1、IEEE Std 400.1-2007(Revision ofIEEE Std 400-1991)IEEE Guide for Field Testing of Laminated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current VoltageIEEE3 Park Avenue New York, NY 10016-5997, USA21 September 2007IEEE Power Engineering SocietySponsored by theInsula
2、ted Conductors Committee400.1TMIEEE Std 400.1-2007 (Revision of IEEE Std 400-1991) IEEE Guide for Field Testing of Laminated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage Sponsor Insulated Conductors Committee of the IEEE Power Engineering Society App
3、roved 22 March 2007 IEEE-SA Standards Board Abstract: The recommended practices and procedures for direct voltage acceptance and maintenance testing of shielded, laminated dielectric insulated power cable systems rated 5 kV and above are presented in this guide. It applies to all types of laminated
4、power cable systems such as paper insulated, lead covered, pipe-type, and pressurized cables that are intended for the transmission or distribution of electric power. The tabulated test levels assume that the cable systems have an effectively grounded neutral system or a grounded metallic shield. Ke
5、ywords: cable, cable installation, cable maintenance, cable tests, field test procedures, high direct voltage tests, insulated cable, power cable systems, shielded power cable systems _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright
6、2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 21 September 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educationa
7、l classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE. All rights reserved. Introduction To say that there is a marked difference of opinion on the matter of cable testing would be a decided understatement. Many users, particularly utilities, while pract
8、icing acceptance testing, do not favor maintenance testing, or testing after cable systems have been in service, believing that such tests may shorten cable life. A few utility users, and many industrial users, favor both acceptance and maintenance testing, believing that such testing will contribut
9、e to improved service reliability. Others feel that either acceptance or maintenance testing can cause cable damage, resulting in premature failures and customer dissatisfaction. Annex C of this guide gives additional background and more detailed commentary on these attitudes and philosophies. There
10、 is undoubtedly much to be said both for and against all viewpoints; only the individual user can determine whether, how frequently, and at what stresses testing is to be conducted. In short, this guide does not suggest that cable system testing be done; it simply provides guidance for such testing,
11、 developed by those who have found it useful. Additionally, it provides interpretive information based on many years of experience. Finally, pervading the entire procedure, safety has been a constant consideration in each step of the recommended practices. It is hoped that use of this guide will inc
12、rease the fund of knowledge on the subject and result in more meaningful testing procedures and methods. Suggestions for improvements to this guide are welcome. They should be sent to the Secretary, IEEE-SA Standards Board, 445 Hoes Lane, Piscataway, NJ 08854, USA. Notice to users Errata Errata, if
13、any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.
14、ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in
15、connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. This introduction
16、is not part of IEEE Std 400.1-2007, IEEE Guide for Field Testing of Laminated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage. Participants At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Insulated Conductors Commit
17、tee C-17 Working Group had the following membership: William E. Larzelere, Jr., Chair Vern L. Buchholz, Secretary Torben Aabo John R. Densley Hans R. Gnerlich Martin von Herrmann Stanley V. Heyer Fred B. Koch Jerry L. Landers William M. McDermid James D. Medek Henning H. Oetjen Johannes G. Rickmann
18、Lawrence W. Salberg William A. Thue Joseph Zimnoch The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Torben Aabo S. K. Aggarwal Thomas M. Barnes Earle C. Bascom, III Wallace B. Binder, Jr. Steven R. Bro
19、ckschink Kent W. Brown Vern L. Buchholz James S. Case Mark S. Clark Michael D. Clodfelder John H. Cooper Tommy P. Cooper Jerry L. Corkran Jorge E. Fernandez Daher John R. Densley Ernest M. Duckworth, Jr. Gary R. Engmann R. B. Gear, Jr. Frank J. Gerleve Harry D. Gianakouros Randall C. Groves Adrienne
20、 M. Hendrickson Gary A. Heuston Lauri J. Hiivala Dennis Horwitz David W. Jackson A. S. Jones James H. Jones Lars E. Juhlin Gael Kennedy J. L. Koepfinger Jim Kulchisky William E. Larzelere, Jr. Solomon Lee Jody P. Levine Albert Livshitz William Lumpkins G. L. Luri Glenn J. Luzzi Keith N. Malmedal Wil
21、liam M. McDermid Mark F. McGranaghan Nigel P. McQuin John E. Merando, Jr. James R. Michalec Gary L. Michel Rachel I. Mosier Kyaw Myint Shantanu Nandi Michael S. Newman Charles Kamithi Ngethe Ralph E. Patterson Serge Pelissou Johannes G. Rickmann Michael A. Roberts Michael J. Smalley Nagu N. Srinivas
22、 James E. Timperley Martin J. von Herrmann Waldemar G. Von Miller Mark D. Walton Joe D. Watson Ernesto Jorge Wiedenbrug William D. Wilkens James W. Wilson, Jr. Donald W. Zipse Ahmed F. Zobaa v Copyright 2007 IEEE. All rights reserved. vi Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Sta
23、ndards Board approved this guide on 22 March 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don F. Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alexander D. Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Julian Forster* Kennet
24、h S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John D. Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolf
25、man *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Alan H. Cookson, NIST Representative Lorraine Patsco IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technica
26、l Program Development vii Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 1 3. General . 2 3.1 Environmental influences 2 3.2 Test equipment 3 4. Test procedure 4 4.1 Test precautions. 4 4.2 Safety practices 5 4.3 Testing procedure
27、 5 4.4 Recording of test results 8 5. Evaluation of results. 8 5.1 Current-time relationships . 8 5.2 Resistance values. 9 Annex A (informative) Reasons for testing 11 A.1 Acceptance tests 11 A.2 Maintenance tests 11 A.3 Corrective actions . 11 Annex B (informative) Protection against possible sever
