1、IEEE Std C57.13.1-2006IEEE Guide for Field Testing of RelayingCurrent TransformersI E E E3 Park Avenue New York, NY 10016-5997, USA28 February 2007IEEE Power Engineering SocietySponsored by thePower Systems Relaying CommitteeIEEE Std C57.13.1-2006(R2012)IEEE Guide for Field Testing of Relaying Curre
2、nt Transformers Sponsor Power System Relaying Committee of the IEEE Power Engineering Society Approved 16 November 2006 Reaffirmed 29 March 2012 IEEE-SA Standards Board ii Copyright 2007 IEEE. All rights reserved. Abstract: This guide describes field test methods that assure that current transformer
3、s are connected properly, are of marked ratio and polarity, and are in a condition to perform as designed both initially and after having been in service for a period of time. Keywords: current transformers, excitation, field testing, insulation, polarity, ratio, relaying _ The Institute of Electric
4、al and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 28 February 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1
5、978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C57.13.1-2006, IEEE Guide for Field
6、 Testing of Relaying Current Transformers. This project revises the previous guide to keep it current with technological changes in instrument transformers and test equipment. In the application of protective relays, a widely used input quantity is current. A multiplicity of different protective rel
7、ays either utilize current directly, combine it with other currents as in differential schemes, or combine it with voltage to make impedance or power measurements. The source of relay input current is from current transformers, which may be located on the bushings of power circuit breakers and power
8、 transformers, on the bus bars of metal clad switchgear, or installed as separate items of equipment located as required. This guide should be used in conjunction with other references, such as IEEE Std C57.13, IEEE Standard Requirements for Instrument Transformersa; IEC Standard 60044-8, Instrument
9、 TransformersElectrical Current Transducers B2; and Handbook for Electricity Metering, EEI Publication No. 93-02-03 B1.bNotice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. User
10、s are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subj
11、ect matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to impl
12、ement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. aInformation on references can be found in Clause 2. bInformation on bibliographical references can be found in Annex D. v Copyright 2007 IEEE. All rights reserved.
13、 Participants At the time this guide was completed, the Revision of C57.3.1, IEEE Guide for Field Testing of Relaying Current Transformers Working Group had the following membership: Mike Meisinger, Chair Don Sevcik, Vice-chair Steve Conrad Paul Drum Harley Gilleland Rich Hunt James Hrabliuk Roger M
14、eachem Brian Mugalian Bruce Pickett Mohindar Sachdev Veselin Skendzic Larry Smith Stan Thompson Don Ware Del Weers Stephan Weiss The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael W. Adams Steven
15、 C. Alexanderson Javier Arteaga Ali Al Awazi Michael P. Baldwin G. J. Bartok Martin Baur Robert W. Beresh Wallace B. Binder, Jr Stuart H. Bouchey Steven Brockschink Carl L. Bush Danila Chernetsov Keith Chow Stephen P. Conrad Tommy P. Cooper Jorge E. Fernandez Daher Ratan Das Ronald L. Daubert Eric J
16、. Davis F. A. Denbrock Kevin E. Donahoe Randall L. Dotson Paul Drum Donald G. Dunn Surinder K. Dureja Paul R. Elkin Gary R. Engmann Marcel Fortin Saurabh Ghosh Manuel M. Gonzalez Charles W. Grose Randall C. Groves James H. Gurney Michael E. Haas Kenneth S. Hanus Thomas C. Harbaugh Ryusuke Hasegawa R
17、oger A. Hedding Adrienne M. Hendrickson Gary A. Heuston Jerry W. Hohn Donald L. Hornak John J. Horwath Dennis Horwitz James D. Huddleston, III David W. Jackson David V. James Jose A. Jarque James H. Jones Gael Kennedy Morteza Khodaie Joseph L.Koepfinger Jim Kulchisky Saumen K. Kundu Yeou Song Lee Bl
18、ane Leuschner Lisardo Lourido William G. Lowe William Lumpkins G. L. Luri William A. Maguire Keith N. Malmedal William J. Marsh, Jr John W. Matthews Michael J. McDonald Mark F. McGranaghan Mike Meisinger Joseph P. Melanson Gary L. Michel Le Quang Minh William A. Moncrief Brian Mugalian Randolph Mull
