IEEE 1636 1-2013 en Software Interface for Maintenance Information Collection and Analysis (SIMICA) Exchanging Test Results and Session Information via the eXte.pdf

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1、 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 P

2、ark Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee 20 IEEE Std 1636.1-2013 (Revision of IEEE Std 1636.1-2007) IEEE Std 1636.1-2013 (Revision of IEEE Std 1636.1-2007) IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchangin

3、g Test Results and Session Information via the eXtensible Markup Language (XML) Sponsor IEEE Standards Coordinating Committees on Test and Diagnosis for Electronic Systems (SCC20) Approved 23 August 2013 IEEE-SA Standards Board Abstract: This standard is intended to promote and facilitate interopera

4、bility between components of automatic test systems where test results need to be shared. The standard thus facilitates the capture of test results data in storage devices and databases, facilitating online and offline analysis. The test results schema becomes a class of information that can be used

5、 within the SIMICA family of standards. The exchange format utilizes the XML formats. Keywords: automated test system (ATS), eXtensible markup language (XML), IEEE 1636.1, session information, Software Interface for Maintenance Information Collection and Analysis (SIMICA), test results, XML schema x

6、The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 8 November 2013. Printed in the United States of America. IEEE is a registered trademar

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15、mittees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that indivi

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20、Laws +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2013 IEEE. All rights reserved. v Copyright 2013 IEEE. All rights reserved. Updating of IEEE Standards Documents U

21、sers of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current ed

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23、 still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of am

24、endments, corrigenda, or errata, visit the IEEE-SA website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA website at http:/standards.ieee.org. Errata Err

25、ata, if any, for all IEEE standards can be accessed on the IEEE-SA website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard ma

26、y require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepte

27、d Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates,

28、 with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims f

29、or which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-disc

30、riminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this

31、IEEE standard was completed, the Diagnostic and Maintenance Control (SASB/SCC20/DMC_WG) Working Group had the following membership: Mike Seavey, Chair Chris Gorringe Anand Jain Teresa Lopes Ion Neag John Sheppard Timothy Wilmering The following members of the individual balloting committee voted on

32、this standard. Balloters may have voted for approval, disapproval, or abstention. Michael Bodkin Bill Brown Malcolm Brown Keith Chow Ray Davis David Droste H. Glickenstein Chris Gorringe Randall Groves Werner Hoelzl Noriyuki Ikeuchi Anand Jain Teresa Lopes Greg Luri William Maciejewski Scott Misha M

33、ukund Modi Ion Neag Charles Ngethe Leslie Orlidge Peter Richardson Robert Robinson Bartien Sayogo Mike Seavey John Sheppard Gil Shultz Joseph Stanco Walter Struppler Ronald Taylor Benton Vandiver John Vergis Timothy Wilmering Oren Yuen Daidi Zhong When the IEEE-SA Standards Board approved this stand

34、ard on 26 August 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past President Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halp

35、in Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan*Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richa

36、rd DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE Standards Program Manager, Document Development Kathryn Bennett IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All rights reserved. viIntroduction This introduction is not pa

37、rt of IEEE Std 1636.1-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML). Maintainers of complex systems require the ability to capture and share test result

38、 information in a way that supports such activities as performance analysis, post-production product improvement, maintenance process improvement, and diagnostic maturation. Principal stakeholders of this project include but are not limited to maintenance organizations within various Departments/Min

39、istries of Defense, the commercial airlines, the automotive industry, and the telecommunications industry. This standard is being developed as a component of the IEEE 1636 Software Interface for Maintenance Information Collection and Analysis (SIMICA) project. SIMICAs purpose is to specify a softwar

40、e interface for access, exchange, and analysis of product diagnostic and maintenance information. Clause 4, Test results and session information, provides a subset of the data needed to satisfy SIMICA requirements. The use of formal information models will facilitate exchanging historical test resul

41、ts between information systems and analysis tools. The models will facilitate creating open system software architectures for maturing system diagnostics. The XML schema described in this standard where appropriate utilizes and references components of the IEEE Std 1671 schema set. It is anticipated

42、 that these schemas will be used throughout industries that utilize diagnostic and maintenance data as an exchange format that can be understood by humans or machines. In order to ensure wide acceptance throughout the user community, the schemas have been designed to encompass a broad range of use c

43、ases. To accommodate use cases beyond the released design, the schemas provide means for user extensibility. It is anticipated that the IEEE Std 1636.1 schema will be used throughout the automatic test equipment (ATE) industry as an exchange format that can be understood by humans or machines. In or

44、der to ensure wide acceptance throughout the user community, the schemas have been designed to encompass a broad range of use cases. vii Copyright 2013 IEEE. All rights reserved. Contents 1. Overview 11.1 Scope . 21.2 Purpose 21.3 Application 21.4 Precedence. 31.5 Conventions used in this document .

45、 32. Normative references 43. Definitions, acronyms, and abbreviations 43.1 Definitions . 43.2 Acronyms and abbreviations . 54. Test results and session information. 64.1 Background 64.2 Introduction . 64.3 Applicability 64.4 Usage . 74.5 Relationships to other automatic test system (ATS) architectu

46、ral elements 75. EXPRESS model, EXPRESS-G diagram, and XML schema names and locations . 96. Conformance 107. Extensibility 11Annex A (normative) XML schemas . 12A.1 TestResults.xsd . 12A.2 TestResultsCollection.xsd. 59Annex B (normative) EXPRESS models . 60B.1 TEST_RESULTS_MODEL 60B.2 TestResults mo

47、del EXPRESS-G diagrams . 76Annex C (informative) Bibliography 83viii Copyright 2013 IEEE. All rights reserved. IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) I

48、MPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropria

49、te safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/discla

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