IEEE 813-1988 en Format Guide and Test Procedure for Two-Degree-of-Freedom Dynamically Tuned Gyros《双级自动大型回转仪的格式化规范指南和试验程序》.pdf

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1、Recognized as anAmerican National Standard (ANSI)Copyright 1989 byThe Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USANo part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorw

2、ritten permission of the publisher.ANSI/IEEE Std 813-1988(R2011)IEEE Specification Format Guide andTest Procedure for Two-Degree-of-Freedom Dynamically Tuned GyrosSponsorPrepared by the Gyro and Accelerometer Panelof theIEEE Aerospace and Electronic Systems SocietyReaffirmed December 7, 2011Approved

3、 August 17, 1988IEEE-SA Standards BoardReaffirmed June 7,2000Approved May 4, 1989American National Standards InstituteIEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE devel

4、ops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and serve without comp

5、ensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information or the soundness of any judgments contained in its standards. Use of an IE

6、EE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEE

7、E Standard document. The IEEE does not warrant or represent the accuracy or content of the material contained herein, and expressly disclaims any express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or that the use of the material containe

8、d herein is free from patent infringement. IEEE Standards documents are supplied “AS IS.” The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furtherm

9、ore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmat

10、ion, or every ten years for stabilization. When a document is more than five years old and has not been reaffirmed, or more than ten years old and has not been stabilized, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art

11、. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. In publishing and making this document available, the IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perf

12、orm any duty owed by any other person or entity to another. Any person utilizing this, and any other IEEE Standards document, should rely upon his or her independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional

13、 in determining the appropriateness of a given IEEE standard. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate a

14、ction to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating

15、Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be con

16、sidered the official position of IEEE or any of its committees and shall not be considered to be, nor be relied upon as, a formal interpretation of the IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his o

17、r her views should be considered the personal views of that individual rather than the formal position, explanation, or interpretation of the IEEE. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Suggestions for changes i

18、n documents should be in the form of a proposed change of text, together with appropriate supporting comments. Recommendations to change the status of a stabilized standard should include a rationale as to why a revision or withdrawal is required. Comments and recommendations on standards, and reque

19、sts for interpretations should be addressed to: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Authorization to photocopy portions of any individual standard for internal or personal use is granted by The Institute of Electrical and Electronics Engineers, Inc., provided th

20、at the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational

21、classroom use can also be obtained through the Copyright Clearance Center. iiiForeword(This Foreword is not a part of ANSI/IEEE Std 813-1988, IEEE Specification Format Guide and Test Procedure for Two-Degree-of-Freedom Dynamically Tuned Gyros.)This guide was prepared by the Gyro and Accelerometer Pa

22、nel of the Aerospace Electronics Systems Society of theInstitute of Electrical and Electronics Engineers. It consists of two parts.Part I is a specification format guide for the preparation of a two-degree-of-freedom dynamically tuned gyro (DTG)specification. It provides a common meeting ground of t

23、erminology and practice for manufacturers and users. The useris cautioned not to overspecify; only those parameters that are required to guarantee proper instrument performance inthe specific application should be controlled. In general, the specification should contain only those requirements thatc

24、an be verified by test or inspection. Parameters in addition to those given in this standard are not precluded.Part II is a compilation of recommended procedures for testing a DTG. These procedures, including test conditions tobe considered, are derived from those currently in use. For a specific ap

25、plication, the test procedure should reflect therequirements of the specifications; therefore, not all tests outlined in this document need to be included, nor areadditional tests precluded. In some cases, alternative methods for measuring performance characteristics have beenincluded or indicated.T

26、he intent is for the specification writer to extract the applicable test conditions and equipment requirements fromSection 9. for inclusion in the appropriate sections listed under 4.5. Similarly, it is intended that the writer extract theapplicable test procedures from Section 10. for inclusion in

27、the appropriate sections listed under 4.6. Part II can alsobe used as a guide in the preparation of a separate gyro test specification with appropriate section numbering.Blank spaces in the text of this document permit the insertion of specific parameter values and their tolerances.Brackets are used

