1、g44g40g40g40g3g54g87g71g3g38g24g26g17g20g21g17g25g19g140g16g21g19g19g28g3g11g53g72g89g76g86g76g82g81g3g82g73g44g40g40g40g3g54g87g71g3g38g24g26g17g20g21g17g25g19g16g20g28g28g27g12g44g40g40g40g3g54g87g68g81g71g68g85g71g3g55g72g86g87g3g51g85g82g70g72g71g88g85g72g3g73g82g85g3g55g75g72g85g80g68g79g3g40g8
2、9g68g79g88g68g87g76g82g81g3g82g73g3g44g81g86g88g79g68g87g76g82g81g3g54g92g86g87g72g80g86g3g73g82g85g3g39g85g92-g55g92g83g72g3g51g82g90g72g85g3g68g81g71g3g39g76g86g87g85g76g69g88g87g76g82g81g3g55g85g68g81g86g73g82g85g80g72g85g86g15g3g44g81g70g79g88g71g76g81g74g3g50g83g72g81g16g58g82g88g81g71g15g3g54g
3、82g79g76g71g16g38g68g86g87,g3g68g81g71g3g53g72g86g76g81-g40g81g70g68g83g86g88g79g68g87g72g71g3g55g85g68g81g86g73g82g85g80g72g85g86g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g55g85g68g81g86g73g82g85g80g72g85g86g3g38g82g8
4、0g80g76g87g87g72g72g3g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g312g3Mag85chg3g21g19g20g19g38g24g26g17g20g21g17g25g19g55g48IEEE Std C57.12.60-2009 (Revision of IEEE Std C57.12.60-1998) IEEE Standard Test Proce
5、dure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin-Encapsulated Transformers Sponsor Transformers Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for
6、educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C57.12.60-2009, IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wou
7、nd, Solid-Cast, and Resin-Encapsulated Transformers. This standard was developed to provide a method for evaluating insulation systems for open-wound, solid-cast and resin-encapsulated transformers with high-voltage ratings greater than 600 V. Historically, two existing documents (IEEE Std C57.12.56
8、 and IEEE Std C57.12.60-1998) have provided similar technical testing procedures for thermal evaluation of different types of dry-type transformers (open-wound, solid-cast, and resin-encapsulated). The procedures were similar enough to be combined into a single document, with modifications. The fina
9、l document will simplify procedures for this test to make it easier for manufacturers to qualify their systems and for users to judge and compare results. The working group that developed this standard used IEEE Std C57.12.60-1998 as a starting point. Because of the variety of winding constructions
10、and material used for manufacture of these dry-type transformers, the working group was unable to define an existing insulation system that could be used as a control for comparison with an insulation system under test. Therefore, an arbitrary extrapolation criteria of 40 000 h was selected for the
11、evaluation. The working group urges the dry-type transformer industry to report results of tests performed with this procedure in order to provide a basis for the future improvement of this standard. The working group considered aging under voltage stresses that might cause partial discharge at oper
12、ating voltage, but ruled it out because present transformers are generally designed to be as free as practical of partial discharges at operating voltage. The working group also considered a vibration and shock procedure as one of the aging factors. So little information is published regarding the e
13、ffects of vibration and shock in high-voltage insulation systems, however, that it was impossible to include it in the test procedure. The working group urges the industry to report procedures and results of any testing of insulation systems that uses vibration and shock so that future revisions of
14、this standard may incorporate these factors, if they are found to be significant. This standard relates voltage withstand endpoint criteria to the impulse voltage distribution within the coil or to the initial voltage withstand of the coil. A relationship between impulse withstand of the insulation
15、and short-term 60 Hz withstand was identified in the past so that 50/60 Hz testing of model coils would be possible. This method, which was used historically in IEEE C57.12.56, has been deleted from the procedure, but is retained in the informative Annex B for reference purposes only. Notice to user
16、s Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the appl
17、icable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. iv Copyright 2010 IEEE. All rights reserved. Copyrights This document is copyrighted by the
18、IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and ado
19、ption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time t
20、hrough the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and wheth
21、er it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE
22、standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata peri
23、odically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publica
24、tion of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Pa
25、tents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any p
26、atent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board fo
27、r approval, the Distribution and Transformers Working Group had the following membership: Roger Wicks, Chair Carl Bush Dale Corel Derek Foster Geoffrey Gill Mark Gromlovits Michael Haas Charles Johnson Timothy Lewis Richard Marek Walter Morehart Martin Navarro Dhiru Patel David Stankes The following
