1、 Reference number ISO/IEC TR 29123:2007(E) ISO 2007TECHNICAL REPORT ISO/TR 29123 First edition 2007-12-15 Identification Cards Proximity Cards Requirements for the enhancement of interoperability Cartes didentification Cartes de proximit Exigences pour lamlioration de linteroprabilit ISO/IEC TR 2912
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5、ow. COPYRIGHT PROTECTED DOCUMENT ISO 2007 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the addre
6、ss below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2007 All rights reservedISO/IEC TR 29123:2007(E) ISO/IEC 2007
7、All rights reserved iii Contents Page Foreword vi Introduction vii 1 Scope. 1 2 Normative references. 1 3 Terms and definitions. 1 4 Symbols (and abbreviated terms) . 2 5 General Test Requirements and Conditions2 5.1 Test Environment 2 5.1.1 Test setup 2 5.1.2 PICC test apparatus 2 5.1.3 PCD test ap
8、paratus. 3 5.2 Nominal Environment. 3 5.3 Definition of PCD Measurement reference point.3 6 PCD Power Transfer. 3 6.1 PCD Operating Field Strength. 3 6.1.1 Test Description 3 6.1.2 Conditions . 4 6.1.3 Test report. 4 6.2 Resonant Frequency of PICC (informal only) 4 7 PCD Communication Signal Interfa
9、ce 4 7.1 Purpose 4 7.2 RF Noise and Signal Distortion (informal only). 5 7.3 Load modulation reception test (Type A and B) 5 7.3.1 Test Description 5 7.3.2 Conditions . 5 7.3.3 Parameters 5 7.3.4 Pass Criteria 6 7.4 Modulation Index and Waveform Test (Types A and B) . 6 7.4.1 Test Description 6 7.4.
10、2 Conditions . 6 7.4.3 Parameters 6 7.4.4 Pass Criteria 6 8 PCD Framing and timing tests 7 8.1 Type A Frame Delay Time PICC to PCD 7 8.1.1 Test Description 7 8.1.2 Conditions . 7 8.1.3 Parameters 7 8.1.4 Pass Criteria 7 8.1.5 Remarks. 7 8.2 Type A Frame Delay Time PCD to PICC 7 8.2.1 Test Descriptio
11、n 7 8.2.2 Conditions . 7 8.2.3 Parameters 7 8.2.4 Pass Criteria 7 8.3 Type B PCD Bit Boundaries. 8 8.3.1 Test Description 8 8.3.2 Conditions . 8 8.3.3 Parameters 8 ISO/IEC TR 29123:2007(E) iv ISO/IEC 2007 All rights reserved8.3.4 Pass Criteria 8 8.4 Type B PCD Start-of-Frame type 2, when the subject
12、 is still under technical development or where for any other reason there is the future but not immediate possibility of an agreement on an International Standard; type 3, when the joint technical committee has collected data of a different kind from that which is normally published as an Internatio
13、nal Standard (“state of the art”, for example). Technical Reports of types 1 and 2 are subject to review within three years of publication, to decide whether they can be transformed into International Standards. Technical Reports of type 3 do not necessarily have to be reviewed until the data they p
14、rovide are considered to be no longer valid or useful. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. ISO/IEC TR 29123, which is a Technical
15、 Report of type 2, was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC 17, Cards and personal identification. ISO/IEC TR 29123:2007(E) ISO/IEC 2007 All rights reserved vii Introduction This Technical Report describes requirements for improving the interop
16、erability of proximity cards systems compliant with ISO/IEC 14443. It consists of test functionality based on the ISO/IEC 14443 series and the ISO/IEC 10373-6 test methods standards that may optionally be included in proximity devices in order to improve testability as defined in Annex B. A number o
17、f practical tests are then defined. The contents of this Technical Report may be incorporated into the Revision of ISO/IEC 10373-6, and subsequently may be withdrawn after the publication of ISO/IEC 10373-6 (Revision), expected in 2009. TECHNICAL REPORT ISO/IEC TR 29123:2007(E) ISO/IEC 2007 All righ
18、ts reserved 1 Identification Cards Proximity Cards Requirements for the enhancement of interoperability 1 Scope This Technical Report defines a series of requirement and tests used to enhance the interoperability of Proximity cards (PICC) and Proximity coupling devices (PCD) defined in the ISO/IEC 1
19、4443 series and tested in accordance with ISO/IEC 10373-6. Conformance to this Technical Report should increase the chance that the PICCs and PCDs designed to the ISO/IEC 14443 series of standards will be interoperable. 2 Normative references The following referenced documents are indispensable for
20、the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 10373-6:2001, Identification cards Test methods Part 6: Proximity cards ISO/IEC 14443-1:2000, Iden
21、tification cards Contactless integrated circuit(s) cards Proximity cards Part 1: Physical characteristics ISO/IEC 14443-2:2001, Identification cards Contactless integrated circuit(s) cards Proximity cards Part 2: Radio frequency power and signal interface ISO/IEC 14443-3:2001, Identification cards C
22、ontactless integrated circuit(s) cards Proximity cards Part 3: Initialization and anticollision ISO/IEC 14443-4:2001, Identification cards Contactless integrated circuit(s) cards Proximity cards Part 4: Transmission protocol 3 Terms and definitions For the purposes of this document, the following te
23、rms and definitions apply. 3.1 base standard ISO/IEC 14443, the standard to which the tests refer 3.2 test method method for testing the characteristics of PICCs and PCDs for the purpose of assessing their conformance with International Standards ISO/IEC TR 29123:2007(E) 2 ISO/IEC 2007 All rights re
24、served4 Symbols (and abbreviated terms) For the purposes of this document, the following abbreviations apply: ATS Answer to select DUT Device under test EGT Extra guard time EOF End of frame etu Elementary time unit fc Carrier frequency (13,56MHz) FDT Frame delay time fs Sub-carrier frequency H max
