1、The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2001 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 23 March 2001. Printed in the United States of America.Print: ISBN 0-7381-2627-6 SH94886PD
2、F: ISBN 0-7381-2628-4 SS94886No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1546-2000 (R2011)IEEE Guide for Digital Test Interchange Format (DTIF) ApplicationSponsorIEEE Standar
3、ds Coordinating Committee 20onTest and Diagnosis for Electronic SystemsReaffirmed 7 December 2011Approved 21 September 2000IEEE-SA Standards BoardAbstract: An aid in the understanding and use of digital test interchange format (DTIF) files isprovided in this guide. This information will be an aid to
4、 users in developing tools such aspreprocessors and postprocessors of DTIF data and other utilities.Keywords: automatic test equipment (ATE), digital automatic test program generator, digital testinterchange format (DTIF), unit under test (UUT)IEEE Standardsdocuments are developed within the IEEE So
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17、y or scope of those patents that are brought to its attention.Copyright 2001 IEEE. All rights reserved.iiiIntroductionThis introduction is not part of IEEE Std 1546-2000, IEEE Guide for Digital Test Interface Format (DTIF) Application.IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Fo
18、rmat (DTIF), provides a mechanism fordigital test data interchange independent of a specic digital automatic test program generator and automatictest equipment. This guide is supplementary to IEEE Std 1445-1998.The purpose of this guide is to provide an aid in the understanding and use of DTIF les.
19、This applicationguide will provide information that will be an aid to users in developing tools such as preprocessors andpostprocessors of DTIF data and other utilities.ParticipantsAt the time this proposed standard was completed, the Test Application (TA) Subcommittee had the follow-ing membership:
20、Mukund Modi, TA Co-ChairBrit Frank, TA Co-ChairHarold Davis, SecretaryJose De La Cruz, Working Group ChairIn addition, the following persons made signicant contributions to this document:The following members of the balloting committee voted on this standard:When the IEEE-SA Standards Board approved
21、 this standard on 21 September 2000, it had the followingmembership:Donald N. Heirman,ChairJames T. Carlo,Vice ChairJudith Gorman,Secretary*Member EmeritusJoanne K. Buckley Hugh A. Pritchett David E. RolinceGuy AdamJoanne K. BuckleyBernard DathyHarold DavisSomnath DebJose De La CruzBrit FrankArnold
22、M. GreenspanGary L. HardenburgMichael G. HarrisonOsamu KaratsuGregory A. MastonMukund ModiLeslie A. OrlidgeJean PouillyDavid E. RolinceJohn W. SheppardWilliam R. SimpsonJoseph J. StancoWilliam John TaylorJ. Richard WegerSatish K. AggarwalMark D. BowmanGary R. EngmannHarold E. EpsteinH. Landis FloydJ
23、ay Forster*Howard M. FrazierRuben D. GarzonJames H. GurneyRichard J. HollemanLowell G. JohnsonRobert J. KennellyJoseph L. Koepnger*Peter H. LipsL. Bruce McClungDaleep C. MohlaJames W. MooreRobert F. MunznerRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoDonald W. ZipseivCop
24、yright 2001 IEEE. All rights reserved.Also included is the following nonvoting IEEE-SA Standards Board liaison:Alan Cookson, NIST RepresentativeDonald R. Volzka, TAB RepresentativeAndrew D. IckowiczIEEE Standards Project EditorCopyright 2001 IEEE. All rights reserved.vContents1. Overview11.1 Scope11
25、.2 Purpose.12. References13. Definitions of terms and acronyms23.1 Terms.23.2 Acronyms.24. DTIF functional groups24.1 UUT Model group44.2 Stimulus and Response group84.3 Fault Dictionary group.124.4 Probe group135. DTIF application example.165.1 Application example UUT Model group175.2 Application e
26、xampleStimulus and Response group225.3 Application exampleFault Dictionary group.265.4 Application exampleProbe group29Copyright 2001 IEEE. All rights reserved.1IEEE Guide for Digital Test Interchange Format (DTIF) Application1. OverviewThe Digital Test Interchange Format (DTIF) is intended to provi
27、de a data interchange that can be used withvarious test environments. The DTIF standard provides a neutral format for the development and delivery ofdigital test information.1.1 ScopeThis guide serves as an aid to developers who need to represent data in an application neutral manner andhave chosen
28、DTIF (see IEEE Std 1445-19981) to do so. The guide explains the DTIF from a user perspec-tive, giving examples and directions showing how to implement and use the DTIF. The intent of thedocument is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998.1.2 PurposeThis guide is mea
29、nt to provide an aid in the understanding and use of DTIF les. This information will be anaid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.2. ReferencesThis standard shall be used in conjunction with the following publications:IEEE 100, The A
30、uthoritative Dictionary of IEEE Standards Terms, Seventh Edition.2IEEE Std 1445-1998, IEEE Standard for Digital Test Interchange Format (DTIF).1Information on references can be found in Clause 2.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lan
31、e, P.O. Box 1331, Piscataway,NJ 08855-1331, USA (http:/standards.ieee.org/).IEEEStd 1546-2000 IEEE GUIDE FOR DIGITAL TEST2Copyright 2001 IEEE. All rights reserved.3. Denitions of terms and acronyms3.1 Terms3.1.1 fault simulation:The process of simulating a unit under test (UUT) failure and observing
