1、 IEC 62525Edition 1.0 2007-11INTERNATIONAL STANDARD Standard Test Interface Language (STIL) for Digital Test Vector Data IEC 62525:2007(E)IEEE Std.1450-1999 IEEE 1450THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent 19.
2、080 PRICE CODEISBN 2-8318-9337-2IEEE 14501. Overview.101.1 Scope.121.2 Purpose132. References.133. Definitions, acronyms, and abbreviations.133.1 Definitions.133.2 Acronyms and abbreviations.164. Structure of this standard 165. STIL orientation and capabilities tutorial (informative).175.1 Hello Tes
3、ter.175.2 Basic LS245. 225.3 STIL timing expressions/”Spec” information 265.4 Structural test (scan) 315.5 Advanced scan . 355.6 IEEE Std 1149.1-1990 scan . 415.7 Multiple data elements per test cycle. 465.8 Pattern reuse/direct access test. 505.9 Event data/non-cyclized STIL information . 546. STIL
4、 syntax description. 646.1 Case sensitivity 646.2 Whitespace. 646.3 Reserved words 646.4 Reserved characters . 666.5 Comments 676.6 Token length 676.7 Character strings 676.8 User-defined name characteristics . 686.9 Domain names . 686.10 Signal and group name characteristics.696.11 Timing name cons
5、tructs. 696.12 Number characteristics. 696.13 Timing expressions and units (time_expr). 706.14 Signal expressions (sigref_expr) 726.15 WaveformChar characteristics. 736.16 STIL name spaces and name resolution. 747. Statement structure and organization of STIL information . 767.1 Top-level statements
6、 and required ordering 687.2 Optional top-level statements 707.3 STIL files . 70Published by IEC under licence from IEEE. 1999 IEEE. All rights reserved.IEEE Introduction .9FOREWORD 6IEC 62525:2007(E)IEEE 1450-1999(E) 2 CONTENTS8. STIL statement. 798.1 STIL syntax 798.2 STIL example. 799. Header blo
7、ck 809.1 Header block syntax. 809.2 Header example . 8010. Include statement . 8010.1 Include statement syntax 8110.2 Include example. 8110.3 File path resolution with absolute path notation 8110.4 File path resolution with relative path notation . 8111. UserKeywords statement . 8211.1 UserKeywords
8、statement syntax 8211.2 UserKeywords example. 8212. UserFunctions statement 8212.1 UserFunctions statement syntax 8312.2 UserFunctions example 8313. Ann statement 8313.1 Annotations statement syntax 8313.2 Annotations example . 8314. Signals block 8314.1 Signals block syntax 8414.2 Signals block exa
9、mple . 8615. SignalGroups block 8615.1 SignalGroups block syntax 8615.2 SignalGroups block example . 8715.3 Default attribute values 8715.4 Translation of based data into WaveformChar characters. 8816. PatternExec block 8916.1 PatternExec block syntax. 9016.2 PatternExec block example 9017. PatternB
10、urst block 9017.1 PatternBurst block syntax 9117.2 PatternBurst block example . 92Published by IEC under licence from IEEE. 1999 IEEE. All rights reserved.IEC 62525:2007(E)IEEE 1450-1999(E) 3 18. Timing block and WaveformTable block 9218.1 Timing and WaveformTable syntax 9318.2 Waveform event defini
11、tions. 9618.3 Timing and WaveformTable example . 9818.4 Rules for timed event ordering and waveform creation. 9918.5 Rules for waveform inheritance. 10219. Spec and Selector blocks 10319.1 Spec and Selector block syntax.10319.2 Spec and Selector block example .10520. ScanStructures block.10620.1 Sca
12、nStructures block syntax .10720.2 ScanStructures block example 10821. STIL Pattern data . 10921.1 Cyclized data 10921.2 Multiple-bit cyclized data 11021.3 Non-cyclized data 11121.4 Scan data 11121.5 Pattern labels 11222. STIL Pattern statements. 11222.1 Vector (V) statement 11222.2 WaveformTable (W)
13、 statement 11322.3 Condition (C) statement. 11322.4 Call statement. 11422.5 Macro statement. 11422.6 Loop statement. 11522.7 MatchLoop statement. 11522.8 Goto statement . 11622.9 BreakPoint statements 11622.10 IDDQTestPoint statement 11622.11 Stop statement 11722.12 ScanChain statement 11723. Patter
14、n block 11723.1 Pattern block syntax. 11723.2 Pattern initialization. 11823.3 Pattern examples 11824. Procedures and MacroDefs blocks. 11824.1 Procedures block 11924.2 Procedures example . 12024.3 MacroDefs block 12024.4 Scan testing 12024.5 Procedure and Macro Data substitution. 121Published by IEC
15、 under licence from IEEE. 1999 IEEE. All rights reserved.IEC 62525:2007(E)IEEE 1450-1999(E) 4 Annex A (informative) Glossary . 125Annex B (informative) STIL data model. 126Annex C (informative) GNU GZIP reference . 131Annex D (informative) Binary STIL data format 132Annex E (informative) LS245 desig
16、n description 136Annex F (informative) STIL FAQs and language design decisions 138Annex G (informative) List of participants 142 Published by IEC under licence from IEEE. 1999 IEEE. All rights reserved.IEC 62525:2007(E)IEEE 1450-1999(E) 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _STANDARD TEST INTE
17、RFACE LANGUAGE (STIL)FOR DIGITAL TEST VECTOR DATAFOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation o
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46、ion therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. IEC 62525:2007(E)IEEE 1450-1999(E) 7 IEEE StandardTest Int
47、erface Language (STIL) for DigitalTestVector DataSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 18 March 1999IEEE-SA Standards BoardAbstract: Standard Test Interface Language (STIL) provides an interface between digital test gen-eration tools and test equipment. A test
48、 description language is defined that: (a) facilitates the trans-fer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, andtiming information sufficient to define the application of digital test vectors to a DUT; and (c) sup-ports the volume of test vector data
49、generated from structured tests.Keywords: automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided en-gineering (CAE), cyclize, device under test (DUT), digital test vectors, event, functional vectors, pat-tern, scan vectors, signal, structural vectors, timed event, waveform, waveshapePublished by IEC under licence from IEEE. 1999 IEEE. All rights reserved.IEC 62525:2007(E)IEEE 1450-1999(E) 8 Standard Test Interface Language (STIL) was initially developed by an ad-hoc consortium of test equipmentvendors, compute