28、e voltage conditions due to flashover 12 B.1 Possible surge voltage conditions . 12 B.2 Surge protection requirements 12 Annex C (informative) Discussion of differences of opinions regarding dc testing. 13 Annex D (informative) Bibliography . 14 1 Copyright 2007 IEEE. All rights reserved. IEEE Guide
29、 for Field Testing of Laminated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage 1. Overview This guide provides a description of the methods and practices to be used when field-testing laminated dielectric power cable systems. There is no requirement th
30、at any testing be performed either at the time of installation or periodically thereafter. However, it is well known that direct current (dc) testing of laminated dielectric shielded power cables has been performed for many years, especially for new installations or after repairs. If the user decide
31、s to have a direct voltage test made on the system, the following information is intended to provide a guide to the methodology, voltages, and concerns to be considered during the testing. 1.1 Scope This guide presents the recommended practices and procedures for direct voltage acceptance and mainte
32、nance testing of shielded, laminated dielectric insulated power cable systems rated 5 kV and above. It applies to all types of laminated power cable systems such as paper-insulated lead covered, pipe-type, and pressurized cables that are intended for the transmission or distribution of electric powe
33、r. The tabulated test levels assume that the cable systems have an effectively grounded neutral system or a grounded metallic shield. 1.2 Purpose The purpose of this guide is to provide uniform practices and procedures for performing direct voltage acceptance and maintenance tests on shielded, lamin
34、ated power cable systems in the field and to provide guidelines for evaluation of the test results. 2. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the lat
35、est edition of the referenced document (including any amendments or corrigenda) applies. IEEE Std 400.1-2007 IEEE Guide for Field Testing of Laminated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage 2 Copyright 2007 IEEE. All rights reserved. Accredited
36、 Standards Committee C2, National Electrical Safety Code(NESC).1IEEE Std 4, IEEE Standard Techniques for High-Voltage Testing.2, 3IEEE Std 510-1983 (Withdrawn), IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing.43. General 3.1 Environmental influences 3.1.1 Temperature The
37、 dielectric strength of some cable insulations is reduced at elevated temperatures. This necessitates a reduction in the test voltages at higher temperatures. Temperature gradients in the cable insulation, caused by heat dissipation from the conductor, can result in abnormal voltage distribution upo
38、n application of a high direct voltage. For these reasons, high direct voltage tests should be made with the cable at ambient temperature if possible. 3.1.2 Atmospheric conditions High humidity and conditions favoring condensation on exposed surfaces can affect test results to a marked degree. Conta
39、mination of termination surfaces can greatly increase conduction or leakage current and reduce flashover levels. Relative air density affects the measurement of a test voltage by use of rod gaps and may also affect the flashover voltage of cable terminations. At elevations higher than 1000 m (3280 f
40、t), additional insulation and clearance may be required to withstand both working voltages and the prescribed test voltages. If excessive corona or air discharges exist during a test, a reduced test voltage may result and high leakage current readings will be present. This factor can be compounded b
41、y high wind conditions. 3.1.3 Extraneous electric fields Although field tests on cable are often made in the vicinity of energized equipment, extraneous electrical fields usually will have little influence on direct voltage test results as long as the voltage measurement circuit is well shielded. A
42、simple test to see the influence can be made by ungrounding the test system prior to energization and observing any indications on the test system instrumentation on the lowest metering range. It is always important to maintain adequate clearances for the dc test voltages anticipated also taking int
43、o consideration the recommended clearance for the energized adjacent circuits. CAUTION Care should always be taken to avoid sharp connections on the high-voltage circuit to maintain a low electric field value. 1The NESC is available from the Institute of Electrical and Electronics Engineers, 445 Hoe
44、s Lane, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/). 2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 3The IEEE standards or products referred to in this clause are tradem
45、arks of the Institute of Electrical and Electronics Engineers, Inc. 4IEEE Std 510-1983 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Englewood, CO 80112-5704, USA, tel. (303) 792-2181 (http:/ IEEE Std 400.1-2007 IEEE Guide for Field Testing of La
46、minated Dielectric, Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage 3 Copyright 2007 IEEE. All rights reserved. 3.2 Test equipment 3.2.1 High direct voltage test equipment The test voltage source should: Provide the maximum (usually negative polarity) test voltage
47、required plus some margin. Provide a means of increasing voltage continuously or in small steps. Have a current capability sufficient to charge the test object in a reasonable time. Maintain a ripple factor as defined in IEEE Std 45of less than 3%. Normally the capacitance of the test object reduces
48、 the ripple voltage of the dc source to low levels. Provide a sufficiently powerful source to maintain voltage drops during transient current pulses to a value of less than 10%. Care should always be taken to avoid strong corona discharges from high-voltage connections that cause transient current p
49、ulses. Provide voltage and current instrumentation that meet the requirements of IEEE Std 4. Ammeters used to measure leakage current should have a low range that can resolve currents of 10 A to 100 A. An ammeter of sufficient range and scale should be provided to measure the leakage current accurately. Often, ammeters are provided with guard circuits to isolate the measurement of the current through the test object from stray leakage current. 3.2.2 Power supply A well-stabilized power supply for the high direc
