1、IEEE Standard for Digitizing Waveform Recorders IEEE Std 1057-2017 (Revision of IEEE Std 1057-2007) IEEE Instrumentation Society Sponsored by the Waveform Generation, Testing, and Measurement Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std 1057-2017 (Revision of IEEE Std 1057-2007)
2、IEEE Standard for Digitizing Waveform Recorders Sponsor Waveform Generation, Testing, and Measurement Committee of the IEEE Instrumentation Society Approved 28 September 2017 IEEE-SA Standards BoardAbstract: Terminology and test methods for describing the performance of waveform recorders are presen
3、ted in this standard. Keywords: effective number of bits, frequency response, noise, IEEE 1057, sine fitting, step pulse response, total harmonic distortion, transitions levels, waveform recorders The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA
4、 Copyright 2018 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 26 January 2018. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effecti
5、veness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not
6、 imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments i
7、n the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other perso
8、n or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given I
9、EEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF
10、LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE W AS FORESEEABLE.4 Copyright 2018 IE
11、EE. All rights reserved. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement
12、 written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures,
13、symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standar
14、ds documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, togethe
15、r with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordin
16、ating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard
17、 is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations
18、 Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards,
19、intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under US and international copyright laws. They are made available by IEEE and are adopted for a wide varie
20、ty of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private u
21、sers, IEEE does not waive any rights in copyright to the documents.5 Copyright 2018 IEEE. All rights reserved. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational
22、internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroo
23、m use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of ame
24、ndments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every 10 years. When a document is more than 10 years
25、 old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whe
26、ther a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Xplore at http:/ ieeexplore .ieee .or g/ or contact IEEE at the address listed previously. For more information about the IEEE-SA or IEEEs standards
27、development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL for errata per
28、iodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection th
29、erewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE- SA Website at http:/ standards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters of Assurance may indicate whether the Submitter is
30、 willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Lette
31、r of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection
32、with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibili
33、ty. Further information may be obtained from the IEEE Standards Association.6 Copyright 2018 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Waveform Recorder Working Group had the following membership: William B. Boyer, Chair Francisco Alegria Eualia Balest
34、rieri Niclas Bjorsell Jerome Blair Andrea Cataldo Lorenzo Ciani Dominique Dallet Pasquale Daponte Egidio De Benedetto Luca De Vito Izzet Kale Donald Larson Dennis Lia Thomas Linnenbrink Sol Max Kruno Milievi Antonio Moschitta Sergio Rapuano Steve Tilden The following members of the balloting committ
35、ee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Ali Al A wazi Charles Barest Niclas Bjorsell Jerome Blair William Boyer Demetrio Bucaneg Jr. Andrea Cataldo Luca De Vito Sourav Dutta Gearold O. H. Eidhin Randall Groves Werner Hoelzl Ronald Jarrett Donald
36、Larson Dennis Lia Thomas Linnenbrink Sol Max Edward Mccall Kruno Milievi R. Murphy Sergio Rapuano Jeremy Smith Joseph Stanco Walter Struppler Steven Tilden Lisa Ward Jian Y u When the IEEE-SA Standards Board approved this standard on 28 September 2017, it had the following membership: Jean-Philippe
37、Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Joseph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette
38、 D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Y u Y uan *Member Emeritus7 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1057-2017, IEEE Standard for Digitizing Waveform Recorders. This standard is
39、a revision and modernization of the previous standard, IEEE Std 1057-2007. It presents methods for the test and evaluations of digitizing waveform recorders approved by the balloting committee.8 Copyright 2018 IEEE. All rights reserved. Contents 1. Overview . 15 1.1 Scope 15 1.2 Waveform recorder ba
40、ckground . 15 2. Normative references 16 3. Definitions . 17 3.1 Definitions 17 3.2 Symbols and acronyms . 24 4. Test parameters and methods . 28 4.1 Manufacturer supplied information 28 4.2 Test selection 31 4.3 Test setup 32 4.4 Equivalent-time sampling. 39 4.5 Discrete Fourier transform (DFT) 43
41、4.6 Sine wave testing and fitting . 52 4.7 Locating code transition levels . 59 4.8 Step function response measurements 77 4.9 Tests using a dc input 80 5. Input impedance 81 5.1 Test method 81 5.2 Alternate test method using a time domain reflectometer (TDR) 81 5.3 Input impedance for out-of-range
42、signals . 81 6. Static gain and offset 83 6.1 Independently based gain and offset . 83 6.2 Terminal-based gain and offset . 85 7. Linearity 85 7.1 Integral nonlinearity (INL) . 85 7.2 Maximum static error (MSE) 86 7.3 Differential nonlinearity (DNL) and missing codes 86 7.4 Example INL and DNL data
43、 87 7.5 Monotonicity 89 7.6 Hysteresis . 90 7.7 Total harmonic distortion (THD) 91 7.8 Intermodulation distortion (IMD) . 96 7.9 Noise power ratio (NPR) 98 8. Noise 7104 8.1 Comments on noise 105 8.2 Ratio of signal to noise and distortion (SINAD) . 105 8.3 Signal to noise ratio (SNR) . 106 8.4 Comments on SINAD and SNR . 106 8.5 Effective number of bits (ENOB) . 107 8.6 Random noise . 110 8.7 Spurious components 111 8.8 Spurious-free dynamic range (SFDR) 112
