1、IEEE Std C37.20.7-2007(Revision ofIEEE Std C37.20.7-2001)IEEE Guide for Testing Metal-EnclosedSwitchgear Rated Up to 38 kV forInternal Arcing FaultsIEEE3 Park Avenue New York, NY 10016-5997, USA18 January 2008IEEE Power Engineering SocietySponsored by theSwitchgear CommitteeC37.20.7IEEE Std C37.20.7
2、TM-2007 (Revision of IEEE Std C37.20.7-2001) IEEE Guide for Testing Metal-Enclosed Switchgear Rated Up to 38 kV for Internal Arcing Faults Sponsor Switchgear Committee of the IEEE Power Engineering Society Approved 27 September 2007 IEEE-SA Standards Board Abstract: A procedure for testing and evalu
3、ating the performance of metal-enclosed switchgear for internal arcing faults is covered. A method of identifying the capabilities of this equipment is given. Service conditions, installation, and application of equipment are also discussed. Keywords: accessibility, arc, bus, compartment, internal a
4、rcing fault, metal-clad switchgear, metal-enclosed interrupter switchgear, metal-enclosed low-voltage power circuit breaker switchgear, metal-enclosed switchgear, overpressure, protection The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyrigh
5、t 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 18 January 2008. Printed in the United States of America. Second Printing 16 April 2008. Corrections to 5.2.4. Errata information can be obtained at http:standards.ieee.org/reading/ieee/updates/errar
6、a/index.html. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2008 IEEE. All rights reserved. Introduction This intro
7、duction is not part of IEEE Std C37.20.7-2007, IEEE Guide for Testing Metal-Enclosed Switchgear Rated Up to 38 kV for Internal Arcing Faults. The standards and guides in the IEEE C37TMseries have been developed over a period of many years through the cooperative efforts of users, specifiers, manufac
8、turers, and other interested parties. This edition of IEEE Std C37.20.7 includes a detailed application guide and improvements in the testing procedure. The development of this guide rests heavily on Annex AA of IEC 298-1981a1and Amendment 1: 1994. This revision is harmonized with the IEC and incorp
9、orates many of the refinements made to the original IEC 298, as contained in the current IEC 62271-200 edition. This revision reflects lessons learned from use of the previous 2001 version. This revision also extends the scope to include testing of low-voltage metal-enclosed power circuit breaker sw
10、itchgear. In the 1970s, principally in Europe, interest in evaluating electrical equipment under conditions of internal arcing emerged. As a result, a draft Annex AA to IEC 298 “A.C. Metal-Enclosed Switchgear and Controlgear for Rated Voltages Above 1kV and Up to and Including 52kV” was issued by th
11、e IEC in 1981 and revised in 1990. It was redesignated IEC 62271-200 and revised in 2003. Subsequent to the creation of IEC 298, IEC subcommittee 17D issued Technical Report IEC/TR 1641 in 1996 (now redesignated as IEC/TR 61641) entitled “Enclosed Low-Voltage Switchgear and Controlgear AssembliesGui
12、de for Testing Under Conditions of Arcing Due to Internal Fault.” Knowledge of the arc resistance testing guide in IEC 298 spread to North America, and it was used as the basis for EEMAC G14-1, 1987, “Procedure for Testing the Resistance of Metal Clad Switchgear Under Conditions of Arcing Due to an
13、Internal Fault.” EEMAC G14-1 incorporated improvements in knowledge and understanding in over a decade of use of Annex AA of IEC 298 in Europe. Failure within a switchgear assembly, whether from a defect, an unusual service condition, lack of maintenance, or misoperation, may initiate an internal ar
14、c. There is little likelihood of an internal arc in equipment meeting the requirements of IEEE Std C37.20.1TM-2002,b ,2IEEE Std C37.20.2TM-1999, or IEEE Std C37.20.3TM-2001. There is even less likelihood of an internal arc in equipment that has insulated bus, compartmentalization, barriers, and inte
15、rlocks, such as those described in IEEE Std C37.20.2-1999; however, the possibility cannot be disregarded completely. The intent of this guide is to address the testing procedure for internal arcing faults in metal-enclosed switchgear. Even when arc-resistant construction is specified, it is strongl
16、y recommended that supplemental power system protection be provided. This supplemental protection should limit the total energy that can be delivered in the event of internal arcing faults. This protection can be provided in a variety of ways, depending on the nature of the system. Among the forms o
