1、Recognized as anAmerican National Standard (ANSI) Copyright 1989 byThe Institute of Electrical and Electronics Engineers, Inc345 East 47th Street, New York, NY 10017, USANo part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior writt
2、en permission of the publisherIEEE Std 301-1988(R2006)(Revision of IEEE Std 301-1976)IEEE Standard Test Procedures forAmplifers and Preamplifers used withDetectors of Ionizing RadiationSponsorNuclear Instruments and Detectors Committeeof theIEEE Nuclear and Plasma Sciences SocietyReaffirmed March 30
3、, 2006Approved October 20, 1988IEEE Standards BoardApproved June 21, 1989American National Standards InstituteIEEE Standardsdocuments are developed within the Technical Committees of the IEEE Societies and the StandardsCoordinating Committees of the IEEE Standards Board. Members of the committees se
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6、ewpoint expressed at the time a standard is approved and issued is subject to changebrought about through developments in the state of the art and comments received from users of the standard. EveryIEEE Standard is subjected to review at least every ve years for revision or reafrmation. When a docum
7、ent is morethan ve years old, and has not been reafrmed, it is reasonable to conclude that its contents, although still of somevalue, do not wholly reect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE Standard.Comments for revisio
8、n of IEEE Standards are welcome from any interested party, regardless of membership afliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments.Interpretations: Occasionally questions may arise regarding th
9、e meaning of portions of standards as they relate tospecic applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it isimportant to
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11、sideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board345 East 47th StreetNew York, NY 10017USAIEEE Standards documents are adopted by the Institute of Electrical and Electronics Engineers without regard towhether their adoption may i
12、nvolve patents on articles, materials, or processes. Such adoption does not assumeany liability to any patent owner, nor does it assume any obligation whatever to parties adopting the standardsdocuments.iiiForeword(This Foreword is not a part of IEEE Std 301-1988, IEEE Standard Test Procedures for A
13、mpliers and Preampliers used withDetectors of Ionizing Radiation.)This standard describes test procedures for ampliers and preampliers that are used with semiconductor, scintillation,and proportional detectors in the spectrometry of ionizing radiation. It supersedes ANSI/IEEE Std 301-1976, IEEEStand
14、ard Test Procedures for Ampliers and Preampliers for Semiconductor Radiation Detectors for IonizingRadiation. The title was changed because the same ampliers used for semiconductor detectors are applicable to othertypes.Amplier technology has progressed to the point where the spectrometer performanc
15、e may be limited as much by themultichannel analyzer (MCA) as by the amplier. Because of this and because of the impracticality of standardizingon one MCA with so many on the market, MCAs, with minor exceptions, are not a part of the measurement procedurein this publication.In this standard, measuri
16、ng procedures are given in greater detail than in the earlier publication because with modernampliers, perceived performance often depends on the details of measurement. Thus, many of the details of theprocedures must be standardized as well as the amplier specications.Tests that are specic to ampli
17、ers with time-variant pulse-shaping lters are not included in this standard, nor are testsfor pile-up rejectors. Time-variant lters allow shorter pulse-shaping times than linear lters for the same signal-to-noise ratio (snr), and pile-up rejectors, as the name implies, block pulses that overlap earl
18、ier ones, allowing highercount rates for a given spectral-line resolution. Both techniques have the greatest application at the energy extremes:at very low energies because wide pulses must be used to optimize the snr, and at high energies where detector artifactscause low-side tailing of spectrum l
19、ines. The tailing obscures low-intensity lines falling just below higher energy lines,and pile-up causes phantom peaks to appear at energy multiples of the spectrum lines.In this standard, t0.5or t1/2(the pulse width at 50% of peak amplitude) is the main-amplier indicator of shaping timebecause this
20、 parameter best enables a performance comparison among different ampliers. Also, compared with otherparameters, this one is the easiest to measure accurately with an oscilloscope and pulse generator.Companions to this document are ANSI/IEEE Std 300-1988 1,1ANSI/IEEE Std 325-1986 2, and IEEE Std 194-
21、1977 3.At the time it approved this standard, the Nuclear Instruments and Detectors Committee of the IEEE Nuclear andPlasma Sciences Society had the following membership:Sanford Wagner, Chair Louis Costrell, Secretary Muzaffer AtacJ. G. BellianJ. A. ColemanD. C. CookJ. F. DetkoEdward Fairstein*F. S.
