IEEE C37 09-1999 en Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis《基于平衡电流的额定交流高压断路器的试验程序》.pdf

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1、The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2000 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 28 March 2000. Printed in the United States of America.Print: ISBN 0-7381-1783-8 SH94775PD

2、F: ISBN 0-7381-1784-6 SS94775No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std C37.09-1999 (R2007)(Revision ofIEEE Std C37.09-1979)IEEE Standard Test Procedure forAC High-Voltage C

3、ircuit Breakers Rated on a Symmetrical Current BasisSponsorSwitchgear Committeeof theIEEE Power Engineering SocietyReaffirmed 26 September 2007Approved 26 June 1999IEEE-SA Standards BoardAbstract: The testing procedures for all high-voltage circuit breakers that include all voltage ratingsabove 1000

4、 V ac and comprise both indoor and outdoor types having the prefered ratings as listedin ANSI C37.06-1997 are covered. Typical circuit breakers covered by these standards have max-imum voltage ratings from 4.76 kV through 800 kV, and continuous current ratings of 600 A, 1200A, 2000 A, and 3000 A ass

5、ociated with the various maximum voltage ratings. The test proceduresverify all assigned ratings, including continuous current, dielectric withstand voltages, short-circuitcurrent, transient recovery voltage, and capacitor switching, plus associated capabilities such asmechanical endurance, load cur

6、rent, and out-of-phase switching. Production test procedures arealso included. This standard does not cover generator circuit breakers as these are covered in IEEEStd C37.013-1993.Keywords: fast transient recovery voltage, indoor, initial, mechanical endurance, operating duty,outdoor, power frequenc

7、y, short-circuit current, short-line fault, single-phase testing, test data re-porting, three-phase testing, unit test, voltage distribution synthetic test.IEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinating Com-mittees of the IEEE Standards Association (IE

8、EE-SA) Standards Board. Members of the committees servevoluntarily and without compensation. They are not necessarily members of the Institute. The standardsdeveloped within IEEE represent a consensus of the broad expertise on the subject within the Institute aswell as those activities outside of IE

9、EE that have expressed an interest in participating in the development ofthe standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that thereare no other ways to produce, test, measure, purchase, market, or provide other goods and services related tot

10、he scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved andissued is subject to change brought about through developments in the state of the art and commentsreceived from users of the standard. Every IEEE Standard is subjected to review at least every

11、five years forrevision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is rea-sonable to conclude that its contents, although still of some value, do not wholly reflect the present state ofthe art. Users are cautioned to check to determine that they have

12、 the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membershipaffiliation with IEEE. Suggestions for changes in documents should be in the form of a proposed change oftext, together with appropriate supporting comments

13、.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as theyrelate to specific applications. When the need for interpretations is brought to the attention of IEEE, theInstitute will initiate action to prepare appropriate responses. Since IEEE Standards re

14、present a consensus ofall concerned interests, it is important to ensure that any interpretation has also received the concurrence of abalance of interests. For this reason, IEEE and the members of its societies and Standards CoordinatingCommittees are not able to provide an instant response to inte

15、rpretation requests except in those cases wherethe matter has previously received formal consideration. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy por

16、tions of any individual standard for internal or personal use is granted by theInstitute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus-tome

17、r Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopyportions of any individual standard for educational classroom use can also be obtained through the Copy-right Clearance Center.Note: Attention is called to the possibility that implementation of this standar

18、d mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an

19、IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 2000 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std C37.09-1999, IEEE Standard Test Procedure for AC High-Voltage CircuitBreaker

20、s Rated on a Symmetrical Current Basis.)This standard is a major revision of ANSI/IEEE Std C37.09-1979 (R1996). This revision contains majorsubstantive changes. Some editorial changes also have been included, and they are intended to eliminateduplication of words from IEEE Std C37.04-1999 and to red

21、uce the word usage in general.Listed here, for information and guidance, are the substantive changes.This revision reflects the changes made in ANSI C37.06-1997 where the K factor has effectively beeneliminated for all indoor circuit breakers by assigning to it a numerical value of K = 1. This has b

22、eendone to take advantage of the newer interrupting technologies. Additionally, the traditional use of 1.6 asthe multiplying factor for the asymmetrical root-mean-square (rms) current and 2.7 for the peak currenthas been revised to reflect the time constant of 45 ms (corresponding to an X/R ratio of