19、ikin Jerry R.Murphy Kyaw Myint George R. Nail Krste Najdenkoski Bradley D. Nelson Arthur S. Neubauer Michael S. Newman Joe W. Nims Gary L. Nissen T. W. Olsen Chris L. Osterloh Lorraine K. Padden Joshua Park Dhiru S. Patel Ralph E. Patterson Vikram Punj Jeffrey L. Ray Johannes Rickmann Michael A. Rob
20、erts Thomas Schossig Robert J. Schuerger K. H. Sebra Tony L. Seegers Bogdan Seliger Don Sevcik Devki N. Sharma Stephen D. Shull Tarlochan S. Sidhu Hyeong J. Sim Mark S. Simon Veselin Skendzic James E. Smith Larry Smith Aaron F. Snyder Allan D. St. Peter Richard P. Taylor Eric A. Udren Joseph J. Vasc
21、hak Del Weers Ray Young Roland E. Youngberg James Alan Ziebarth Waldemar Ziomek Ahmed F. Zobaa vi Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this application guide on 16 November 2006, it had the following membership: Steve M. Mills, Chair Richard H. Hulett,
22、Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy William R. Goldbach Arnold M. Greenspan Robert M. Grow Joanna N. Guenin Julian Forster* Mark S. Halpin Kenneth S. Hanus William B. Hopf Joseph L. Koepfinger* David J. Law Daleep C. Mohla T. W. Olsen Glenn Pars
23、ons Ronald C. Petersen Tom A. Prevost Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Walter Weigel Howad L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Represe
24、ntative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Catherine Berger IEEE Standards Project Editor vii Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Consideration of American Na
25、tional Standards Institute (ANSI) accuracy classes . 2 5. Precautions in field testing CTs 3 5.1 Demagnetizing CTs . 3 5.2 Greater primary winding turns. 3 6. Types of tests and measurements . 4 6.1 Ratio test 4 6.2 Polarity test 4 6.3 Insulation resistance test 4 6.4 Resistance measurement 4 6.5 Ex
26、citation test 4 6.6 Admittance test 4 6.7 Burden test. 4 7. AC sources for primary current injection tests . 5 8. Ratio tests . 5 8.1 Voltage method 5 8.2 Out-of-service current method. 6 8.3 In-service current manual method . 7 8.4 In-service current automated method 7 9. Polarity test. 7 9.1 DC vo
27、ltage test 7 9.2 AC voltage testoscilloscope. 8 9.3 Current method 9 9.4 Phase angle method . 9 10. Insulation resistance tests . 11 11. Winding and lead resistance (internal resistance). 11 12. Excitation test . 12 viii Copyright 2007 IEEE. All rights reserved. 13. Admittance test. 13 14. Burden te
28、sts 14 15. Burden measurements 14 16. Specialized situations . 15 16.1 CT in a closed-delta transformer connection . 15 16.2 Generator CTs 15 16.3 Inter-core coupling check 15 Annex A (informative) Wiring integrity, test switches and test equipment . 17 A.1 Wiring integrity 17 A.2 Test switches. 17
29、A.3 Test equipment 18 Annex B (informative) Excitation voltage measurement considerations . 20 B.1 Why average? 20 B.2 Typical test results 20 B.3 Effect of source impedance. 21 B.4 Waveform simulation 22 Annex C (informative) Optical current sensor systems 24 C.1 Components of optical current senso
30、r systems . 24 C.2 Why optical sensor systems are usedcharacteristics and benefits . 25 C.3 Conventional transformers characteristics and issues that are not applicable in the field testing of optical current sensors . 25 C.4 Field testing of optical current sensor . 25 C.5 Maintenance/routine testi
31、ng of optical sensor systems . 28 Annex D (informative) Bibliography . 29 1 Copyright 2007 IEEE. All rights reserved. IEEE Guide for Field Testing of Relaying Current Transformers 1. Overview 1.1 Scope The scope of this guide is to describe field test methods that assure current transformers (CTs) a
32、re connected properly, are of marked ratio and polarity, and are in a condition to perform as designed both initially and after being in service for a period of time. Annex A describes wiring integrity checks, uses of test jacks and current shorting switch, and relay test equipment. Annex B illustra
33、tes excitation voltage measurement differences between rms responding voltmeters, commonly used under field conditions, and average responding voltmeters commonly used in laboratory tests and also discusses the effect of the source impedance. Annex C describes the characteristics, and other pertinen
34、t information, for optical current sensor systems used with protective relaying. It provides an overview of the components used in an optical sensor system, discusses the differences from conventional CTs, and provides testing information. Annex D is the bibliography for this guide. 1.2 Purpose The
