IEEE 48-1996(R-2003) - IEEE Standard Test Procedures and Requirements for Alternating- Current Cable Terminations 2.5 kV Through 765 kV.pdf

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1、The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1996 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1996. Printed in the United States of America.ISBN 1-55937-698-8No part of this pub

2、lication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written per-mission of the publisher.IEEE Std 48-1996(R2003)(Revision of IEEE Std 48-1990)IEEE Standard Test Proceduresand Requirements for Alternating-Current Cable Terminations2.5 kV Through 7

3、65 kVSponsorInsulated Conductors Committeeof theIEEE Power Engineering SocietyReaffirmed 11 September 2003Approved 2 May 1996IEEE Standards BoardAbstract: All indoor and outdoor cable terminations used on alternating-current cables having laminated orextruded insulation rated 2.5 kV through 765 kV a

4、re covered, except for separable insulated connectors,which are covered by IEEE Std 386-1995.Keywords: accelerated contamination testing, correction factors, dielectric field tests, environmental expo-sure, nonstandard service conditions, rating, solar radiation, standard service conditions, test re

5、quirements,ultraviolet lightIEEE Standardsdocuments are developed within the Technical Committees of the IEEE Societiesand the Standards Coordinating Committees of the IEEE Standards Board. Members of the com-mittees serve voluntarily and without compensation. They are not necessarily members of the

6、 Insti-tute. The standards developed within IEEE represent a consensus of the broad expertise on thesubject within the Institute as well as those activities outside of IEEE that have expressed an inter-est in participating in the development of the standard.Use of an IEEE Standard is wholly voluntar

7、y. The existence of an IEEE Standard does not implythat there are no other ways to produce, test, measure, purchase, market, or provide other goods andservices related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to c

8、hange brought about through developments inthe state of the art and comments received from users of the standard. Every IEEE Standard is sub-jected to review at least every five years for revision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is reasona

9、ble to conclude that its contents,although still of some value, do not wholly reflect the present state of the art. Users are cautioned tocheck to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardles

10、s ofmembership affiliation with IEEE. Suggestions for changes in documents should be in the form of aproposed change of text, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards asthey relate to specific appli

11、cations. When the need for interpretations is brought to the attention ofIEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards rep-resent a consensus of all concerned interests, it is important to ensure that any interpretation hasalso received the concurren

12、ce of a balance of interests. For this reason IEEE and the members of itstechnical committees are not able to provide an instant response to interpretation requests except inthose cases where the matter has previously received formal consideration. Comments on standards and requests for interpretati

13、ons should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use isgranted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appr

14、opriatefee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contactCopyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA;(508) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use

15、can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of a

16、ny patent rights inconnection therewith. The IEEE shall not be responsible for identifying all patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.iiiIntroduction(This introducti

17、on is not part of IEEE Std 48-1996, IEEE Standard Test Procedures and Requirements for Alternating-Current Cable Terminations 2.5 kV Through 765 kV.)This standard supersedes IEEE Std 48-1990, IEEE Standard Test Procedures and Requirements for High-Voltage Alternating-Current Cable Terminations.Sever

18、al definitions have been added to reflect use of polymeric designs and to differentiate between variousenvironments encountered. To clarify test procedures, Class 1 terminations have been divided into threeclasses: Class 1A for extruded dielectric cable, Class 1B for laminated dielectric cable, and

19、Class 1C forpressure-type systems.Partial discharge requirements for laminated cable terminations have been replaced by ionization testrequirements, which are more applicable for laminated cable constructions. Retesting is not intended now asthe partial discharge is more difficult. Reflecting cable

20、voltage trends, table 1 contains test requirements upto 765 kV for laminated dielectric terminations and 230 kV for solid dielectric cable terminations.Clause 9 has been expanded to include a pollution severity guide to assist the user to define a particularenvironment and help determine type and cr

21、eepage length needed. Effects of solar radiation are addressedand test methods are recommended. The user is also advised to refer to the manufacturer for contaminationtesting, particularly if difficult environments are encountered.At the time this standard was approved, Working Group 10-40 of the Ac

22、cessories Subcommittee 10 of theInsulated Conductors Committee had the following membership:Harold C. Hervig,ChairGlenn J. Luzzi,Vice ChairThe following persons were on the balloting committee:Torben AaboThomas BlackMichael BayerPaul BloyedVincent J. BoliverThomas C. ChampionPeter DayJohn P. DuPontH

23、enry DreschEngene FavrieR. D. FulcomerRobert B. GearWolfgang HaverkampAlbert KongRaoul H. LeuteritzJeff MackevichJohn MakalJames NationGreg P. RampleyDean RedmanMatthew H. SpaldingWendall T. StarrFrank StepniakDuc B. TrinhRichard VotoupalSteven P. WalldorfHarry YaworskiTorben AaboT. J. Al-HussainiR.