32、 its effects.3.1.2 pin map:The interconnections between circuit pins and automatic test equipment (ATE) input/output(I/O) pins (tester channels).3.1.3 user node:A physical point on a UUT that can be a primary input, primary output, or other netconnection.3.1.4 wired net:A schema used to represent ci
33、rcuit nodes containing more than one source, which utilizesvirtual and actual component connections and implementations.3.2 AcronymsASCII American Standards Code for Information InterchangeATE automatic test equipmentCPP clock pulses per patternDTIF digital test interchange formatI/O input/outputITA
34、 interface test adapterPI primary inputPO primary outputPOPAT primary output patternTPStest program setTSET timing setTU timing unitUUT unit under test4. DTIF functional groupsThere are thirty-nine DTIF les composed of one HEADER le and thirty-eight data les. The thirty-nineDTIF les are organized in
35、to four functional groups. The four functional groups are as follows:a) UUT Modelb) Stimulus and Responsec) Fault Dictionaryd) ProbeEach functional group contains related, non-sequential American Standard Code for Information Inter-change (ASCII) data les. Figure 1 depicts the DTIF data les organize
36、d into the four functional groups byle type name followed by the le number in parenthesis. This organization portrays the role of eachfunctional group as it relates to unit under test (UUT) testing.The UUT Model group contains all the les required to dene the topological database for diagnosing faul
37、tson the UUT. This includes component instantiations, component I/O pins, primary inputs, primary outputs,and package interconnections. The Stimulus and Response group is used for fault detection testing (end-to-end) while all the other groups are used for the fault isolation process. The intent of
38、an end-to-end test of aUUT is to verify the overall functionality of the item and to indicate a failure if one exists and can beIEEEINTERCHANGE FORMAT (DTIF) APPLICATION Std 1546-2000Copyright 2001 IEEE. All rights reserved.3detected by the test pattern set developed for it. There is no explicit att
39、empt to diagnose the cause of the fail-ure. Fault isolation by fault dictionary is a diagnostic test technique that does not require physical probing ofa circuit. Data generated by a fault simulator is analyzed and generally arranged into matrices that matchfault indications with a characteristic fa
40、iling response at the primary output pins of the UUT. Actual failingresponses are captured on the automatic test equipment (ATE) and compared to the fault dictionary matrixfor fault isolation. Isolating faults using a probe is a diagnostic test technique that utilizes a probe connectedto the ATE to
41、aid in isolating failures on the UUT. The information required to generate a probe diagnostictest includes a detailed description of the circuit that would help direct the test operator where to probe andprovide the data necessary to determine whether or not a response monitored by the probe matched
42、 the goodcircuit response. The three mutually independent areas for testing that are covered by the DTIF les are asfollows: end-to-end diagnostics using fault dictionary diagnostics using probeThese three areas are further broken down into static and dynamic modes.The HEADER le does not belong to an
43、y of the four functional groups. It provides summary informationand a listing of the total DTIF le set developed for a given UUT. The rst record identies the le typename, the DTIF le number, the le revision number (optional), the UUT name, and the date and time oforigination. The rst record in every
44、 DTIF le follows this format.Figure 1DTIF data le typesIEEEStd 1546-2000 IEEE GUIDE FOR DIGITAL TEST4Copyright 2001 IEEE. All rights reserved.4.1 UUT Model groupThe UUT Model group contains fteen les that dene the UUT model topology. Extensive use is made ofpointers and lists within these les. Table
45、 1 identies all of the les in the UUT Model group and is indicatedby the DTIF le type name and number and DTIF le name along with its pertinent applications.4.1.1 PI_NAMES (4)This le denes each primary input (PI) pin by name and binds it to a user node number. These are used forinput/output (I/O) co
46、nnection identication.4.1.2 PO_NAMES (5)This le denes each primary output (PO) pin by name and binds it to a user node number. These are usedfor I/O connection identication.Table 1UUT Model group lesDTIF le type name and number DTIF le nameEnd-to-endEnd-to-endFault dict.Fault dict.Probe ProbeStaticD
47、ynamicStaticDynamicStaticDynamicPI_NAMES (4) pinames.tapXXXXXXPO_NAMES (5) ponames.tapXXXXXXMAIN_MODEL (6) mainmodel.tapXXXXCOMPONENT_TYPE (7) types.tapXXXXUSER_NODE (8) usernodes.tapXXXXINPUT_PIN_NAMES (9) inputpins.tapXXXXOUTPUT_PIN_NAMES (10) outputpin.tapXXXXNEAR_FROMS_POINTERS (11) nerfrmptr.ta
48、pXXNEAR_FROMS (12) nearfroms.tapXXNODE_SOURCE (16) nodsource.tapXXTRISTATE_FROMS_POINTERS (21) zfromptrs.tapXXTRISTATE_FROMS (22) zfroms.tapXXPSEUDOPI_NAMES (23) psupinams.tapXXXXAUXILIARY_PIN_NAMES (27) auxpins.tapXXXXNODE_NAMES (35) nodenames.tapXXXXIEEEINTERCHANGE FORMAT (DTIF) APPLICATION Std 15
49、46-2000Copyright 2001 IEEE. All rights reserved.54.1.3 MAIN_MODEL (6) A UUT model can be understood in terms of six major elements: a) Component typesb) Component pinsc) Package namesd) Package numberse) User node numbersf) User node namesA component type and its pins only need to be identied once for a given UUT model even though there maybe multiple instantiations of a component type. When used in the UUT model, packages are dened with acomponent type and a unique package name and number to distinguish them