28、 to enclose alternative choices of dimensional units, signs, axes, etc. Boxed statements are includedfor information only and are not part of the specification or test procedures. The terminology used conforms to ANSI/IEEE Std 100-1988, IEEE Standard Dictionary of Electrical and Electronics Terms an

29、d ANSI/IEEE Std 528-1984,IEEE Standard Inertial Sensor Terminology. The units used conform to ANSI/IEEE Std 268-1982, American NationalStandard Metric Practice. The abbreviation of units conforms to ANSI/IEEE Std 260-1978 (R 1985), IEEE StandardLetter Symbols for Units of Measurement (SI Units, Cust

30、omary Inch-Pound Units, and Certain Other Units). Thegraphic symbols used conform to ANSI/IEEE Std 315-1975, IEEE Graphic Symbols for Electrical and ElectronicsDiagrams.This guide defines the requirements and test procedures for a DTG in terms unique to that gyro. The requirements andtests contained

31、 herein cover applications where the gyro is used as an angular motion sensor in navigation and controlsystems. These requirements and tests apply to the two modes of use: (1) As a strapdown sensor in operatingenvironments typical of aircraft and missile applications, and (2) As a sensor in gimballe

32、d platform applications inwhich the dynamic angular inputs to which the gyro is subjected are benign relative to the accuracy required. Thestrapdown DTG, because the rotor is captured through two external loops using the two gyro torquers, provides twovoltages, currents, or pulse trains proportional

33、 to the angular rates about the respective two orthogonal input axes. Thegimballed platform DTG provides two output signals proportional to angular displacement of the case about therespective two orthogonal input axes when captured by a servoed platform.The term two-degree-of-freedom dynamically tu

34、ned gyro does not generally include the external electronics.However, in the case of the strapdown DTG, the characteristics of the external capture loops are considered to theextent necessary to define the gyro performance. A model equation is given in 6.3 for reference, to be included in aspecifica

35、tion only to the extent necessary.Appendix A lists various DTG design features for which this format is applicable. The table therein is not intended tomake any suggestion regarding the selection of particular design features that might restrict the free choice ofmanufacturers.Authorized licensed us

36、e limited to: IEEE Standards Staff. Downloaded on July 9, 2009 at 13:38 from IEEE Xplore. Restrictions apply.ivAppendix B shows the DTG open-loop frequency response characteristics, which may be referred to when specifyingand evaluating gyro dynamic response. Appendix C presents a guide to the opera

37、tion of a DTG.The IEEE will maintain this guide current with the state of the technology.This publication represents a group effort on a large scale. A total of 141 individuals attended 50 meetings on the Gyroand Accelerometer Panel while this standard was in preparation. The major contributors to t

38、his standard were thefollowing:T.C. Lear, ChairC.H. BarkerS.F. BeckaJ.S. BeriC.E. BossonA.T. Campbell *A. ChampsiJ.F. ConroyJ.W. Davies *H. DiamondG. EricksonA.H. FerrarisK.N. GreenR. HartzellM. HooserK.J. KlarmanM.G. KoningE.L. LadenheimA.M. LeekingJ.B. LewisD.D. LynchD.L. MacyR.D. MarquessH.D. Mor

39、risG.E.S. Morrison *G.C. Murray *J.G. NeugroschlR.B. PetersS. PiccioneA. ScovilleC. SeacordN.F. SinnottR. SmithC.B. StrangC.O. SwansonR. ThedeL.A. TrozpekR.L. Van AlstineB.J. WimberB.R. Youmans* Past ChairmanThe following persons were on the balloting committee that approved this document for submis

40、sion to the IEEEStandard Board:C.H. BarkerS.F. BeckaJ.S. BeriC.E. BossonA.T. CampbellA. ChampsiM. ColesJ.F. ConroyJ.W. DaviesH. DiamondN.C. DuffieldG. EricksonT. FuhrmanK.N. GreenR.M. HensleyG. HoffmanM. HooserM.G. KoningP. KrebsK. LantzT.C. LearA.M. LeekingJ.B. LewisD.D. LynchD.L. MacyR.D. Marquess