23、 17 at 60 Hz or14 at 50 Hz) on which the circuit breaker ratings are based, which yields the mathematically correct val-ues of 1.55 and 2.6 respectively. With the implementation of this change, the information needed to prop-erly test circuit breakers rated in accordance with the 1979 or earlier edi

24、tions of ANSI C37.06 andIEEE Std C37.04 has been deleted from the main body of this document; however test Tables 1 and 2from the 1979 version of ANSI/IEEE Std C37.09-1979 have been included as Annex B for reference pur-poses and to be used in those cases where circuit breakers designed to meet the

25、prior standards require-ment are being tested. Users must refer to the prior editions of the relevant standards for more conciseinformation in order to properly test those earlier designs of circuit breakers. This major change hasresulted in a consolidation of text and of test duty requirements for

26、this revision. ANSI C37.06.1-1997 is a new concept document and has been recognized and incorporated in this revisionby reference and notes in applicable clauses.All outstanding supplements of this standard have been included, with the exception ofIEEE Std C37.09a-1991, Load Current Switching Tests,

27、 which has been replaced with a later revisionthat is included in 4.9. Mechanical endurance (4.13) has also been upgraded.A clause covering leakage tests (5.7) for gaseous and for vacuum interrupters has been added.The Lightning impulse withstand testing clause (4.4.4.2) now includes the 3 9 method

28、as part of the har-monization effort with IEC.The Standard operating duty/standard duty cycle (4.5) for non-reclosing rated circuit breakers has beenchanged from CO - 15s - CO to O - t - CO - t- CO where t and t are defined times between tests, while thetest duty O - 0.3 sec - CO has been added for

29、circuit breakers rated for reclosing duty applications.Short-line fault tests have now been made mandatory for all outdoor circuit breakers rated 15.5 kV andabove.ANSI/IEEE Std 4-1978, IEEE Standard Techniques for High-Voltage Testing, is specifically referenced inthis standard because its latest re

30、vision does not include critical test techniques needed for circuit breakertesting. When the latest issue of this standard is suitably revised, it will be officially recognized and willbecome part of this revision.Sections of test requirements covering pressurized and non-ceramic pressurized insulat

31、ing components, pre-viously included in NEMA SG-4 Standard, have now been incorporated into this standard.ivCopyright 2000 IEEE. All rights reserved.Indoor circuit breakers are recognized in this revision for their unique test and application requirements asdictated by their use in metal-clad switch

32、gear and as covered in IEEE Std C37.20.2-1993.Capacitor current testing (4.10) has been carried over without change, except for clause renumbering, fromthe 1979 publication. This clause is expected to change in the future as a result of a major harmonized revi-sion, which is now being prepared by a

33、joint IEEE and IEC working group.This standard, with its companion standards, IEEE Std C37.04-1999, ANSI C37.06-1997, and IEEE StdC37.010-1999, establishes a total rating, test, and application basis for all high-voltage circuit breakers withthe exception of generator circuit breakers, which are cov

34、ered by IEEE Std C37.013-1997.This standard was approved by the American National Standards Institute (ANSI) on 20 January 2000.ParticipantsThe Accredited Standards Committee on Power Switchgear, C37, which reviewed and approved this stan-dard, had the following personnel at the time of approval:Eld

35、ridge R. Byron,ChairAndrew K. McCabe,Vice Chair, High-Voltage StandardsJ. C. Scott,Vice Chair, Low-Voltage StandardsDavid L. Swindler,Vice Chair, IEC ActivitiesOrganization Represented Name of RepresentativeEdison Electric Institute (EEI)T. E. Bruck(Alt.)D. E. GaliciaJoseph L. KoepfingerD. G. Komass

36、aGary MillerJ. H. ProvanzanaInstitute of Electrical and Electronics EngineersSteve C. Atkinson (Alt.)L. R. BeardPeter W. DwyerDavid G. Kumbera(Alt.)Lawrence V. McCall (Alt.)A. MonroeDavid F. PeeloM. Dean SigmonMET Electrical Testing Association .Leonard FrierNational Electric Contractors Association

37、Darrell HarwoodNational Electrical Manufacturers Association Eldridge R. Byron (Alt.)Ruben D. GarzonGary T. Jones(Alt.)William KrachtLee H. MillerT. W. OlsenGerald Sakats (Alt.)David L. StoneDavid L. Swindler(Alt.)Tennessee Valley Authority.David N. ReynoldsUnderwriters Laboratories Paul J. Notarian