22、 GouldingR. M. KeyserF. A. KirstenH. W. KranerG. L. MillerD. E. PersykP. L. PhelpsD. E. StilwellK. L. SwinthF. J. Walter*Served as project leader for the development of this standard.1The numbers in brackets correspond to those of the references listed in 1.5.ivAt the time it approved this standard,
23、 the Accredited Standards Committee N42 on Radiation Instrumentation had thefollowing members:Louis Costrell, Chair Fred Huber,Admin SecretaryAmerican Conference of Governmental Industrial HygienistsJesse LiebermanHealth Physics Society. J. B. Horner KuperJ. M. Selby (Alt)Institute of Electrical and
24、 Electronics Engineers .Louis CostrellD. C. Cook (Alt)A. J. Spurgin (Alt)J. Forster (Alt)Lawrence Berkeley Laboratory L. J. WagnerNuclear Suppliers Association K. F. SinclairOak Ridge National LaboratoryH. R. BrashearUCLA Center for the Health SciencesJ. E. McLaughlinUS Nuclear Regulatory Commission
25、. E. C. WenzingerUS Department of Energy. Gerald GoldsteinUS Department of the Army, Materiel Command . Edward GroeberUS Department of the Army, Ofce of Civil Defense Mobilization Earl R. Siebentritt, JrUS Department of Commerce, National Bureau of Standards Louis CostrellMembers-at-Large.J. G. Bell
26、ianDavid C. CookJohn M. Gallagher, JrD. A. MackE. J. VallarioThe following persons were on the balloting committee that approved this document for submission to the IEEEStandards Board:A. AtacJ. G. BellianJ. A. ColemanD. C. CookL. CostrellJ. DetkoE. FairsteinF. S. GouldingR. KeyserF. A. KirstenH. W.
27、 KranerG. L. MillerD. E. PersykP. L. PhelpsD. E. StilwellK. L. SwinthS. WagnerF. J. WalterWhen the IEEE Standards Board approved this standard on October 20, 1988, it had the following membership:Donald C. Fleckenstein, Chair Marco Migliaro, Vice Chair Andrew G. Salem, Secretary Arthur A. BlaisdellF
28、letcher J. BuckleyJames M. DalyStephen R. DillonEugene P. FogartyJay Forster*Thomas L. HannahKenneth D. HendrixTheodore W. Hissey, JrJohn W. HorchJack M. KinnFrank D. KirschnerFrank C. KitzantidesJoseph L. Koepfinger *Irving KolodnyEdward LohseJohn E. May, JrLawrence V. McCallL. Bruce McClungDonald
29、T. Michael*Richard E. MosherL. John RankineGary S. RobinsonFrank L. RoseHelen M. WoodKarl H. ZainingerDonald W. Zipse*Member EmeritusvCLAUSE PAGE1. General 11.1 Scope and Object . 11.2 Specialized Definitions 21.3 Symbols and Abbreviations . 61.4 Constants and Conversion Factors. 71.5 References 72.
30、 Spectrometer .82.1 Detectors 82.2 Preamplifier 92.3 Main Amplifier (Shaping Amplifier). 102.4 Biased Amplifier 112.5 Multichannel Analyzer. 113. Test Instruments113.1 Test Setup. 113.2 Pulse Generators 123.3 Step Attenuator 133.4 Capacitor Box 143.5 Shaping Amplifier 143.6 AC Voltmeter. 143.7 Oscil
31、loscope . 143.8 Nonlinearity Bridge 143.9 Oscilloscope/Generator Calibration. 154. Main-Amplifier Measurements and Specifications .164.1 Pulse-Shape Parameters . 164.2 Pulse Width 174.3 Overload Recovery 184.4 Gain-Control Calibration and Main-Amplifier Gain . 194.5 Noise, Main Amplifiers 204.6 Nois
32、e Transition Gain 214.7 Pole/Zero Range. 214.8 Nonlinearity . 214.9 Source Resistance 224.10 Temperature Sensitivity . 244.11 Supply-Voltage Sensitivity 244.12 Crossover Walk 245. Preamplifier Measurements 255.1 Measurement of Charge Sensitivity. 255.2 Size of the Internal Test Capacitor. 265.3 Rise
33、 Time vs Capacitance 265.4 Noise, Preamplifiers. 265.5 Preamplifier Nonlinearity 285.6 Energy Count-Rate Product (ECRP) 29viCLAUSE PAGE6. Biased Amplifier Measurements.326.1 Nonlinearity, Biased Amplifier 327. BIBLIOGRAPHY.34Annex A (Informative)34Copyright 1989 IEEE All Rights Reserved1IEEE Standar
34、d Test Procedures for Ampliers and Preampliers used with Detectors of Ionizing Radiation1. General1.1 Scope and ObjectThese test procedures cover amplier and preamplier systems with linear pulse-shaping networks for use withsemiconductor, scintillation, and proportional detectors in the spectroscopy
35、 of ionizing radiation. The object is toprovide a common language and methodology for users and manufacturers of pulse-amplier systems.This standard supersedes IEEE Std 301-1976, IEEE Standard Test Procedures for Ampliers and Preampliers forSemiconductor Radiation Detectors for Ionizing Radiation. T
