1、 IEC 61671-4 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test configuration IEC61671-4:2016-04(en)IEEEStd 1671.4-2014 IEEE Std 1671.4 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEEE All rights reserved. IEEE is a registered trademark in t
2、he U.S. Patent 35.060 IEC ISBN 978-2-8322-3266-8IEEE ISBN 978-1-5044-0864-6STD20901 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.4 Registered trademark of the International Electrotechnical Commission Contents 1. Overview 1 1.1 General 1 1.2 App
3、lication of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. TestConfiguration schema 7 4.1 Background 7 4.2 Test conf
4、iguration.xsd . 7 5. TestConfiguration instance schema .32 6. ATML TestConfiguration XML schema names and locations 32 7. ATML XML schema extensibility 34 8. Conformance .34 Annex A (informative) IEEE download web-site material associated with this document .35 Annex B (informative) Test Configurati
5、on XML element mappings to MTPSI card fields .36 Annex C (informative) Examples 41 Annex D (informative) Bibliography 44 Annex ( (informative) /LVWRI,(3DUWLFLSDQWV .4IEC 61671-4:2016 IEEE Std 1671.4-2014 - ii -IEC 61671-4:2016 IEEE Std 1671.4-2014 Published by IEC under license from IEEE. 2014 IEEE.
6、 All rights reserved. STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) INSTRUMENT DESCRIPTION FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of
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24、lished by IEC under license from IEEE. 2014 IEEE. All rights reserved. International Standard IEC 61671-4/IEEE Std 1671.4-2014 has been processed through IEC technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the fol
25、lowing documents: IEEE Std FDIS Report on voting IEEE Std 1671.4-2014 91/1315/FDIS 91/1339/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided tha
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27、 -IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 27 March 2014 IEEE-SA Standards Board IEC 61671-4:2016 IEEE Std 1671.4-2014- v -Abstract: An exchange format is specifie
28、d in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS). Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML
29、), automatic test system (ATS), IEEE 1671.4, Master Configuration Control Document (MCCD), Master Test Program Set Index (MTPSI), station configuration file, test configuration, XML schema xOpenVMS is a registered trademark of Hewlett-Packard Development Company, L.P. UNIX is a registered trademark
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31、tics (ERCIM), and Keio University, Japan. Windows is a registered trademark of Microsoft Corporation. IEC 61671-4:2016 IEEE Std 1671.4-2014 - vi -I(,ntroduction This introduction is not part of IEEE Std 1671.4-2014, IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration. This chi
32、ld, or “dot” standard, also known as an automatic test markup language (ATML) component standard, provides for the definition of the TestConfiguration XML schema and contains references to an example. The XML schema and example that accompany this standard provide for the identification of all of th
33、e hardware, software, and documentation that is required to test and diagnose a unit under test (UUT) on an automatic test system (ATS). ATMLs XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a
34、class hierarchy corresponding to these basic information entities and providing several methods within each to enable basic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment. IEC 61671-4:201
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