1、g44g40g40g40g3g54g87g71g3g25g26g20g140g16g20g28g27g24g18g38g82g85g3g20g16g21g19g20g19g3g11g38g82g85g85g76g74g72g81g71g88g80g3g87g82g44g40g40g40g3g54g87g71g3g25g26g20g16g20g28g27g24g12g44g40g40g40g3g54g87g68g81g71g68g85g71g3g54g83g72g70g76g191g70g68g87g76g82g81g3g41g82g85g80g68g87g42g88g76g71g72g3g68
2、g81g71g3g55g72g86g87g3g51g85g82g70g72g71g88g85g72g3g73g82g85g49g82g81g74g92g85g82g86g70g82g83g76g70g3g44g81g72g85g87g76g68g79g3g36g81g74g88g79g68g85g3g54g72g81g86g82g85g86g29g45g72g85g78g15g3g36g70g70g72g79g72g85g68g87g76g82g81g15g3g57g72g79g82g70g76g87g92g15g3g68g81g71g39g76g86g83g79g68g70g72g80g72
3、g81g87g38g82g85g85g76g74g72g81g71g88g80g3g20g29g3g23g17g26g17g21g17g25g3g54g75g82g85g87g16g55g72g85g80g3g54g87g68g69g76g79g76g87g92g68g81g71g3g36g81g81g72g91g3g36g3g54g72g81g86g82g85g3g39g92g81g68g80g76g70g3g37g79g82g70g78g39g76g68g74g85g68g80g86g44g40g40g40g3g36g72g85g82g86g83g68g70g72g3andg40g79g7
4、2g70g87g85g82g81g76g70g3g54g92g86g87g72g80g86g3g54g82g70g76g72g87g92g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g42g92g85g82g3g68g81g71g3g36g70g70g72g79g72g85g82g80g72g87g72g85g3g51g68g81g72g79g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16
5、g24g28g28g26g15g3g56g54g36g3g3g20g19g3g36g88g74g88g86g87g3g21g19g20g19g25g26g20g55g48g16g20g28g27g24g18g38g82g85g3g20g16g21g19g20g19IEEE Std 671-1985/Cor 1-2010 Corrigendum to IEEE Std 671-1985 (Reaff 2008) IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angula
6、r Sensors: Jerk, Acceleration, Velocity, and Displacement Corrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Block Diagrams Sponsor Gyro and Accelerometer Panel of the IEEE Aerospace and Electronic Systems Society Approved 17 June 2010 IEEE-SA Standards Board Abstract: IEEE Std 6
7、71-1985 provides specifications and test requirements for a non-gyroscopic inertial angular sensor that may measure angular jerk, acceleration, rate, or displacement with or without response down to zero frequency. A standard specification format is provided. A compilation of recommended test proced
8、ures, derived from those presently used in the industry, is also provided. Informative annexes cover design features and theoretical principles of operation. This corrigendum makes changes to 4.7.2.6 to delete a sentence that does not belong there, to add a subclause that was inadvertently left out,
9、 and to renumber the existing subclauses. Changes are also being made to fix the block diagrams in Annex A, to correct a misspelling of inertia, and to add a missing symbol. Keywords: angular acceleration, angular displacement, angular jerk, angular rate, gyro, gyroscope, inertial instrument, inerti
10、al sensor, non-gyroscopic inertial angular sensor The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 August 2010. Printed in the United
11、 States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Introduction This
12、 introduction is not part of IEEE Std 671-1985/Cor1-2010, IEEE Standard for IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement Corrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Bl
13、ock Diagrams. This is the first corrigendum to IEEE Std 671-1985 (Reaff 2008). Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requ
14、irements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so.
