IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf

上传人:ownview251 文档编号:1248319 上传时间:2019-09-02 格式:PDF 页数:56 大小:767.62KB
下载 相关 举报
IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf_第1页
第1页 / 共56页
IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf_第2页
第2页 / 共56页
IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf_第3页
第3页 / 共56页
IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf_第4页
第4页 / 共56页
IEEE 15939-2008 en Adoption of ISO IEC 15939 2007Systems and Software EngineeringMeasurement Process (IEEE Computer Society)《系统和软件工程 测量过程》.pdf_第5页
第5页 / 共56页
点击查看更多>>
资源描述

1、IEEE Std 15939-2008IEEE Standard Adoption of ISO/IEC 15939:2007Systems and Software EngineeringMeasurement Process IEEE3 Park Avenue New York, NY 10016-5997, USA30 January 2009IEEE Computer SocietySponsored by theSoftware +1 978 750 8400. Permission to photocopy portions of any individual standard f

2、or educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 15939-2008, IEEE StandardAdoption of ISO/IEC 15939:2007Systems and Software Engineering Measurement Process. This standard is identical to ISO/IEC 15939:20

3、07. The properties of the activities of the measurement process that are defined in this International Standard are the same properties defined in ISO/IEC 15288:2008, IEEE Std 15288-2008, ISO/IEC 12207:2008, and IEEE Std 12207-2008. These standards were jointly developed by ISO/IEC and IEEE. This ad

4、option is one result of an ongoing harmonization of the standards of the IEEE Computer Societys Software and Systems Engineering Standards Committee (S2ESC) and the corresponding international standards committee, ISO/IEC JTC1/SC7 (Software and Systems Engineering). Notice to users Laws and regulati

5、ons Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory r

6、equirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and

7、 private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not

8、 waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An off

9、icial IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corri

10、genda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at htt

11、p:/standards.ieee.org. iv Copyright 2009 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpret

12、ations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standa

13、rd, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or det

14、ermining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and t

15、he risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard was completed, the Adoption of ISO/IEC 15939 Working Group had the following membership: Cheryl Jones, Chair J

16、ames W. Moore Garry J. Roedler v Copyright 2009 IEEE. All rights reserved. vi Copyright 2009 IEEE. All rights reserved. The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Chris Bagge Juris Borzovs Pie

17、ter Botman Lyle Bullock Juan Carreon Danila Chernetsov Keith Chow Raul Colcher Paul Croll Geoffrey Darnton Scott Duncan Sourav Dutta Kenneth D. Echeberry Carla Ewart Andrew Fieldsend Gregg Giesler Allan Gillard Lewis Gray Randall Groves John Harauz Mark Henley Rutger A. Heunks Werner Hoelzl Robert H

18、olibaugh Atsushi Ito Mark Jaeger Cheryl Jones Piotr Karocki Dwayne Knirk Ronald Kohl Thomas Kurihara George Kyle Dewitt Latimer David J. Leciston Daniel Lindberg Carol Long William Lumpkins G. Luri Edward McCall Avygdor Moise James W. Moore Rajesh Murthy Michael S. Newman Mark Paulk Miroslav Pavlovi

19、c William Petit Ulrich Pohl Jose Puthenkulam Robert Robinson Terence Rout James Sanders Helmut H.Sandmayr Robert Schaaf James Sivak Luca Spotorno Thomas Starai Walter Struppler Marcy Stutzman Douglas Thiele John Thywissen Thomas Tullia Vincent Tume John Walz Don Wright Janusz Zalewski When the IEEE-

20、SA Standards Board approved this standard on 10 December 2008, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman William R. Goldbach Arnold M. G

21、reenspan Kenneth S. Hanus Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sahazizian Malcolm V. Thaden Howard L. Wolfman Don Wright *Member Emeritus Also incl

22、uded are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael Janezic, NIST Representative Jennie Steinhagen IEEE Standards Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Development IEEE Standar

23、d Adoption of ISO/IEC 15939:2007Systems and Software Engineering Measurement Process IMPORTANT NOTICE: This standard is not intended to assure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety,

24、security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important N

25、otice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/ disclaimers.html. Reference numberISO/IEC 15939:2007(E)ISO/IEC 2007INTERNATIONAL STANDARD ISO/IEC15939Second edition2007-08-01Corrected v

26、ersion2008-10-01Systems and software engineering Measurement process Ingnierie des systmes et du logiciel Processus de mesure ISO/IEC 15939:2007(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall no

27、t be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this file, parties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central Secretariat accepts no liability in this area. Adob

28、e is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creation parameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO m

29、ember bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2007 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any fo

30、rm or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 g120 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 7

31、49 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2007 All rights reservedISO/IEC 15939:2007(E) ISO/IEC 2007 All rights reserved iiiContents Page Foreword iv Introduction v 1 Scope . 1 1.1 Purpose 1 1.2 Field of application . 1 1.3 Tailoring this International Stan