41、M. McClureF. MorganH.D. MorrisG.E.S. MorrisonG.C. MurrayG. NeugebauerJ.G. NeugroschlR.B. PetersW. PhillipsP. SimpsonN.F. SinnottC.O. SwansonR. ThedeC.I. ThornbergL.A. TrozpekB.J. WimberB. YoumansAuthorized licensed use limited to: IEEE Standards Staff. Downloaded on July 9, 2009 at 13:38 from IEEE X

42、plore. Restrictions apply.vWhen the IEEE Standards Board approved this standard on August 17, 1988, it had the following membership:Donald C. Fleckenstein, ChairMarco Migliaro, Vice Chair Andrew G. Salem, Secretary Arthur A. BlaisdellFletcher J. BuckleyJames M. Daly FrankStephen R. DillonEugene P. F

43、ogartyJay Forster *Thomas L. HannanKenneth D. HendrixTheodore W. Hissey, JrJohn W. HorchJack M. KinnD. KirschnerFrank C. KitzantidesJoseph L. Koepfinger *Irving KolodnyEdward LohseJohn E. May, JrLawrence V. McCallL. Bruce McClungDonald T. Michael *Richard E. MosherL. John RankineGary S. RobinsonFran

44、k L. RoseHelen M. WoodKarl H. ZainingerDonald W. Zipse* Member EmeritusAuthorized licensed use limited to: IEEE Standards Staff. Downloaded on July 9, 2009 at 13:38 from IEEE Xplore. Restrictions apply.viCLAUSE PAGEPart I Specification Format 11. Scope and References .11.1 Scope 11.2 References 12.

45、Applicable Documents22.1 Specifications . 22.2 Standards 22.3 Drawings 22.4 Bulletins . 32.5 Other Publications 33. Requirements 33.1 Description . 33.2 General Requirements 33.3 Performance . 33.4 Mechanical Requirements 133.5 Electrical Requirements . 173.6 Environmental Requirements. 203.7 Reliab

46、ility. 254. Quality Assurance Provisions .264.1 Classification of Tests 264.2 Acceptance Tests 264.3 Qualification Tests . 274.4 Reliability Tests . 284.5 Test Conditions and Equipment. 284.6 Test Methods 284.7 Data Submittal 315. Preparation for Delivery316. Notes .326.1 Intended Use 326.2 Ordering

47、 Data. 326.3 Model Equations 32Part II Test Procedure 357. Scope.358. Description 358.1 Angular Displacement Sensing 358.2 Angular Rate Sensing. 358.3 Model Equation 35Authorized licensed use limited to: IEEE Standards Staff. Downloaded on July 9, 2009 at 13:38 from IEEE Xplore. Restrictions apply.v

48、iiCLAUSE PAGE9. Test Conditions and Test Equipment 369.1 Standard Test Conditions 369.2 Standard Operating and Test Equipment 3810. Test Procedures .3910.1 Examination of Product (Mechanical) 3910.2 Examination of Product (Electrical) . 3910.3 Leak Test. 4110.4 Polarity 4110.5 Operating Temperature

49、Test Series 4210.6 Pickoff Test Series 4410.7 Torquer Test Series. 4610.8 Rotor Rotation Detector 5010.9 Spin Motor Test Series 5010.10 Axis Alignment. 5210.11 Limit Stop . 5410.12 Tuned Speed 5510.13 Dynamic lime Constant. 5610.14 Drift Rate Test Series 5710.15 Spring Rate Drift Rate Coefficients 6810.16 Dynamic Response Test Series. 6910.17 Output Noise . 7210.18 Generated Fields . 7510.19 Turn-On and Warm-Up Times 7610.20 Environmental Test Series 78Annex A Dynamically Tuned Gyro Design Features (Informative).80Annex B Typical DTG Open-Loop Frequency Response (Informative)81Annex C

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