28、 members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Samuel H. Aguirre Stan Arnot Robert Ballard Peter Balma Paul Barnhart Thomas Blackburn William Bloethe Steven Brockschink Chris Brooks Carl Bush Yunxiang Chen Gar
29、y L. Donner Terry Drees Gary Engmann Marcel Fortin Derek Foster Jalal Gohari Randall Groves Bal Gupta Michael Haas David Harris Gary Heuston Clark Jacobson Charles Johnson Joseph L. Koepfinger Jim Kulchisky John Lackey Chung-Yiu Lam Richard Marek John W. Matthews Gary Michel Daniel Mulkey Randolph M
30、ullikin Jerry Murphy Michael S. Newman Bansi Patel J. Patton Howard Penrose Alvaro Portillo Iulian Profir Jeffrey Ray Robert Resuali Michael Roberts Charles Rogers Edward Rowe Thomas Rozek Sukhbir Sachdev Bartien Sayogo Hyeong Sim James E. Smith Jerry Smith Kwok Sum So Gary Stoedter John Sullivan Da
31、vid Tepen John Vergis Roger Wicks James Wilson Kipp Yule When the IEEE-SA Standards Board approved this standard on 11 November 2009, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor
32、 Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Parsons Ronald C. Petersen Narayanan Ramachandran Jon Walter Rosdahl Sam Sciacca *Member Emeritus vi Copyright 2010 I
33、EEE. All rights reserved. Also included are the following nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic, NIST Representative Satish Aggarwal, NRC Representative Michelle D. Turner IEEE Standards Program Manager, Document Development Matthew J. Cegl
34、ia IEEE Standards Program Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Basic considerations . 3 3.1 General 3 3.2 Intent of test methods 3 3.3 Aging factors . 3 3.4 Data treatment
35、3 4. Test procedures. 4 4.1 General 4 4.2 Test samples 5 4.3 Screening . 9 4.4 Test cycles . 9 4.5 Temperature aging. 10 4.6 Cold shock (solid-cast and resin-encapsulated designs only) 12 4.7 Humidity conditioning. 12 4.8 Dielectric tests . 12 5. Reporting 15 Annex A (informative) Bibliography . 16
36、Annex B (informative) Historical simulated impulse test using 50/60 Hz . 17 B.1 General 17 Annex C (informative) Historic figures from IEEE Std C57.12.56-1986 19 Annex D (informative) Experience based suggested techniques 22 D.1 Method for applying thermocouples. 22 D.2 Enclosures. 22 D.3 Temperatur
37、e control 23 D.4 Humidity control. 23 viii Copyright 2010 IEEE. All rights reserved. IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin-Encapsulated Transformers IMPORTANT NOTICE: Thi
38、s standard is not intended to ensure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made avail
39、able for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on requ
40、est from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This test procedure for the thermal evaluation of insulation systems of dry-type power and distribution transformers, including both open-wound technology and solid-cast / encapsulated technology is to be
41、 used for determining the temperature classification of the insulation systems. 1 Copyright 2010 IEEE. All rights reserved. IEEE Std C57.12.60-2009 IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-
42、Cast, and Resin-Encapsulated Transformers 1.2 Purpose The purpose of this test procedure is to establish a uniform method for the following: a) Providing data for the selection of the temperature classification of the insulation system; b) Providing data that may be used as a basis for a loading gui
43、de; c) Comparative evaluation of different insulation systems. 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document
44、 is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ASTM E104, Standard Practice for Maintaining Constant Relative Humidity by Means of Aqueous Solutions.1ASTM D5
45、374, Standard Test Methods for Forced-Convection Laboratory Ovens for Evaluation of Electrical Insulation. IEEE Std 1, IEEE Standard General Principles for Temperature Limits in the Rating of Electric Equipment and for the Evaluation of Electrical Insulation. 2, 3IEEE Std 4, IEEE Standard Techniques
46、 for High-Voltage Testing. IEEE Std 101, IEEE Guide for the Statistical Analysis of Thermal Life Test Data. IEEE Std 259, IEEE Standard Test Procedure for Evaluation of Systems of Insulation for Dry-Type Specialty and General-Purpose Transformers IEEE Std C57.12.58, IEEE Guide for Conducting a Trans
47、ient Voltage Analysis of a Dry-Type Transformer Coil. IEEE Std C57.98, IEEE Guide for Transformer Impulse Tests. 1ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, USA. 2IEEE publications are available from t
48、he Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 3The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 2 Copyright 2010 IEEE. All rights reser
49、ved. IEEE Std C57.12.60-2009 IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin-Encapsulated Transformers 3. Basic considerations 3.1 General This test method is based on the retention of the basic impulse insulation level by impulse testing. It is therefore most applicable to high-voltage windings. For this reason, a low-voltage winding of 600 V or less is excluded from this test procedure, except where necessary to perform an induced test or to pr
