ISO IEC 13210-1999 Information technology - Requirements and Guidelines for Test Methods Specifications and Test Method Implementations for Measuring Conformanc.pdf

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1、Reference number ISO/IEC 13210:1999(E) IEEE Std 2003, 1997 edition INTERNATIONAL STANDARD ISO/IEC 13210 IEEE Std 2003 Second edition 1999-12-15 Information technology Requirements and Guidelines for Test Methods Specifications and Test Method Implementations for Measuring Conformance to POSIX Standa

2、rds Technologies de linformation Exigences et lignes directrices pour les spcifications de mthodes dessai et les mises en uvre de mthode dessai pour mesurer la conformit aux normes POSIXISO/IEC 13210:1999(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licen

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5、n taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 734 10 7

6、9 E-mail copyrightiso.ch Web www.iso.chAbstract: This International Standard denes the requirements and guidelines for test method specications and test method implementations for measuring conformance to POSIX standards. Test specication standard developers for other Application Programming Interfa

7、ce (API) standards are encouraged to use this standard. This document is aimed primarily at developers and users of test method specications and implementations. Keywords: assertion, assertion test, implementation under test, option, conformance document, conformance test procedure, conformance test

8、 software, test method implementation, test method specication, test result code POSIX is a registered trademark of the Institute of Electrical and Electronics Engineers, Inc. The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 199

9、8 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1998. Printed in the United States of America. ISBN 1-55937-895-6 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permi

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