32、dard 1 1.4 Conformance. 1 1.5 Limitations. 2 2 Terms and definitions. 2 3 Application of this International Standard . 7 3.1 Purpose and outcomes of the measurement process 7 3.2 Overview of this International Standard. 7 3.3 Organization of this International Standard.10 4 Description of the activi

33、ties. 11 4.1 Establish and sustain measurement commitment 11 4.2 Plan the measurement process. 12 4.3 Perform the measurement process 16 4.4 Evaluate measurement. 18 Annex A (informative) The measurement information model 20 Annex B (informative) Measurement process work products . 28 Annex C (infor

34、mative) Example criteria for selecting measures. 30 Annex D (informative) Example criteria for evaluating an information product 32 Annex E (informative) Example criteria for evaluating the performance of the measurement process 35 Annex F (informative) Example elements of measurement planning . 36

35、Annex G (informative) Guidelines for reporting information products 37 Bibliography . 38 ISO/IEC 15939:2007(E) iv ISO/IEC 2007 All rights reservedForeword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for

36、worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collabora

37、te in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are

38、 drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prepare International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an

39、International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent righ

40、ts. ISO/IEC 15939 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 7, Software and systems engineering. This second edition cancels and replaces the first edition (ISO/IEC 15939:2002), which has been technically revised. This corrected version of ISO/I

41、EC 15939:2007 contains new cross-reference numbering in Figure 1, 3.3 and Figure B.1, which was incorrect in the original version. It also updates all references to ISO/IEC 15288 and ISO/IEC 12207 to the second editions, which have now been published. ISO/IEC 15939:2007(E) ISO/IEC 2007 All rights re

42、served vIntroduction Measurement supports the management and improvement of processes and products. Measurement is a primary tool for managing system and software life cycle activities, assessing the feasibility of project plans, and monitoring the adherence of project activities to those plans. Sys

43、tem and software measurement is also a key discipline in evaluating the quality of products and the capability of organizational processes. It is becoming increasingly important in two-party business agreements, where it provides a basis for specification, management, and acceptance criteria. Contin

44、ual improvement requires change within the organization. Evaluation of change requires measurement. Measurement itself does not initiate change. Measurement should lead to action and not be employed purely to accumulate data. Measurements should have a clearly defined purpose. This International Sta

45、ndard defines a measurement process applicable to system and software engineering and management disciplines. The process is described through a model that defines the activities of the measurement process that are required to adequately specify what measurement information is required, how the meas

46、ures and analysis results are to be applied, and how to determine if the analysis results are valid. The measurement process is flexible, tailorable, and adaptable to the needs of different users. The measurement process defined in this International Standard, while written for system and software d

47、omains, can be applied in other domains. INTERNATIONAL STANDARD ISO/IEC 15939:2007(E) ISO/IEC 2007 All rights reserved 1Systems and software engineering Measurement process 1 Scope 1.1 Purpose This International Standard identifies the activities and tasks that are necessary to successfully identify

48、, define, select, apply and improve measurement within an overall project or organizational measurement structure. It also provides definitions for measurement terms commonly used within the system and software industries. This International Standard does not catalogue measures, nor does it provide

49、a recommended set of measures to apply on projects. It does identify a process that supports defining a suitable set of measures that address specific information needs. 1.2 Field of application This International Standard is intended to be used by suppliers and acquirers. Suppliers include personnel performing management, technical and quality management functions in system and software development, maintenance, integration and product support organizations. Acquirers include personnel performing management, technical and quality managem

