1、 IEEE Guide for Field Testing of Shielded Power Cable Systems Rated 5 kV and Above with Damped Alternating Current (DAC) Voltage Sponsored by the Insulated Conductors Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 400.4-2015 IEEE Std 400.4-2015 IEEE G
2、uide for Field Testing of Shielded Power Cable Systems Rated 5 kV and Above with Damped Alternating Current (DAC) Voltage Sponsor Insulated Conductors Committee of the IEEE Power and Energy Society Approved 30 October 2015 IEEE-SA Standards Board Abstract: The application of Damped ac (DAC) for fiel
3、d testing of power cables is described. DAC voltage withstand testing and diagnostic tests and measurements that are performed in combination with DAC voltage application in the field on shielded power cable systems are discussed. Whenever possible, cable systems are treated in a similar manner to i
4、ndividual cables. Tables and figures are included to show the effectiveness of the DAC ac voltage test, the diagnostic evaluation and the user experiences in the past years for field testing of different medium and (extra) high voltage cable system. Keywords: after-laying testing, asset management,
5、cable fault locating, cable system testing, cable testing, condition assessment, condition monitoring, damped ac voltage testing, diagnostic testing, dielectric losses, electric breakdown, grounding, high-voltage testing, IEEE 400.4, nondestructive testing, oil-filled cables, partial discharge measu
6、rement, power cable insulation, safety, tangent delta testing. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 29 January 2016. Printed
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35、ights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Participants At the time this guide was completed, the F05 Working Group had the following membership: Edward Gulski, Chair Ralph Patte
36、rson, Vice Chair Manfred J. Bawart Alain Bolliger Wim Boone Jacques Cote John Densley Frank de Vries Jean-Franois Drapeau Mark Fenger Craig Goodwin Chris Grodzinski Wolfgang Hauschild William Larzelere Eberhard Lemke Rafael Minassian Hennig Oetjen Frank Petzold Benjamin Quak The following members of
37、 the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Saleman Alibhay Thomas Barnes Earle Bascom III Martin Baur William Bloethe Alain Bolliger Kenneth Bow Andrew Brown Kent Brown Vern Buchholz Kurt Clemente Peter Coors Glenn Davi
38、s John Densley Frank de Vries Frank Di Guglielmo Dieter Dohnal Gary Donner Frank Gerleve David Gilmer Craig Goodwin Steven Graham Randall Groves Edward Gulski Ajit Gwal Richard Harp Wolfgang Hauschild Jeffrey Helzer Lee Herron Lauri Hiivala Werner Hoelzl Rene Hummel A. Jones Rogier Jongen Boris Koga
39、n Richard Kolich Robert Konnik Axel Kraemer Alexander Kraetge Jim Kulchisky Chung-Yiu Lam William Larzelere Michael Lauxman William Lockley Arturo Maldonado John Mcalhaney Jr William McDermid Tom Melle John Merando Rafael Minassian Jerry Murphy Arthur Neubauer Michael Newman Charles Ngethe Joe Nims
40、Lorraine Padden Christopher Petrola Benjamin Quak Robert Resuali Johannes Rickmann Michael Roberts Bartien Sayogo Paul Seitz Michael Smalley Jerry Smith David Tepen Nijam Uddin Roger Verdolin John Vergis Martin Von Herrmann Yingli Wen Kenneth White Dawn Zhao Tiebin Zhao J. Zimnoch vi Copyright 2016
41、IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 30 October 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-P
42、hilippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Phillip Winston Don Wright Yu Yuan Daidi Zhong *Member Emerit
43、us vii Copyright 2016 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 400.4-2015, IEEE Guide for Field Testing of Shielded Power Cable Systems Rated 5 kV and Above with Damped Alternating Current (DAC) Voltage. This guide provides an overview of an available method
44、for performing electrical tests in the field on shielded power cable systems using damped alternating current (DAC) voltages. It is intended to help the reader select a test that is appropriate for a specific situation of interest. It provides a brief description of the use of DAC voltage sources to
45、 perform field tests with a short discussion of specific tests. The material presented is descriptive and tutorial. Based on the current state of the art using this testing method, the guide addresses the evaluation of test results, the specification of test voltage levels and time of application. I
46、f applicable, additional details are provided in the omnibus standard, IEEE Std 4001, IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above, or in “point” documents, such as IEEE 400.1, IEEE Guide for Field Testing of Laminated Dielectric,
47、 Shielded Power Cable Systems Rated 5 kV and Above with High Direct Current Voltage; IEEE 400.2, IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF); and IEEE 400.3, IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Environmen
48、t. 1Information on references can be found in Clause 2. viii Copyright 2016 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Background 1 1.2 Scope . 2 1.3 Purpose 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 3 3.1 Definitions . 3 3.2 Acronyms and abbreviations . 5 4.
49、 Safety awareness 6 5. DAC testing 8 5.1 General 8 5.2 Types of DAC testing .10 6. DAC test circuit and parameters 12 6.1 Overview 12 6.2 DAC test voltage circuit .13 6.3 DAC parameters .14 7. DAC voltage withstand testing 15 7.1 General .15 7.2 DAC test parameters and procedures 17 7.3 DAC evaluation criteria 18 8. PD measurement using DAC .18 8.1 General .18 8.2 PD characteristics .20 8.3 PD Evaluation criteria.20 9. DF (tan ) estimation using DAC 20 9.1 General .20 9.2 DF Parameters 22 9.3 DF Evaluation Criteria 22 10. Conclusions .24 Annex A (informative) DAC test v
