1、 IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions Sponsored by the IEEE Standards Coordinating Committee 20 (SCC20) on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordination Committee 20 IEEE Std 1671.1-2017 (Revi
2、sion of IEEE Std 1671.12009) IEEE Std 1671.1-2017 (Revision of IEEE Std 1671.1-2009) IEEE Standard for Automatic Test Markup Language (ATML) Test Description Sponsor IEEE Standards Coordinating Committee 20 (SCC20) on Test and Diagnosis for Electronic Systems Approved 6 December 2017 IEEE-SA Standar
3、ds Board 2 Copyright 2018 IEEE. All rights reserved. Abstract: An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard. Keywords: ATE, ATML, ATS, ATM
4、L instance document, automatic test equipment, Automatic Test Markup Language, automatic test system, IEEE 1671.1, test program documentation, test requirements, unit under test, UUT, XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA C
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34、urther information may be obtained from the IEEE Standards Association. Copyright 2018 IEEE. All rights reserved. 6 Participants At the time this IEEE standard was completed, the 1671.1 Working Group had the following membership: Anand Jain, Chair Malcom Brown Chris Gorringe Teresa Lopes Ion Neag Le
35、slie Orlidge Hugh Pritchett Mike Seavey John Stabler Joseph Stanco Ronald TaylorThe following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. W. Larry Adams, Jr Malcom Brown Juan Carreon Chris Gorringe Randall G
36、roves Werner Hoelzl Bernard Homes Noriyuki Ikeuchi Anand Jain Teresa Lopes Mukund Modi Ion Neag Leslie Orlidge Mike Seavey Robert Spinner Joseph Stanco Michael Stora Walter Struppler Marcy Stutzman Ronald Taylor Louis Ungar John Vergis Oren Yuen Daidi Zhong When the IEEE-SA Standards Board approved
37、this standard on 6 December 2017, it had the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Ted Burse Stephen Dukes Doug Edwards J. Travis Griffith Michael Janezic Thomas Koshy Jos
38、eph L. Koepfinger* Kevin Lu Daleep Mohla Damir Novosel Ronald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Adrian Stephens Mehmet Ulema Phil Wennblom Howard Wolfman Yu Yuan *Member Emeritus Copyright 2018 IEEE. All rights reserved. 7 Introduction This introduction is not part of IEEE S
39、td 1671.1-2017, IEEE Standard for Automatic Test Markup Language (ATML) Test Description. This child, or “dot,” standard, also known as an ATML component standard, provides for the definition of the test description schemas, and contains references to XML instance document examples; both of which ac
40、company this standard. The XML schemas defined by this standard provide for the representation of test description information. Where appropriate, the XML schemas utilize and reference components of the Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Informatio
41、n via XML Standard (IEEE Std 1671) schema set. ATMLs XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and provide several meth
42、ods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment. Copyright 2018 IEEE. All rights reserved. 8 Contents 1. Overview 10 1.1 Scope . 10 1.2 Application 10 1.3 C
43、onventions used within this document 11 2. Normative references 13 3. Definitions, acronyms, and abbreviations 13 3.1 Definitions . 13 3.2 Acronyms and abbreviations . 14 4. Test Description schema . 16 4.1 Applicability 16 4.2 Root element 16 4.3 Security classification 17 4.4 Describing the UUT .
44、17 5. Describing test program structure . 20 5.1 Tests . 20 5.2 Test groups 29 5.3 Using identifiers and identifier references . 31 6. Describing control flow 31 6.1 Entry points . 32 6.2 Test sequencing . 32 6.3 Initialization and termination . 35 6.4 Conditions 36 6.5 Test group calls 38 7. Descri
45、bing data . 41 7.1 Overview of data items 41 7.2 Overview of data flows 43 7.3 Describing data items 47 7.4 Describing data flows 50 8. Describing test behavior . 58 8.1 Free-form description 59 8.2 Test group call . 59 8.3 Operations 60 9. Describing fault isolation . 73 9.1 UUT faults and failures
46、 . 73 9.2 Fault trees 75 9.3 Fault dictionaries . 75 10. ATML Test Description XML schema names and locations . 76 11. ATML XML schema extensibility . 78 12. Conformance 79 Copyright 2018 IEEE. All rights reserved. 9 Annex A (normative) XML schemas . 80 A.1 TestDescription XML schema 80 Annex B (inf
47、ormative) TSF library examples .213 B.1 ParallelDigitalTSFLib.xsd .213 B.2 SerialDigitalTSFLib.xsd 218 Annex C (informative) Describing digital testing .222 C.1 Describing digital tests .222 C.2 Describing parallel digital signals 222 C.3 Describing digital test operations .226 C.4 Describing digita
48、l tests using DTIF .231 Annex D (informative) Describing serial digital bus exchanges .233 D.1 Describing UUT serial digital buses, protocols, and messages 233 D.2 Describing serial bus signals 233 D.3 Describing serial bus operations 237 D.4 Describing message scheduling and frames .247 Annex E (in
49、formative) IEEE download web-site material associated with this document .255 Annex F (informative) Users information and examples 257 F.1 Example circuit card assembly UUT 257 F.2 Example 1 .257 F.3 Example 2 .260 F.4 Example 3 .261 F.5 Example 4 .262 F.6 Example 5 .263 F.7 Example 6 .263 F.8 Example for parallel digital tests 264 F.9 Examples for RS-232 serial bus .265 F.10 Examples for ARINC 429 serial bus 266 F.11 Examples for MIL-STD-155B serial bus .267 Annex G (informative) Glossary .270 Annex H (informative) Bibliography 271 Copyright 2018 IEEE. All rights r