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16、y making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of ne
17、w editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a
18、 given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information a
19、bout the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users
20、are encouraged to check this URL for errata periodically. v Copyright 2010 IEEE. All rights reserved. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementa
21、tion of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for whic
22、h a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminato
23、ry. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants The following individuals
24、 on the Gyro and Accelerometer Panel were major contributors to this corigendum: Randall Curey, Chair Reese Sturdevant, Vice Chair Cleon Barker George Erickson Howard Havlicsek Jean-Franois Kieffer Robert Martinez The following members of the individual balloting committee voted on this standard. Ba
25、lloters may have voted for approval, disapproval, or abstention. Cleon Barker Keith Chow Randall Curey Randall Groves Werner Hoelzl Jean-Franois Kieffer G. Luri Robert Martinez Richard Mellitz Bartien Sayogo Gil Shultz Daniel Tazartes Leroy Thielman Bruce Youmans vi Copyright 2010 IEEE. All rights r
26、eserved. When the IEEE-SA Standards Board approved this corrigendum on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gel
27、man Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liai
28、sons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Project Editor Soo H. Kim IEEE Standards Program Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 4. Qualit
29、y Assurance 2 4.7 Test Methods . 2 Annex A Sensor Dynamic Block Diagrams (informative) . 3 1 Copyright 2010 IEEE. All rights reserved. IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and Displacement Corrigendum 1:
30、 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Block Diagrams IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and healt
31、h practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and D
32、isclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe editing instructions contained in this corrigendum define how to merge the material contained herein into the existing base standard and its amend
33、ments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and replace. Change is used to make small corrections in existing text or tables. The editing instruction specifies the location of the change and
34、describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert adds new material without disturbing the existing material. Replace is used to make large changes in existing text, subclauses, tables, or fi
35、gures by removing existing material and replacing it with new material. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base document. IEEE Std 671-1985/Cor 1-2010 IEEE Standard Specification Format Guide and Test Procedure for Nongyros
36、copic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and DisplacementCorrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Block Diagrams 2 Copyright 2010 IEEE. All rights reserved. 4. Quality Assurance 4.7 Test Methods 4.7.2 Operating Tests 4.7.2.6 Short-Term Stability Cha
37、nge 4.7.2.6 as follows: The purpose of this test is to determine the short-term stability of the sensor bias K0, scale factor K1, and the input axis misalignments y, x. 3) Repeat step (2)_times per day for_h, d of continuous operation. Measurements are to be made at least_min, h apart. sensor and to
38、 measure its output Insert the following subclause after 4.7.2.6: 4.7.2.6.1 Test Equipment The following test equipment, specified in 4.6, is required for this test: 1) Rate table and sensor mounting fixture 2) Electronic equipment to operate the sensor and to measure its output Change and renumber
39、the remaining subclauses of 4.7.2.6 as follows: 4.7.2.6.2 Test Setup The test setup shall be in accordance with 4.7.2.1.1, 4.7.2.1.2, and 4.7.2.1.3, respectively. 4.7.2.6.13 Test Method 1) Stabilize the sensor at the standard operating conditions specified in 4.5. 2) Determine and record the bias, s
40、cale factor, and input axis misalignment using the procedures in 4.7.2.4 and 4.7.2.5. 3) Repeat step (2)_times per day for _h, d of continuous operation. Measurements are to be made at least_min, h apart. 4.7.2.6.24 Test Results 1) Determine the root mean square (rms) deviation of the bias, scale fa
41、ctor, and input axis misalignments from their mean values. 2) The sensor short-term stability shall conform to the requirements of 3.3.3.3, 3.3.4.2, and 3.3.5.2. In some applications it may be desirable to modify the test to determine the stability of additional parameters, such as linear accelerati
42、on sensitivity. IEEE Std 671-1985/Cor 1-2010 IEEE Standard Specification Format Guide and Test Procedure for Nongyroscopic Inertial Angular Sensors: Jerk, Acceleration, Velocity, and DisplacementCorrigendum 1: 4.7.2.6 Short-Term Stability and Annex A Sensor Dynamic Block Diagrams 3 Copyright 2010 IE
43、EE. All rights reserved. Annex A Sensor Dynamic Block Diagrams (Informative) Change Figure A.1 as follows: S = laplace operator = laplace transform of input rotation angle, rad J1= effective input moment of inerita inertia, N m/(rad/s2), g cm2 JD= dynamic moment of inertia about the output axis, N m
44、/(rad/s2), g cm2 C = damping torque coefficient, N m/(rad/s) Ke= moving system elastic restraint, N m/rad Kpo(S) = transfer function of pickoff, V/rad Ka(S) = transfer function of servo or output buffer amplifier, V/V KT= torquer scale factor, N m/A R = torquer resistance, L = torquer inductance, H
45、Vo(S) = laplace transfer of sensor output, V Figure A.1Angular Accelerometer or Closed-Loop Dynamic Angular Displacement Sensor Replace Figure A.4 with the following: Definitions in Fig A.1 apply where appropriate. The remaining symbols are defined as follows: Ep= pump supply, V Eb= bridge supply, V
46、 = fluid jet transit time, s Kpo = transfer function of bridge pickoff, V/(rad/s), a function of Epand Eb. With Kpoassumed to have no frequency dependence, the form shown in the block is an adequate low-frequency approximation assuming that the cut-off frequency of the filter indicated is less than, or equal to, 1 rad/s.Figure A.4Fluid Jet Rate Sensor bELOW PASS FILTER SS1)E,(EKbppo+PUMP (S)VopE2S(S)Vo1Je2DKCSSJ1+(S)Kpo(S)KaLSRKT+ELECTRONICS DIGITAL OUTPUT
