IEEE 1856-2017 en Framework for Prognostics and Health Management of Electronic Systems.pdf

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1、IEEE Standard Framework for Prognostics and Health Management of Electronic Systems IEEE Std 1856-2017 IEEE Reliability Society Sponsored by the Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std 1856-2017 IEEE Standard Framework for Prognostics and Health Management of Elect

2、ronic Systems Sponsor Standards Committee of the IEEE Reliability Society Approved 7 September 2017 IEEE-SA Standards BoardAbstract: Information for the implementation of prognostics and health management (PHM) for electronic systems is described in this standard. A normative framework for classifyi

3、ng PHM capability and for planning the development of PHM for an electronic system or product is also described in this standard. Manufacturers and end users can use this standard for planning the appropriate prognostics and health management techniques to implement and the associated life cycle ope

4、rations for the system of interest. Keywords: classi cation of electronics, electronic systems, health management, IEEE 1856, implementation in electronics, PHM de nitions, PHM functional model, PHM Metrics, PHM operational model, prognostics The Institute of Electrical and Electronics Engineers, In

5、c. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 December 2017. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; n

6、on-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly volunt

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27、n of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Xplore at http:/ ieeexplore .ieee .or g/ or contact IEEE at the address listed previously. For more

28、information about the IEEE-SA or IEEEs standards development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. User

29、s are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence

30、or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE- SA Website at http:/ standards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters o

31、f Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Es

32、sential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any lice

33、nsing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement o

34、f such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2017 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Prognostics and Health Management of Electronic Systems Working Grou

35、p had the following membership: Michael Pecht, Chair Sony Mathew, Vice Chair Louis J. Gullo, Sponsor Chair N. Jordan Jameson, Secretary Arvind Sai Sarasi Vasan, Associate Secretary Vivek Agarwal Hans-Jrgen Albrecht Allegra Alessi Michael Azarian Chris Bailey Eric R. Bechhoefer Randy Bickford Gautam

36、Biswas Yizhak Bot Michael Boyd Jos R. Celaya Ian Chan Joseph Childs Tommy Chow Jaesik Chung Kuan-Jung (Kenny) Chung Steve Clay Jamie Coble Eduardo Cota Sreerupa Das Darryl N. Davis Luiz Gonzaga de Souza Ribeiro Pierre Dersin Nishkamraj Deshpande Walter Fenk Lorraine M. Fesq Nick Frankle Peter Ghavam

37、i Kirk Gray Ed Habtour Qian Han Herbert Hect V esa Hekkala Luis Hernandez Andrew Hess Wesley Hines Dennis Hoffman Stephen B. Johnson Suk Joo Bae Kwang Jung David A. Karpuszka Zoubir Khatir Chetan Kulkarni Manoj Kumar Ranjith Kumar Pradeep Lall Jack Lam Benjamin Lamoureux Jean-Baptiste Leger Anatoli

38、Lisnianski Jie Liu Zheng Liu Huitian Lu Tom Martin Jean-Remi Masse Leopoldo M. Mayoral Paulo Mendes Andreas Middendorf Chandru Mirchandani Nilimb Misal Subrat Nanda Kurt N. Ochsie Krishna Patapati Prakash Patnaik Suresh Perinpanayagam Cheng Qi Dev Raheja Pradeep Ramuhalli Mike Roellig Richard Rusaw

39、Rex Sallade Peter Sandborn Abhinav Saxena Fred Schenkelberg Michael Schumacher Brian Seal Peck Seng Chua Hongbin Shi Shubhangi Shrikhande Michael Sievers Jane Smith Ben Sykes Chuck Thomas Jason Thomas V anam Upendranath P .V . V arde Jin Wang Pingfeng Wang Daniel J Weyer Juergen Wilde Andrew Wileman

40、 Timothy J. Wilmering Weizhong Y an David Y ellamati Sun Y ongquan The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Robert Aiello Johann Amsenga Charles Barest Vizhak Bot Bill Brown Susan Burgess Juan Carreon Joseph Childs Keith Chow Mark Davis Nicolas Degrenne Richard Doyle David Droste Donald Dunn Sourav Dutta Fredric Friend David Fuschi Allan Gillard Eric W . Gray Randall Groves Louis J. Gullo Werner Hoelzl Peng Hu Noriyuki Ikeuchi Atsushi Ito Kenneth Karg Piotr Karocki

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