17、f protection that may be appropriate are current-limiting fuses, current-limiting circuit breakers, zone differential or bus differential relaying, ground differential protection, or arc-sensing systems sensitive to light or pressure effects that accompany internal arcing faults. The objective of su
18、ch protection must be to cause the interruption of all sources of power to the arcing fault in a time interval that is shorter than the rated arcing duration capability demonstrated by the tests contained within this document (refer to 4.3). aIEC publications are available from the Sales Department
19、of the International Electrotechnical Commission, Case Postale 131, 3, rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor,
20、 New York, NY 10036, USA.bIEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards/ieee.org/). v Copyright 2008 IEEE. All rights reserved. In addition to supplemental power system protection, adequate person
21、al protective equipment is required, as all hazards associated with an internal arcing fault are not eliminated when equipment tested to this guide is used. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading
22、/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation
23、of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a l
24、icense may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions are reasonable or non-discriminatory. Further information may be obtained from the IEEE Standards Association. Participants At the time this gu
25、ide was submitted to the IEEE-SA Standards Board for approval, the C37.20.7 Arc Resistant Switchgear Working Group had the following membership: Michael Wactor, Chair T. W. Olsen, Vice Chair Charles J. Ball P. Barnhart Eldridge R. Byron P. Dwyer Nancy Gunderson David J. Lemmerman D. Mazumdar Thomas
26、McNamara Miklos Orosz Robert J. Puckett Shaun Slattery* James E. Smith Jan Zawadzki *Deceased vi Copyright 2008 IEEE. All rights reserved. At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Switchgear Assemblies Subcommittee of the IEEE Switchgear Committee had the
27、 following membership. T. W. Olsen, Chair Anne F. Morgan, Secretary Charles J. Ball P. Barnhart Ted A. Burse Eldridge R. Byron J. J. Dravis P. Dwyer Doug J. Edwards S. S. Gohil J. M. Jerabek Ward E. Laubach David J. Lemmerman Albert Livshitz F. Mayle D. Mazumdar W. C. McKay Charles Allan Morse Paul
28、J. Notarian G. R. Nourse E. A. Peters Robert J. Puckett James E. Smith A. Storms Paul Sullivan Stan H. Telander Michael Wactor*Deceased The following members of the balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Ali Al Awazi Marcos Andrade
29、 Sabir Azizi-Ghannad Charles J. Ball Louis Barrios W. J. (Bill) Bergman Wallace Binder Thomas Blair William Bloethe Dieter Braun Steven Brockschink David Burns Ted A. Burse Thomas Callsen Mary Capelli-Schellpfeffer Tommy Cooper R. Daubert Matthew Davis Frank Denbrock Alexander Dixon J. Frederick Doe
30、ring Mark Drabkin Denis Dufournet Donald Dunn Doug Edwards Gary Engmann Jorge Fernndez-Daher Marcel Fortin Kenneth Gettman David Gilmer Douglas Giraud Keith Gray Randall Groves Nancy Gunderson Gary Heuston Edward Horgan Jr. Dennis Horwitz William Hurst Richard Jackson Jose Jarque Yuri Khersonsky Jos
31、eph L. Koepfinger Stephen R. Lambert Ward E. Laubach David J. Lemmerman Boyd Leuenberger Blane Leuschner Jason Lin Albert Livshitz Russell Lowe Thomas Lundquist Gregory Luri Kyaw Myint Thomas McNamara Nigel McQuin Steven Meiners Gary Michel Georges Montillet Anne Morgan Charles Allan Morse Jerry Mur
32、phy Michael Newman Art Neubauer Paul J. Notarian T. W. Olsen Miklos Orosz Neville Parry Robert J. Puckett Michael Roberts James Ruggieri Lawrence Salberg Vincent Saporita Carl Schneider Devki Sharma Shaun Slattery* H. Melvin Smith James E. Smith Allan St. Peter James Stoner Paul Sullivan Chand Tailo
33、r Stan H. Telander David Tepen William Terry Shanmugan Thamilarasan Dennis Thonsgard Donald Voltz Hemant Vora Michael Wactor Charles Wagner James Wilson Jim Wiseman Larry Yonce Jan Zawadzki*Deceased vii Copyright 2008 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on
34、 27 September 2007, it had the following membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch
35、Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Also included are the following nonvotin
36、g IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Jennie Steinhagen IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2008 IEEE. All right
37、s reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Background 1 2. Normative references 3 3. Definitions 4 4. Ratings 5 4.1 Accessibility type 5 4.2 Internal arcing short-circuit current . 5 4.3 Arcing duration 6 5. Tests . 6 5.1 Test arrangements 6 5.2 Test conditions. 11 5.3 Arc initiation 16 5.
