1、 IEEE Standard for Metal-Enclosed Interrupter Switchgear (1 kV38 kV) Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy SocietyIEEE Std C37.20.3-2013(Revision ofIEEE Std C37.20.3-2001) IEEE Std C37.20.3-2013 (Revision of IEEE Std C37.20.3-2001)
2、 IEEE Standard for Metal-Enclosed Interrupter Switchgear (1 kV38 kV) Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 11 December 2013 IEEE-SA Standards Board ii Copyright 2014 IEEE. All rights reserved. Abstract: Metal-enclosed interrupter (MEI) switchgear assemblies conta
3、ining, but not limited to, such devices as interrupter switches; selector switches; power fuses; circuit breakers; control, instrumentation and metering devices; and protective equipment are included in this standard. It includes, but is not specifically limited to, equipment for the control and pro
4、tection of apparatus used for distribution of electrical power. Keywords: IEEE C37.20.3, MEI, metal-enclosed interrupter switchgear, metal-enclosed power switchgear, switchgear, switchgear assembly The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, US
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34、ility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2014 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Switchgear Assemblies Working Group had the following membership: Charles
35、 Ball, Chair T. W. Olsen, Vice Chair Paul D. Barnhart Jerry Baskin Eldridge Byron Larry Farr Douglas H. Giraud Dave Gohil Ronald D. Hartzel Anurag Jivanani Harry W. Josten Albert Livshitz Steven Meiners M. J. Orosz Raghunath Parthasarathi Amit Patel Robert J. Puckett Carl Schneider James E. Smith Pa
36、ul B. Sullivan Chandrakant Tailor John Toney Walt VonMiller Larry E. Yonce The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Charles Ball Paul D. Barnhart Ted Burse Ray Davis Randall Dotson Douglas E
37、dwards Rabiz Foda Douglas H. Giraud Randall Groves David Horvath Danny Hoss Harry W. Josten Laszlo Kadar Chad Kennedy Yuri Khersonsky Jim Kulchisky Benjamin Lanz Michael Lauxman Albert Livshitz Greg Luri William McBride Peter Meyer Anne Morgan Charles Morse T. W. Olsen Mirko Palazzo Vincenzo Paparo
38、Christopher Petrola Iulian Profir Scott Reed Bartien Sayogo Carl Schneider James E. Smith Jerry Smith Ralph Stell Michael Swearingen T. Tobin John Vergis Kenneth White Jian Yu vii Copyright 2014 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 11 December 2013 it
39、 had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Ja
40、nezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezi
41、c, NIST Representative Catherine Berger Senior Program Manager, IEEE-SA Content Publishing Erin Spiewak Program Manager, IEEE-SA Technical Community viii Copyright 2014 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.20.3-2013, IEEE Standard for Metal-Enclosed I
42、nterrupter Switchgear (1 kV38 kV). This standard has been revised to reflect needed technical changes since the last revision (2001) was published. The standard has been harmonized with IEEE Std C37.100.1-2007. Substantial changes have also been made to recognize the growing use of circuit breakers
43、as a component of metal-enclosed interrupter switchgear. This publication is one of a series covering switchgear assemblies as follows (see Figure a): IEEE Std C37.20.1, IEEE Standard for Metal-Enclosed Low-Voltage Power Circuit Breaker Switchgear IEEE Std C37.20.2, IEEE Standard for Metal-Clad Swit
44、chgear IEEE Std C37.20.3, IEEE Standard for Metal-Enclosed Interrupter Switchgear IEEE Std C37.20.4, IEEE Standard for Indoor AC Switches Rated Above 1 kV through 38 kV for Use in Metal-Enclosed Switchgear IEEE Std C37.20.6, IEEE Standard for 4.76 to 38 kV Rated Ground and Testing Devices Used in En
45、closures IEEE Std C37.21, IEEE Standard for Control Switchboards IEEE Std C37.23, IEEE Standard for Metal-Enclosed Bus SWITCHGEAR ASSEMBLIESMETAL-ENCLOSEDPOWER SWITCHGEARMETAL-ENCLOSED BUSC37.23CONTROL SWITCHBOARDSC37.21LOW-VOLTAGE POWERCIRCUIT BREAKER (LV)C37.20.1NON-SEGREGATEDPHASEMETAL-CLADC37.20
46、.2METAL-ENCLOSEDINTERRUPTER (MEI)C37.20.3SEGREGATED PHASEISOLATED PHASEREQUIREMENTS ANDGUIDE FORCALCULATING LOSSESVERTICALOPEN ORENCLOSEDDUALDUPLEXCONTROL DESKDUALBENCHBOARDDUPLEXBENCHBOARDFIXED RACKCABINETSWING RACKCABINETBENCHBOARDFigure aPublications about switchgear assemblies ix Copyright 2014
47、IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 4 4. Normal (usual) and special (unusual) service conditions . 5 4.1 Normal (usual) and special (unusual) service conditions 5 4.2 Special (unusual) service conditions for both indo
48、or and outdoor switchgear 6 5. Ratings 7 5.1 General 7 5.2 Voltage and insulation levels . 7 5.3 Rated power frequency (fr) 8 5.4 Rated continuous (normal) current and temperature rise . 8 5.5 Rated short-time withstand current (Ik) 10 5.6 Rated peak withstand current (Ip) .10 5.7 Rated duration of
49、short circuit (tk) 11 5.8 Current transformer ratings .11 5.9 Voltage transformers 11 6. Tests 12 6.1 Grouping of tests 12 6.2 Dielectric tests 13 6.3 Radio influence voltage (RIV) test .17 6.4 Measurement of resistance of circuits.17 6.5 Temperature-rise tests .18 6.6 Short-time withstand current and peak withstand current tests 20 6.7 Verification of the degrees of protection provided by enclosures 22 6.8 Tightness tests.23 6.9 Electromagnetic compatibility tests 23 6.10 Additional tests on auxiliary and control circuits .23 6.11 X-Radiation procedure fo
