1、 IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000 V Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.100.2-2018 IEEE Std C37.100.2-2018 IEEE Standard for Common Requir
2、ements for Testing of AC Capacitive Current Switching Devices over 1000 V Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 8 March 2018 IEEE-SA Standards Board 2 Abstract: Common requirements for testing of AC capacitive current switching devices with nominal system voltage
3、 above 1000 V are provided in this standard. Keywords: back-to-back switching, bank charging, C0, C1, C2, cable charging, capacitive current switching, capacitor switching, design test, IEEE C37.100.2, line charging, preconditioning, restrike, single-phase testing, synthetic test, three-phase testin
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33、sibility. Further information may be obtained from the IEEE Standards Association 6 Copyright 2018 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the PC37.100.2 Working Group had the following membership: Neil McCord, Chair John C. Webb, Vice Chair Donald Swing
34、, Secretary Roy Alexander Edwin Almeida Anne Bosma Antone Bonner Frank DeCesaro Edgar Dullni Sergio Flores Harold Hirz Peter Meyer Tom Mulcahy Brian Roberts R. Kirkland Smith James van de Ligt The following members of the individual balloting committee voted on this standard. Balloters may have vote
35、d for approval, disapproval, or abstention. Roy Alexander Chris Ambrose Roy Ayers Thomas Barnes George Becker W. J. (Bill) Bergman Jean-Marc Biasse Wallace Binder Antone Bonner Anne Bosma Jeffrey Brogdon Ted Burse Eldridge Byron Paul Cardinal Stephen Cary Chih Chow Lucas Collette Michael Crawford Ga
36、ry Donner Denis Dufournet Edgar Dullni Jerry Earl Douglas J. Edwards Cliff Erven Sergio Flores Marcel Fortin Frank Gerleve David Gilmer Mietek Glinkowski Randall Groves John Harder John Harley Helmut Heiermeier Jeffrey Helzer Victor Hermosillo James Houston Todd Irwin Richard Jackson Song Jin Laszlo
37、 Kadar Jeffrey Kester Yuri Khersonsky James Kinney Joseph L. Koepfinger Peter Kowalik Jim Kulchisky Chung-Yiu Lam Benjamin Lanz Hua Liu R. Long Frank Mayle Omar Mazzoni Neil McCord Peter Meyer Sujeet Mishra Thomas Mulcahy Daniel Mulkey Michael Newman Joe Nims T. W. Olsen Lorraine Padden Jim Phillips
38、 Iulian Profir Reynaldo Ramos Samala Santosh Reddy Carl Reigart Anthony Ricciuti Brian Roberts Michael Roberts Timothy Robirds Charles Rogers Thomas Rozek Bartien Sayogo Nikunj Shah Hamid Sharifnia Devki Sharma Michael Skidmore Jeremy Smith Jerry Smith R. Kirkland Smith James Stage Tom Stefanski Mic
39、hael Swearingen Donald Swing Marcelo Valdes James van de Ligt Roger Verdolin John Vergis Mark Waldron John C. Webb Jan Weisker Kenneth White Terry Woodyard Richard York Jian Yu 7 Copyright 2018 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 8 March 2018, it had
40、 the following membership: Jean-Philippe Faure, Chair Gary Hoffman, Vice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Ted Burse Guido R. Hiertz Christel Hunter Joseph L. Koepfinger* Thomas Koshy Hung Ling Dong Liu Xiaohui Liu Kevin Lu Daleep Mohla Andrew Myles Paul Nikolich R
41、onald C. Petersen Annette D. Reilly Robby Robson Dorothy Stanley Mehmet Ulema Phil Wennblom Philip Winston Howard Wolfman Jingyi Zhou *Member Emeritus 8 Copyright 2018 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.100.2-2018, IEEE Standard for Common Requireme
42、nts for Testing of AC Capacitive Current Switching Devices over 1000 V. The scope of this document is limited to testing switching devices for capacitive current switching capability only. For other testing requirements, refer to the relevant apparatus standards. This capacitive current switching te
43、st standard is a document combining the requirements of IEEE Std C37.09a-2005 B7 with IEEE Std C37.66-2005 B11 and IEEE Std 1247-2005 B3. IEEE Std C37.09a-2005 was selected as the base document because it had been harmonized by a joint IEEE/IEC task force that developed a revised approach to capacit
44、ive current switching standardization. IEC has published this task forces work as part of IECs circuit breaker standard, designated IEC 62271-100. Please note that since IEEE Std C37.016-2006 B9 refers to IEEE Std 1247-2005 B3 for all of the capacitive current switching tests it specifies, considera
45、tion of IEEE Std 1247-2005 B3 covers the requirements of IEEE Std C37.016-2006 B9. The term circuit-breaker from IEEE Std C37.09a B7 has been replaced with the term capacitive current switching device for this document. These standards represent two basic methods for determining capacitive current s
46、witching performance. The method to prove performance per IEEE Std C37.09a B7 is based on focusing on the performance at minimum arcing time and then demonstrating the rest of the interrupting window. IEEE Std C37.66 B11 and IEEE Std 1247 B3 are testing performance and endurance through a large numb
47、er of test operations up to 1200 operations. To reconcile the different methods a subclause, 4.9, was added to this standard allowing the 1200 random operation method to be used to achieve a capacitive current switching rating. For example, a C2 rating can be achieved either by 1200 single-phase ope
48、rations with a maximum of two restrikes as specified in IEEE Std C37.66 B11 or 168 single-phase operations (targeted to minimum arcing time) with no restrikes as specified in IEEE Std C37.09a B7. The three classes of capacitive current switching test restrike performance are retained from IEEE Std C
49、37.09avery low probability of restrike (Class C2), low probability of restrike (Class C1), and unspecified probability of restrike (Class C0). IEEE Std C37.09a B7 is based on an assumption of “simultaneity”. IEEE Std 1247-2005 B3 had a detailed scheme in Table 4. The working group has simplified this table to two values. If the non-simultaneity is between 0 and 90 electrical degrees, then the voltage factor (kc) is 1.4. If the non-simultaneity is greater than or equal to 90 electrical degrees, then the voltage factor (kc) is 2.1. 9 Copyrigh