38、4 Indicators (for observing the thermal effects of gases) 17 6. Assessment . 20 6.1 Assessment of test results 20 6.2 Test report 21 6.3 Nameplate 22 7. Application considerations . 22 7.1 Potential areas for arcing . 22 7.2 Design changes 22 7.3 Equipment maintenance. 22 Annex A (informative) Optio
39、nal performance features 23 Annex B (informative) Application guide 27 Annex C (informative) Bibliography 37 IEEE Guide for Testing Metal-Enclosed Switchgear Rated Up to 38 kV for Internal Arcing Faults 1 1. 1.1Overview Scope This guide establishes methods by which metal-enclosed switchgear, as defi
40、ned by IEEE Std C37.20.1TM-2002,1IEEE Std C37.20.2TM-1999, and IEEE Std C37.20.3TM-2001, may be tested for resistance to the effects of arcing due to an internal fault. This guide applies only to equipment utilizing air as the primary insulating medium and rated up to 38 kV ac. It applies to both in
41、door and outdoor equipment; however, special consideration must be given to the building size and construction for indoor applications (not addressed by this document). The tests and assessments described in this guide are only applicable to arcing faults occurring entirely in air within the enclosu
42、re when all doors and covers are properly secured. This guide does not apply to arcing faults that occur within components of the switchgear assembly, such as instrument transformers, sealed interrupting devices, fuses, and so on. Switchgear designs that meet the requirements of this guide will be r
43、eferred to as arc-resistant, metal-enclosed low-voltage ac power circuit breaker switchgear, arc-resistant metal-enclosed interrupter switchgear, or arc-resistant metal-clad switchgear as applicable, or generally, as arc-resistant switchgear. 1.21.2.11Information on references can be found in Clause
44、 2. Background Consequences of internal arc faults Metal-enclosed switchgear is designed to withstand the worst-case mechanical forces between conductors, which occur when a short circuit occurs directly on the load terminals of the switchgear. This condition is referred to as a “bolted fault” in IE
45、EE Std C37.100TM-1992. The ability of metal-enclosed switchgear to withstand the effects of the bolted fault is demonstrated in the Short-Time Withstand Current Tests and in the Momentary Withstand Current Tests in IEEE Std C37.20.2-1999 and IEEE Std C37.20.3-2001 or the Copyright 2008 IEEE. All rig
46、hts reserved. IEEE Std C37.20.7-2007 IEEE Guide for Testing Metal-Enclosed Switchgear Rated Up to 38 kV for Internal Arcing Faults Short-Circuit Current Withstand Tests and Short-Time Current Withstand Tests in IEEE Std C37.20.1-2002. When a bolted fault occurs, the voltage at the fault is essential
47、ly zero, and the fault energy is dissipated throughout the entire system from the source to the fault location. The occurrence of arcing inside switchgear produces a variety of physical phenomena that are very different from the bolted fault. For example, the arc energy that results from an arc deve
48、loped in air at atmospheric pressure will cause a sudden pressure increase inside the enclosure and localized overheating. As a result, both severe mechanical and thermal stresses occur on the equipment. Moreover, the materials involved in or exposed to the arc may produce hot decomposition products
49、 either gaseous or particulate, which may be discharged to the outside of the enclosure. The procedures outlined in this guide make it possible to evaluate the effect of abnormal internal pressure acting on properly latched or secured covers, doors, inspection windows, and so on. The procedures also take into consideration the thermal effects of the arc on the enclosure and of ejected hot gases and glowing particles. 2 1.2.2a) b) c) d) Equipment qualified to this guide The use of equipment qualified to this guide is intended to provide an additional degree of protect
