1、 IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V Sponsored by the Power Systems Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Industry Applications Society IEEE Std 166
2、8-2014 IEEE Std 1668-2014 IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V Sponsor Power Systems Engineering Committee of the IEEE Industry Applications Society Approved 21 August 2014 IEEE-SA Stan
3、dards Board Grateful Acknowledgment The following material from CIGRE Working Group C4.1 10 Final Report, Voltage Dip Immunity of Equipment and Installations, April 2010 is reprinted with permission: Table 7, adapted from Table 6-5 page 185 of CIGRE report Figure 19, adapted from 6-6 page 145 and Fi
4、g 6-35 page 160 of CIGRE report Table 8, adapted from Fig 2-17 page 40, and from Table 4.1 page IO1 of CIGRE report Table 9, from un-numbered table on page 35 of CIGRE report Figure 20 adapted from Table 4.2, Page 102 of CIGRE report Figure 21 adapted from Table 4.1 on page 101 of CIGRE report and T
5、able 4.2 and Table 4.3 on page 104 of CIGRE report Table A.1 adapted from Table 4.1 on page 101 of CIGRE report and Table 4.2 and Table 4.3 on page 104 of CIGRE report Abstract: A trial-use, non-industry-specific recommended practice for voltage sag and short interruption ride-through performance an
6、d compliance testing for all electrical and electronic equipment connected to low-voltage power systems that can experience malfunction or shutdown as a result of reductions in supply voltage lasting less than one minute is detailed in this document. Testing procedures and requirements for test equi
7、pment are clearly defined within this document to reflect this electrical environment, including single-phase, two-phase, and three-phase balanced and unbalanced voltage sags. Requirements for certification and test reporting, including characterization of voltage-sag ride-through equipment are also
8、 defined. Keywords: equipment testing, IEEE 1668, immunity, power quality, ride-through, voltage dip, voltage sag, voltage-sag characteristics The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Ele
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39、-SA Standards Board, 445 Hoes Lane, Piscataway, NJ 08855. It is expected that following the 24-month period, this trial-use standard, revised as necessary, shall be submitted to the IEEE-SA Standards Board for approval as a full-use standard. Copyright 2014 IEEE. All rights reserved. viParticipants
40、At the time this IEEE trial-use recommended practice was completed, the Voltage Sag Ride-through Working Group had the following membership: Doug Dorr, Chair Scott Anderson, Vice Chair Yves Allard William Brumsickle Math Bollen Jack Caufield John Coffman Sasa Djokic Brian Fortenbery Robert Gettier G
41、ary Malhoit Brad Martin John Mentzer Mark Minzlaff Melinda Norris Gregory Olson Greg Rieder James Rossman Mark Rucker Salman Sabbah Mark Stephens Rick Temple Chuck Thomas John-Carl Zarella The following members of the individual balloting committee voted on this trial-use recommended practice. Ballo
42、ters may have voted for approval, disapproval, or abstention. William Ackerman Emmanuel Agamloh Ali Al Awazi Mihaela Albu Steven Alexanderson Saleman Alibhay Gabriele F. D. Alleva Curtis Ashton George Ballassi G. Bartok Steven Bezner Thomas Bishop William Bloethe Math Bollen Kenneth Bow William Brum
43、sickle Gustavo Brunello William Bush Paul Cardinal Keith Chow Stephen Conrad Jerry Corkran Luis Coronado Randall Cunico Chuanyou Dai James Daley Glenn Davis Sasa Djokic Dieter Dohnal Gary Donner Doug Dorr Neal Dowling Gearold O. H. Eidhin Ahmed El Serafi Alexander Emanuel Dan Evans Keith Flowers Ros
44、tyslaw Fostiak Carl Fredericks Frank Gerleve Robert Gettier Mietek Glinkowski Jalal Gohari Stephen Grier J. Travis Griffith Randall Groves Thomas Gruzs Ajit Gwal Paul Hamer Jerry Harness Richard Harp Charles Henville Gary Heuston Werner Hoelzl Soonwook Hong Philip Hopkinson Ronald Jarrett Charles Je
45、nsen Andrew Jones Laszlo Kadar Yuri Khersonsky Jim Kulchisky Saumen Kundu Thomas Ladson Chung-Yiu Lam Thomas La Rose Ed Larsen Raluca Lascu Theo Laughner William Lockley Russell Lowe Bruce Mackie Gary Malhoit John McAlhaney, Jr. Walter McCannon Peter Megna James Michalec T. David Mills Sujeet Mishra
46、 Jerry Murphy R. Murphy Bruce Muschlitz Michael Newman Gregory Olson Lorraine Padden Bansi Patel Christopher Petrola Henry Pinto Ulrich Pohl Iulian Profir Michael Roberts Charles Rogers John Rossetti James Rossman Bob Saint Bartien Sayogo Robert Schuerger Kenneth Sedziol Michael Simon Veselin Skendz
47、ic Jerry Smith John Spare Mark Stephens Gary Stoedter Peter Sutherland James Swank Peter Tirinzoni Joe Uchiyama Eric Udren John Vergis Matthew Wakeham Daniel Ward Kenneth White Matthew Wilkowski Jian Yu When the IEEE-SA Standards Board approved this trial-use recommended practice on 21 August 2014,
48、it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David
49、 J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE-SA Content Publishing Lisa Perry IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 1668-2014, IEEE Trial-Use Recommended Practice for Voltage Sag and Short Inte