38、US Department of the Army,Office of the Chief of Engineers .John A. GilsonUS Department of the Navy,Construction Battalion Center.Romulo R. NicholasWestern Area Power Administration.Gerald D. BirneyCopyright 2000 IEEE. All rights reserved.vThis standard was developed by the High-Voltage Circuit Brea

39、ker Subcommittee of the IEEE SwitchgearCommittee. At the time this standard was completed, the members of this Working Group were as follows:Ruben D. Garzon,ChairThe following persons were on the balloting committee:Denis DufournetHarold L. HessNigel P. McQuinGordon O. PerkinsDavid N. ReynoldsR. Kir

40、kland SmithAlan D. StormsDavid L. SwindlerJohn TanneryRoy W. AlexanderSteve C. AtkinsonEdwin AverillMichael P. BaldwinBill BergmanSteven A. BoggsAnne BosmaMatthew BrownJohn H. BrunkeTed BurseEldridge R. ByronCarlos L. Cabrera-RuedaRaymond L. CapraJames F. ChristensenStephen P. ConradSteven J. Delisi

41、Patrick J. DiLilloAlexander DixonRandall L. DotsonJulian J. DravisDenis DufournetPeter W. DwyerDouglas J. EdwardsGary R. EngmannJay FischerCharles G. GarnerMietek T. GlinkowskiDave GohilDavid F. GrayKeith GrayIan J. HarveyHarold L. HessRichard H. HulettAftab H. KhanJoseph L. KoepfingerP. L. KolarikD

42、avid G. KumberaStephen R. LambertThomas W. LaRoseW. E. LaubachDavid LemmermanAlbert LivshitzR. W. LongJeffrey D. LordDeepak MazumdarLawrence V. McCallNeil McCordNigel P. McQuinPeter MeyerDaleep C. MohlaFrank J. MuenchRaja MunayirjiYasin I. MusaJeffrey H. NelsonPaul J. NotarianTed W. OlsenMiklos J. O

43、roszGordon O. PerkinsDavid N. ReynoldsHugh C. RossGerald SakatsHazairin SamaulahRoger A. SarkinenGary SchaufflerLarry H. SchmidtDonald E. SeayDean SigmonMel SmithJames E. SmithR. Kirkland SmithBodo SojkaGuy St. JeanDavid L. StoneAlan D. StormsWilliam M. StrangDavid L. SwindlerStan H. TelanderThomas

44、J. TobinMichael WactorCharles L. WagnerLarry E. YonceJanusz ZawadzkiCopyright 2000 IEEE. All rights reserved.viWhen the IEEE Standards Board approved this standard on 26 June 1999, it had the following membership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudith Gorman,Secretary*Member Eme

45、ritusAlso included is the following nonvoting IEEE Standards Board liaison:Satish K. AggarwaldAlan H. CooksonNoelle D. HumenickIEEE Standards Project EditorSatish K. AggarwalDennis BodsonMark D. BowmanJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Ruben D. GarzonJames H. GurneyLowell G. J

46、ohnsonRobert J. KennellyE. G. “Al” KienerJoseph L. Koepfinger*L. Bruce McClungDaleep C. MohlaRobert F. MunznerLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoHans E. WeinrichDonald W. ZipseCopyright 2000 IEEE. All rights reserved.viiContents1. Scope 12. Ref

47、erences 13. Definitions 34. Design tests 34.1 Maximum voltage tests 34.2 Power frequency tests 34.3 Continuous current-carrying tests 34.4 Dielectric withstand tests . 54.5 Standard operating duty (standard duty cycle) tests 104.6 Interrupting time tests 104.7 TRV tests . 104.8 Short-circuit current

48、 interrupting tests.104.9 Load current. 294.10 Capacitor switching current tests. 304.11 Line closing switching surge factor .424.12 Out-of-phase switching current tests . 444.13 Mechanical endurance tests . 474.14 Control voltage. 484.15 Fluid operating pressure. 484.16 Design tests on pressurized

49、components 484.17 Sealed pressure systems leakage tests 505. Production tests 515.1 Types of tests . 515.2 Current and linear coupler transformer tests . 525.3 High-voltage circuit breaker bushings tests. 525.4 Gas receiver tests . 525.5 Pressure tests 535.6 Nameplate check 535.7 Leakage tests 535.8 Vacuum integrity tests . 545.9 Resistors, heaters, and coils check tests 545.10 Control and secondary wiring check tests . 545.11 Clearance and mechanical adjustment check tests 545.12 Mechanical operation tests 545.13 Timing tests . 555.14 Stored energy system tests. 565.15 Electr

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