1、 IEEE Standard for Qualifying Permanent Connections Used in Substation Grounding Sponsored by the Substations Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 837-2014(Revision ofIEEE Std 837-2002) IEEE Std 837-2014 (Revision of IEEE Std 837-2002) IEEE
2、Standard for Qualifying Permanent Connections Used in Substation Grounding Sponsor Substations Committee of the IEEE Power and Energy Society Approved 21 August 2014 IEEE-SA Standards Board Abstract: Direction and methods for qualifying permanent connections used for substation grounding are provide
3、d in this standard. This standard particularly addresses the connection used within the grid system, the connection used to join ground leads to the grid system, and the connection used to join the ground leads to equipment and structures. Keywords: conductor, conductor combination, connection, conn
4、ection thermal capacity, control conductor, current loop cycle, equalizer, grid system, grounding, grounding connection, IEEE 837, permanent connection The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrica
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34、ed, the E9 Working Group had the following membership: David Kelly, Chair Brian Story, Vice Chair Michael Rzasa, Secretary Jesse Rorabaugh, Technical Writer Hanna Abdallah Stan Arnot Radoslav Barac Thomas Barnes Hassein Bashirian Romulus Berzescu Bryan Beske Dale Boling Bill Carmen K. S. Chan Koushi
35、k Chanda Carson Day Dennis DeCosta William K. Dick Marcia Eblen David Garrett Joseph Gravelle Steve Greenfield Martin Havelka Robert Hobbs Richard Keil Reginaldo Maniego Jon Martin Saki Meliopoulos Carl Moller Roger Montambo William Morrissey Mike Noori Shashi Patel William Sheh Douglas Smith Gregor
36、y J. Steinman Curtis Stidham Yance Syarif Logan Trombley Keith Wallace Alexander Wong The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi Stan Arnot Thomas Barnes George B
37、ecker W. J. (Bill) Bergman Bryan Beske Steven Bezner Dale Boling Chris Brooks Kevin Buhle William Byrd James Cain Thomas Callsen Michael Champagne Koushik Chanda Robert Christman Franco DAlessandro Dennis DeCosta David E. De Luca Gary Donner Michael Dood Randall Dotson Keith Flowers Paul Forquer Mar
38、cel Fortin David Garrett George Gela Jalal Gohari Edwin Goodwin Joseph Gravelle Steve Greenfield Randall Groves Ajit Gwal Charles Haahr Thomas Harger David Harris Martin Havelka Lee Herron Gary Heuston Robert Hobbs Gary Hoffman John Kay David Kelley Gael Kennedy Yuri Khersonsky Hermann Koch Jim Kulc
39、hisky Saumen Kundu Chung-Yiu Lam Thomas La Rose Michael Lauxman Henri Lemeilleur Greg Luri Jon Martin Andrew McElroy Shawn McGann John Miller Daleep Mohla Carl Moller Georges Montillet Jerry Murphy Dennis Neitzel Michael Newman Joe Nims Robert Nowell Lorraine Padden Shashi Patel Percy Pool Thomas Pr
40、oios Michael Roberts Jesse Rorabaugh Thomas Rozek Michael Rzasa Bartien Sayogo Dennis Schlender Devki Sharma William Sheh Douglas Smith James Smith Jerry Smith John Spare Ryan Stargel Gregory J. Steinman Curtis Stidham Gary Stoedter Brian Story David Tepen Malcolm Thaden John Vergis Jane Verner Dona
41、ld Wengerter Kenneth White Alexander Wong Roland Youngberg Jian Yu Copyright 2014 IEEE. All rights reserved. vi When the IEEE-SA Standards Board approved this standard on 21 August 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair
42、Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Tri
43、vedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE-SA Content Publishing Erin Spiewak IEEE-SA Technical Community Programs Co
44、pyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 837-2014, IEEE Standard for Qualifying Permanent Connections Used in Substation Grounding. Working Group E9 of the IEEE PES Substations Committee began updating the standard in 2008. This standard has
45、been updated to fulfill a need for standardization of terminology and test requirements for permanent grounding connections. The most significant changes were made to the EMF test criteria that address the connections to above-grade rigid structures and equipment ground pads. Many types of connectio
46、ns are available that may be used as permanent grounding connections even though they were designed for use as power connections. This standard provides a meaningful reproducible test program that will enable connection manufacturers to qualify their products as permanent grounding connections. The
47、users can then be reasonably assured that the qualied permanent grounding connection will be capable of performing satisfactorily over the lifetime of the installation. This standard addresses the parameters for testing grounding connections on copper, steel, copper-bonded steel, copper-clad steel,
48、galvanized steel, and stainless steel. Copyright 2014 IEEE. All rights reserved. viii Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 3 4. Qualification tests . 3 5. Performance criteria . 4 5.1 General 4 5.2 Mechanical tests 4 5.3 Sequential tests 5 6. Te
49、st procedures . 9 6.1 General 9 6.2 Mechanical test samples 9 6.3 Sequential test samples 9 6.4 Connections description. 9 6.5 Test conductors 9 6.6 Test assembly methods 9 6.7 Connection preparation 9 6.8 Installation 10 7. Mechanical test 10 7.1 General .10 7.2 Electromagnetic force (EMF) test.10 8. Current-temperature cycling test .17 8.1 General .17 8.2 Current-temperature cycling test 17 8.3 Ambient conditions .18 8.4 Control conductor .18 8.5 Current cycling .18 8.6 Current cycling loop configuration .20 8.7 Current cycling measurements21 9. Freeze-thaw test .22 9.