25、Maximum field strength of the PCD antenna field H min Minimum field strength of the PCD antenna field PCD Proximity coupling device PICC Proximity integrated circuit card PPS Protocol and parameter selection RATS Request for answer to select SOF Start of frame 5 General Test Requirements and Conditi
26、ons Tests described in this technical report may be performed in any sequence. 5.1 Test Environment A proximity card system consists of a PCD and a minimum of one PICC. In order to test either a PCD or PICC, test apparatus is required in order to fulfill the functionality of the other component. Ann
27、ex A defines reference test apparatus in order to undertake testing of a proximity device. A reference PCD is required in order to test a PICC, A reference PICC is required to test a PCD. These reference devices have been standardized such that all facilities undertaking the testing defined in this
28、standard can do so in a consistent manner. Unless otherwise specified, the tests in this technical report shall be applied to PICCs and PCDs defined in ISO/IEC 14443. 5.1.1 Test setup All cables used to connect apparatus in the test setup should be kept as short as possible, for certain critical cab
29、les see the appropriate clause. No metallic objects (or electronic equipment) may be placed within a 30 cm radius of the test setup wherever fields might be affected. Other electromagnetic sources including PCDs, that could influence the test results, shall not be present. 5.1.2 PICC test apparatus
30、The PICC test apparatus shall be as defined in ISO/IEC 10373-6 with additional functionality as required by further clauses of this document. ISO/IEC TR 29123:2007(E) ISO/IEC 2007 All rights reserved 3 5.1.3 PCD test apparatus The PCD test apparatus shall be as defined in ISO/IEC 10373-6 with additi
31、onal functionality as required by further clauses of this document. 5.2 Nominal Environment Unless otherwise specified, to ensure consistent conditions, tests shall be performed within the following nominal environment: Table 1 Nominal Environment Parameter ValueTemperature Nominal Temperature of 23
32、 C 3 C (73 F 5 F) Relative humidity 40 % to 60 % 5.3 Definition of PCD Measurement reference point All tests shall be done over a certain set of points within the manufacturers defined conformity volume. The PCD manufacturer shall define a Reference Point as the (0,0,0) point for the X,Y,Z axis and
33、plane where the optimal position on the surface of the PCD for contactless operation is located. When performing tests, all position references given shall be relative to the Reference Point. X and Y locations shall be in the same plane as the face of the PCD on which the optimal position is located
34、. Height Z shall be calculated perpendicular to the face of the PCD on which the optimal position is located such that: For height Z = 0 mm: The DUT antenna shall be placed in contact with the Reference Point. For height Z = n mm: The DUT antenna shall be placed exactly n mm along the main axis. 6 P
35、CD Power Transfer 6.1 PCD Operating Field Strength The purpose of this test is to check if the PCD meets the field strength requirements, within its defined conformity volume. 6.1.1 Test Description The field strength measured under loaded conditions, with the reference PICC, shall be between H min,
36、 PCDand H max, PCDrecorded for all measurement positions defined within the defined conformity volume. The measurement device used for this test shall be the Reference PICC for field and power measurements defined in ISO/IEC 10373-6:2001, Annex D. Perform the following steps for H min, PCD : 1) Adju
37、st the resonance frequency of the Reference PICC to 13,56 MHz as described in ISO/IEC 10373-6:2001/Amd.2:2003. 2) Put the Reference PICC into the Test PCD assembly. ISO/IEC TR 29123:2007(E) 4 ISO/IEC 2007 All rights reserved3) Adjust the resistor R2 to obtain 3 V (dc) at field strength of H min, PCD
38、 . 4) Put the Reference PICC into the measurement positions within the PCD conformity volume. 5) For all measurement positions within the PCD conformity volume, the dc voltage at R2 shall be greater or equal to 3 V. Perform the following steps for H maxPCD : 1) Adjust the resonance frequency of the
39、Reference PICC to 19 MHz as described in ISO/IEC 10373-6:2001/Amd.2:2003. 2) Put the Reference PICC into the Test PCD assembly. 3) Adjust the resistor R2 to obtain 3 V (dc) at field strength of H max, PCD . 4) For all measurement positions within the PCD conformity volume, the dc voltage at R2 shall
40、 be less than 3 V. Optionally perform the following steps for H min, PCD to meet Class 1 PICC requirements. 1) Adjust the resonance frequency of the Reference PICC to 13,56 MHz as described in ISO/IEC 10373-6:2001/Amd.2:2003. 2) Put the Reference PICC into the Test PCD assembly. 3) Adjust the resist
41、or R2 to obtain 6 V (dc) at field strength of H min, PCD . 4) Put the Reference PICC into the measurement positions within the PCD Class 1conformity volume. 5) For all measurement positions within the PCD Class 1 conformity volume, the dc voltage at R2 shall be greater or equal to 6V. 6.1.2 Conditio
42、ns Temperature range: As per the manufacturers specification. 6.1.3 Test report The test report shall include the number of passed tests versus the total number of tests, a test description and the date of the tests. 6.2 Resonant Frequency of PICC (informal only) No requirement for the resonant freq
43、uency of the PICC is currently specified in ISO/IEC 14443. If this test is performed test procedures as defined in ISO/IEC 10373-6:2001/Amd.2:2003, clause 7.3, should be used. 7 PCD Communication Signal Interface 7.1 Purpose The PCD modulates the carrier signal used to power the PICC within its defined conformance volume to send data frames. The PICC modulates the carrier signal with a sub-carrier which is used to send responses to the
