curve for any given motion speed. 3.3 edge blur bl

48、ur that becomes visible on an intrinsically sharp transition between two adjacent areas, with a different luminance level, when the transition smoothly moves across the display as a function of time. NOTE Preconditions for this type of edge blur are smooth pursuit eye tracking of the object, and no

49、obvious flicker, indicating that luminance integration with a frame period is allowed. This blur phenomenon is mainly caused by a slow response time of the liquid crystal cell in combination with the hold-type characteristics. 61747-6-3 IEC:2011 7 3.4 perceived blurred edge time time-related equivalent of the perceived blurred edge width. The latter one is derived

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