36、est procedures for associated detectors are described inANSI/IEEE Std 300-1988 1 and ANSI/IEEE Std 325-1986 2. IEEE Std 194-1977 3 is a companion document forpulse-shape terminology.Not all of the tests described herein are mandatory, but those that are performed to determine preamplier andamplier s
37、pecications shall conform to this standard.The emphasis on the methods of measurement is to enhance sensitivity and improve accuracy by working around thelimitations of the test instruments, particularly oscilloscopes that have only a visual display for readout. A nulltechnique is used where possibl
38、e, thereby reducing basic errors to the inaccuracy of a pair of precision resistors. Whenuse of a bridge is inappropriate, such as in measurements of pulse height with an oscilloscope, the pulse is made tooccupy a xed amplitude and vertical position on the face of the cathode-ray tube (CRT). Some me
39、asurements requiretest instruments or xtures not commercially available at this writing; circuit diagrams for their construction are givenin the Appendix. It is not acceptable to make use of a standard nuclear instrument module to test the performance ofan amplier unless the errors introduced by tha
40、t module can be corrected for or shown to be less than the error causedby the amplier. Examples are the use of a crossover-pickoff module to measure crossover walk in a bipolar amplier,and an MCA to measure nonlinearity and noise.2Copyright 1989 IEEE All Rights ReservedIEEE Std 301-1988 IEEE STANDAR
41、D TEST PROCEDURES FOR AMPLIFIERS AND1.2 Specialized DefinitionsDenitions followed with the reference IEEE Std 194-1977 3 include terms dened in that standard. The followingdenitions should be understood throughout the document:back porch:At the end of a shaped pulse, a region where the tail may stop
42、 several percent short of the baseline, thendecay to it slowly.back termination, back-terminating resistor:A resistor joining the output stage of an amplier or signal generatorto its output connector.bandwidth (of a voltmeter):The band of frequencies over which the ac voltmeter indication is constan
43、t within 0.25dB, rolling off 3 dB at the ends. The bandwidth is dened as the difference between the high and low frequencies atwhich the -3 dB points occur.ballistic decit:In an amplier, the loss in pulse height that occurs when the rise time of the input signal is notnegligible compared with the wi
44、dth of the shaped amplier pulse.baseline:The average of the levels from which a pulse departs and to which it returns in the absence of a followingoverlapping pulse (see IEEE Std 194-1977 3).baseline shift:A phenomenon in which the baseline changes as the duty cycle increases from zero. (Usually, th
45、e shiftis opposite in polarity to that of the signal.)baseline restorer:A circuit that rapidly restores the baseline following an ampliers output pulse (or series of pulses)to the level existing prior to it.bias:(1) In a biased amplier, the applied threshold voltage (or current) below which the gain
46、 is zero. (2) In a detector,the electric eld that causes charge to be collected.biased amplier:An amplier giving zero output for input signals below an adjustable threshold and having aconstant gain above that threshold up to a specied maximum output.bias resistor (detector):The resistor through whi
47、ch the voltage providing the bias is applied to a detector. The biasresistor may also be the load resistor (see load resistor).bipolar pulse:A pulse having two lobes on opposite sides of the baseline. Such a pulse is obtained by including asecond differentiator in the unipolar pulse-shaping network
48、of an amplier.blocked:A situation in which amplier gain is reduced to zero for longer than a normal pulse width by a heavily-overloading signal.buck:Balancing two opposite-polarity signals against each other to produce a null.buffer:A circuit interposed between a signal source and its load to preven
49、t undesired interaction between the two.capacitance, cold input:The capacitance measured between the input terminals of a preamplier with all dc voltagesapplied but with the signal path inactivated.capacitance, detector:The small-signal capacitance measured between the terminals of a detector under speciedconditions of bias and frequency.capacitance, hot input:The capacitance measured between the input terminals of a working preamplier.Copyright 1989 IEEE All Rights Reserved3PREAMPLIFIERS USED WITH DE