35、purpose of the guide is to provide information on the current technology for field testing of instrument transformers and to more closely coordinate the information with the other industry standards, for example, National Electrical Safety Code(NESC). IEEE Std C57.13.1-2006 IEEE GUIDE FOR FIELD TEST
36、ING OF RELAYING CURRENT TRANSFORMERS 2 Copyright 2007 IEEE. All rights reserved. 2. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the
37、referenced document (including any amendments or corrigenda) applies. Accredited Standards Committee C2, National Electrical Safety Code(NESC).1IEEE Std C57.13, IEEE Standard Requirements for Instrument Transformers.2, 3IEEE Std C57.13.3, IEEE Guide for Grounding of Instrument Transformer Secondary
38、Circuits and Cases. IEEE Std C37.110, IEEE Guide for Application of Current Transformers Used for Protective Relaying Purposes. 3. Definitions For terms used in this guide, see IEEE Std C37.100, IEEE Standard Definitions for Power Switchgear B5.4For all other terms, The Authoritative Dictionary of I
39、EEE Standards, Seventh Edition B3 should be referenced. 4. Consideration of American National Standards Institute (ANSI) accuracy classes Relaying accuracy classes have been established in IEEE Std C57.13 to specify the performance of relaying CTs. During faults on the electric power system, relayin
40、g CTs must operate at high overcurrent levels. ANSI classifications, therefore, define minimum steady-state performance at these levels. Performance is described by using a two-term identification system consisting of a letter and a number as follows: C100, C200, C400, C800, T10, T20, T50, T100, T20
41、0, T400, T800. The first term of this identification describes performance in terms basically relating to construction; C represents calculated and T represents tested. The second term specifies the secondary voltage that can be delivered by the secondary winding at 20 times rated secondary current
42、through a standard burden without exceeding 10% ratio error. As an example, a C100 rating means that the ratio error will not exceed 10% at any current from 1 to 20 times the rated current with a standard 1.0 g525 burden. (1.0 g525 times 5 A times 20 times rated secondary current equals 100 V.) The
43、ANSI voltage rating applies to the full secondary winding only. If other than the full winding is used, the voltage rating is reduced in approximate proportion to turns used only if the windings are evenly distributed. For more details and discussions, see IEEE Std C37.110. Details of low-energy, su
44、ch as opto-electronic transducers, are not discussed in this guide. Some details are provided in Annex C. Analog input issues are discussed in the IEEE Std C37.92B4. 1The NESC is available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-
45、1331, USA (http:/standards.ieee.org/). 2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/). 3The IEEE standards or products referred to in this clause are trademarks of t
46、he Institute of Electrical and Electronics Engineers, Inc. 4The numbers in brackets correspond to those of the bibliography in Annex D. IEEE Std C57.13.1-2006 IEEE GUIDE FOR FIELD TESTING OF RELAYING CURRENT TRANSFORMERS 3 Copyright 2007 IEEE. All rights reserved. 5. Precautions in field testing CTs
47、 WARNING Many of the tests called for in this guide involve high voltage and, therefore, should be performed only by experienced personnel familiar with any peculiarities or hazards that may exist in the test setups and test procedures. While some hazards are specifically pointed out herein, it is i
48、mpractical to list all necessary precautions. 5.1 Demagnetizing CTs If there is any reason to suspect that a CT has been subjected recently to heavy currents, possibly involving a large dc component, or has been magnetized by any application of dc voltage, it should be demagnetized before conducting
49、 any tests that require accurate measurements of current. It is also prudent to demagnetize the CT after the tests are completed. One method used for demagnetizing the CT is to apply a suitable variable alternating voltage to the CTs secondary winding, with an initial magnitude sufficient to force its flux density above its saturation point, and then decrease the applied voltage slowly and continuously to zero. The test connections used for this method of demagnetizing are identical to those required for the excitation
