IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf

上传人:fuellot230 文档编号:1248209 上传时间:2019-09-02 格式:PDF 页数:74 大小:4.43MB
下载 相关 举报
IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf_第1页
第1页 / 共74页
IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf_第2页
第2页 / 共74页
IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf_第3页
第3页 / 共74页
IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf_第4页
第4页 / 共74页
IEEE 1453-2015 en Recommended Practice for the Analysis of Fluctuating Installations on Power Systems《电力系统起伏分析装置推荐性操作规范》.pdf_第5页
第5页 / 共74页
点击查看更多>>
资源描述

1、IEEE Recommended Practice for the Analysis of Fluctuating Installations on Power Systems Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1453-2015 (Revision of IEEE Std 1453-2011) IEEE Std 1453-2015 (Revis

2、ion of IEEE Std 1453-2011) IEEE Recommended Practice for the Analysis of Fluctuating Installations on Power Systems Sponsor Transmission and Distribution Committee of the IEEE Power and Energy Society Approved 3 September 2015 IEEE-SA Standards Board Copyright 2015 IEEE. All rights reserved. ii Abst

3、ract: Background on light flicker caused by fluctuations in power demands of variable loads is presented in this recommended practice. A flicker measurement method is presented using a meter that is completely described in IEC 61000-4-15. The short-term (Pst) and long-term (Plt) flicker indices used

4、 for the analysis of flicker data are defined. Flicker limits for various voltage levels are presented. An assessment procedure for evaluating flicker compliance against emission limits is described. Methodologies to analyze background flicker to identify the flicker contribution of single loads are

5、 also presented. Keywords: flicker, fluctuating loads, IEEE 1453, power systems The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2015 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 Octo

6、ber 2015. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: result

7、s; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services

8、related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards avail

9、able, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent

10、 judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUEN

11、TIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT

12、OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard

13、 is translated, only the English version published by IEEE should be considered the approved IEEE standard. Copyright 2015 IEEE. All rights reserved. iv Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not

14、be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it cle

15、ar that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE do

16、es not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is imp

17、ortant that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where th

18、e matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following addr

19、ess: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulato

20、ry requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as do

21、ing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in priv

22、ate self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropri

23、ate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 2

24、22 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2015 IEEE. All rights reserved. v Updating of IEEE Standards documents Users of

25、IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of

26、 the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still o

27、f some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments

28、, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if

29、any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may requir

30、e use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter

31、 of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with re

32、asonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which

33、 a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminato

34、ry. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2015 IEEE. All rights res

35、erved. Participants At the time this IEEE recommended practice was completed, the IEEE Std 1453 Working Group had the following membership: Kenn Sedziol, Chair Harish Sharma, Vice Chair Mohamed Abdelrahaman Moataz Ammar Julio Barros Rich Bingham Math Bollen Gary Chang Jiri Drapela Erich Gunther Mark

36、 Halpin Dennis Hansen Randy Horton Bill Howe Dallas Jacobsen Steven Johnston Geza Joos Roberto Langella Theo Laughner George Cristian Lazaroiu Ryan Lian Alex McEachern Jan Meyer Carl Miller Bill Moncrief Dave Mueller Matt Norwalk Sarath Perera Al Powers Sarah Ronnberg Daniel Sabin Andrew Sagl Matthe

37、w Seeley Steve Tatum Alfredo Testa Mario Tremblay Tim Unruh Neville Watson Brian Wong Wilson Xu Francisc Zavoda Dave Zech The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. William Ackerma

38、n Saleman Alibhay Thomas Barnes Julio Barros Frank Basciano Richard Bingham William Bloethe Math Bollen James Bouford Jeffrey Brogdon Gustavo Brunello William Bush Wen-Kung Chang James Cole David E. De Luca Carlo Donati Gary Donner Neal Dowling Donald Dunn Gearold O. H. Eidhin David Gilmer Joseph Gr

39、appe Randall Groves Ajit Gwal Donald Hall Dennis Hansen Jeffrey Helzer Lee Herron Werner Hoelzl Richard Jackson Steven Johnston Laszlo Kadar Yuri Khersonsky Joseph L. Koepfinger Jim Kulchisky Theo Laughner George Cristian Lazaroiu Albert Livshitz Sujeet Mishra Andrew Morris Daniel Mulkey Jerry Murph

40、y Arthur Neubauer Michael Newman Joe Nims Matthew Norwalk Gregory Olson Carl Orde Lorraine Padden Marty Page Bansi Patel Branimir Petosic Dean Philips Mohamed Rahman Reynaldo Ramos Michael Roberts Charles Rogers Sarah Ronnberg Daniel Sabin Bob Saint Bartien Sayogo Robert Schuerger Kenn Sedziol Devki

41、 Sharma Harish Sharma Charles Simmons David Singleton Jerry Smith Gary Smullin K Stump Michael Swearingen David Tepen John Vergis Daniel Ward Kenneth White James Wikston Jian Yu David Zech vii Copyright 2015 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this recommended practi

42、ce on 3 September 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koep

43、finger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Phillip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritusviii Copyright 2015 IEEE. All rights reserved. Introduction This introduct

44、ion is not part of IEEE Std 1453-2015, IEEE Recommended Practice for the Analysis of Fluctuating Installations on Power Systems. Voltage fluctuations on electric power systems sometimes give rise to noticeable illumination changes from lighting equipment. The frequency of these voltage fluctuations

45、is much less than the 50 Hz or 60 Hz supply frequency. However, they may occur with enough frequency and magnitude to cause irritation for people observing the illumination changes. This phenomenon is often referred to as flicker, lamp flicker, and sometimes voltage flicker. Often times, the terms h

46、ave been used interchangeably. IEEE Std 141-1993 B14 and IEEE Std 519-1992 B15 contain charts showing allowable voltage fluctuations. The advent of high-power electronic utilization equipment and mitigation equipment has given rise to some very complex voltage fluctuations that are not easily handle

47、d by IEEE Std 141-1993 B14 and IEEE Std 519-1992 B15. For this reason, the IEEE has worked in close cooperation with the International Union for Electroheat (UIE) and the International Electrotechnical Commission (IEC) to enhance existing standards to include a broader part of the world community. I

48、n 2004, IEEE Std 1453-2004 was published, adopting the IEC flickermeter standard and providing recommended levels. IEEE Std 1453-2011 adopted the 2010 edition of the IEC 61000-4-15, moving the recommended acceptable flicker levels to its annex, facilitating the adoption of the IEC/TR 61000-3-7 in IE

49、EE Std 1453.1-2012. This present version of IEEE Std 1453 replaces both IEEE Std 1453-2011 and IEEE Std 1453.1-2012. This edition uses the IEC flicker methodology while providing additional information. ix Copyright 2015 IEEE. All rights reserved. Contents 1. Overview 11.1 Scope . 1 1.2 Purpose 1 2. Normative references 23. Definitions 24. History 65. Recommendations for characterizing flicker levels 75.1 Introduction to flicker 7 5.2 IEEE 1453 flicker monitoring procedures . 8 5.3 Flicker performance of different lamp types . 11 5.4 Impact of interharmonic

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > IEC

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1