展开阅读全文
相关资源
  • IEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdfIEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdf
  • IEC TR2 61464-1998 Insulated bushings - Guide for the interpretation of dissolved gas analysis (DGA) in bushings where oil is the impregnating medium of the mai.pdfIEC TR2 61464-1998 Insulated bushings - Guide for the interpretation of dissolved gas analysis (DGA) in bushings where oil is the impregnating medium of the mai.pdf
  • IEC TR 61241-2-2-1993 Electrical apparatus for use in the presence of combustible dust part 2 test methods section 2 method for determining the electrical resis.pdfIEC TR 61241-2-2-1993 Electrical apparatus for use in the presence of combustible dust part 2 test methods section 2 method for determining the electrical resis.pdf
  • IEC TR 60972-1989 Classification and interpretation of new lighting products《新型照明产品的分类和说明》.pdfIEC TR 60972-1989 Classification and interpretation of new lighting products《新型照明产品的分类和说明》.pdf
  • IEC TR 60943 Edition 21-2009 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals《特殊终端中电气设备部件用关于允许.pdfIEC TR 60943 Edition 21-2009 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals《特殊终端中电气设备部件用关于允许.pdf
  • IEC TR 60943 AMD 1-2008 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals Amendment 1《电气设备部件(特别.pdfIEC TR 60943 AMD 1-2008 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals Amendment 1《电气设备部件(特别.pdf
  • IEC TR 60919-2-2008 Performance of high-voltage direct current (HVDC) systems with line-communicated converters - Part 2 Faults and switching《带线性通信转换器的高压直流(HVDC.pdfIEC TR 60919-2-2008 Performance of high-voltage direct current (HVDC) systems with line-communicated converters - Part 2 Faults and switching《带线性通信转换器的高压直流(HVDC.pdf
  • IEC TR 60870-6-505 Edition 11-2006 Telecontrol equipment and systems - Part.6-505 Telecontrol protocols compatible with ISO standards and ITU-T recommendations .pdfIEC TR 60870-6-505 Edition 11-2006 Telecontrol equipment and systems - Part.6-505 Telecontrol protocols compatible with ISO standards and ITU-T recommendations .pdf
  • IEC TR 60344 CORR1-2012 Calculation of d c resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide Corrigendum 1《.pdfIEC TR 60344 CORR1-2012 Calculation of d c resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide Corrigendum 1《.pdf
  • IEC 62560 CORR1-2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V - Safety specifications Corrigendum 1《普通照明用50 V以上自镇流LED灯 安全要求 勘误表1》.pdfIEC 62560 CORR1-2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V - Safety specifications Corrigendum 1《普通照明用50 V以上自镇流LED灯 安全要求 勘误表1》.pdf
  • 猜你喜欢
  • AWS B2 1-1-210-2001 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding with Consumable Insert Root of Carbon Steel (M-1 P-1 S-1 Group 1 or 2) 1 8 through .pdf AWS B2 1-1-210-2001 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding with Consumable Insert Root of Carbon Steel (M-1 P-1 S-1 Group 1 or 2) 1 8 through .pdf
  • AWS B2 1-1-211-2001 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding with Consumable Insert Root followed by Shielded Metal Arc Welding of Carbon Steel .pdf AWS B2 1-1-211-2001 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding with Consumable Insert Root followed by Shielded Metal Arc Welding of Carbon Steel .pdf
  • AWS B2 1-1-232-2006 Standard Welding Procedure Specification (SWPS) for Argon Plus 25% Carbon Dioxide Shielded Gas Metal Arc Welding (Short Circuiting Transfer Mode) followed by ArA.pdf AWS B2 1-1-232-2006 Standard Welding Procedure Specification (SWPS) for Argon Plus 25% Carbon Dioxide Shielded Gas Metal Arc Welding (Short Circuiting Transfer Mode) followed by ArA.pdf
  • AWS B2 1-1-233-2006 Standard Welding Procedure Specification (SWPS) for Argon Plus 25% Carbon Dioxide Shielded Gas Metal Arc Welding (Short Circuiting Transfer Mode) followed by Arg.pdf AWS B2 1-1-233-2006 Standard Welding Procedure Specification (SWPS) for Argon Plus 25% Carbon Dioxide Shielded Gas Metal Arc Welding (Short Circuiting Transfer Mode) followed by Arg.pdf
  • AWS B2 1-1-234-2006 Standard Welding Procedure Specification (SWPS) for Argon plus 25% Carbon Dioxide Shielded Flux Cored Arc Welding of Carbon Steel (M-1 P-1 S-1 Groups 1 and 2) 1.pdf AWS B2 1-1-234-2006 Standard Welding Procedure Specification (SWPS) for Argon plus 25% Carbon Dioxide Shielded Flux Cored Arc Welding of Carbon Steel (M-1 P-1 S-1 Groups 1 and 2) 1.pdf
  • AWS B2 1-1-235-2006 Standard Welding Procedure Specification (SWPS) for Argon plus 2% Oxygen Shielded Gas Metal Arc Welding (Spray Transfer Mode) of Carbon Steel (M-1 P-1 S-1 Group.pdf AWS B2 1-1-235-2006 Standard Welding Procedure Specification (SWPS) for Argon plus 2% Oxygen Shielded Gas Metal Arc Welding (Spray Transfer Mode) of Carbon Steel (M-1 P-1 S-1 Group.pdf
  • AWS B2 1-1-316-2018 Standard Welding Procedure Specification for Naval Applications (SWPS-N) for Argon Plus 2% Oxygen Shielded Gas Metal Arc Welding (Spray Transfer Mode) of Carbon.pdf AWS B2 1-1-316-2018 Standard Welding Procedure Specification for Naval Applications (SWPS-N) for Argon Plus 2% Oxygen Shielded Gas Metal Arc Welding (Spray Transfer Mode) of Carbon.pdf
  • AWS B2 1-1-317-2018 Standard Welding Procedure Specification for Naval Applications (SWPS-N) for 75% Argon Plus 25% Carbon Dioxide Shielded Flux Cored Arc Welding of Carbon Steel (.pdf AWS B2 1-1-317-2018 Standard Welding Procedure Specification for Naval Applications (SWPS-N) for 75% Argon Plus 25% Carbon Dioxide Shielded Flux Cored Arc Welding of Carbon Steel (.pdf
  • AWS B2 1-22-015-2011 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding of Aluminum (M P-22 to M P-22) 18 through 10 Gauge ER4043 or R4043 in the As-Welde.pdf AWS B2 1-22-015-2011 Standard Welding Procedure Specification (SWPS) for Gas Tungsten Arc Welding of Aluminum (M P-22 to M P-22) 18 through 10 Gauge ER4043 or R4043 in the As-Welde.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > IEC

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1