24、 W. AllenW. O. AndersenRichard H. ArndtThomas P. ArnoldTheodore A. BalaskaAnthony BarlowEarle C. BascomMichael BayerChas. W. BladesDavid T. BogdenVincent J. BoliverKenneth E. BowHarvey L. BowlesJohn E. BramfittKent W. BrownMichael D. BuckweitzR. R. BurghardtPaul S. CardelloJohn L. CarlsonThomas C. C

25、hampionPaul L. CinquemaniW. E. ColeE. J. DAquannoJames M. DalyRuss C. DantzlerJoseph A. Di CostanzoClaus DoenchJohn P. DupontGeorge S. EagerR. M. EichhornJohn S. EngelhardtStephen FitzhughArthur R. FitzpatrickRobert E. FlemingEric O. ForsterS. Michael FotyRonald F. FrankR. D. FulcomerJohn B. Gardner

26、Robert B. GearA. GodoshianJoe H. GroegerLaurence H. GrossivWhen the IEEE Standards Board approved this standard on 2 May 1996, it had the following membership:Donald C. Loughry,ChairRichard J. Holleman,Vice ChairAndrew G. Salem,Secretary*Member EmeritusAlso included are the following nonvoting IEEE

27、Standards Board liaisons:Satish K. AggarwalAlan H. CooksonChester C. TaylorValerie E. ZelentyIEEE Standards Project EditorKenneth HancockRichard L. HarpV. Stan HarperRichard A. HartleinHarold C. HervigStanley V. HeyerRussell W. HigginbottomLauri J. HiivalaAsit K. HiranandaniJohn W. HoffmanDarrel R.

28、JeterAllan S. JonesC. KatzLawrence J. KellyFred KimseyJoel KitchensFrederick B. KochJames A. KriegFrank KuchtaF. E. LaGaseCarl LandingerJack LaskyJack LawsonRaoul H. LeuteritzJohn V. LipeMark LowellGabor LudasiR. LutherGlen J. LuzziJeff MackevichM. A. MartinMatthew MashikianSpiro G. MastorasAndrew R

29、. McCullochE. J. McGowanW. J. McNultyJ. D. MedekAndreas MeierJohn E. MerandoJ. David MintzJames A. Moran, Jr.Shantanu NandiDan J. NicholsHarry E. OrtonJames J. PachotCutter D. PalmerKeith A. PettyJames J. PickeringJan S. PirrongGary PolhillRonald J. PonistPaul F. PughPeter RalstonGreg P. RampleyRobe

30、rt A. ResualiR. B. RobertsonCandelario de J. Saldivar-CantuRalph W. SammGeorge W. SemanGilbert L. SmithJoseph SnowMatthew H. SpaldingNagu N. SrinivasThomas F. StaboszJoseph L. SteinerGrover L. Stell, Jr.Orloff W. StyveMike D. SweatW. Keith SwitzerJohn TanakaJames W. TarpeyFrank A. TetiH. D. ThomasWi

31、lliam A. ThueAustin C. TingleyWilliam TorokDuc B. TrinhStephen E. TurnerFred W. Van NestRichard S. VencusDonald A. VoltzCharles F. von Herrmann, Jr.Richard L. VotoupalMichael L. WalkerSteven P. WalldorfEdward WaltonDaniel J. WardJ. Nick WareRoland H. W. WatkinsGene C. WeitzArthur C. WestromJohn L. W

32、hiteCharles A. WhiteWilliam D. WilkensRobert O. WilkinsonJ. A. WilliamsWilliam G. WimmerJoseph T. ZimnochGilles A. BarilClyde R. CampJoseph A. CannatelliStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Donald N. HeirmanBen C. JohnsonE. G. “Al” KienerJoseph L. Koepfinger*Lawrence

33、V. McCallL. Bruce McClungMarco W. MigliaroMary Lou PadgettJohn W. PopeJose R. RamosArthur K. ReillyRonald H. ReimerGary S. RobinsonIngo RschJohn S. RyanChee Kiow TanLeonard L. TrippHoward L. WolfmanvContentsCLAUSE PAGE1. Scope. 12. References. 13. Definitions. 24. Service conditions. 34.1 Standard s

34、ervice conditions . 34.2 Nonstandard service conditions . 45. Rating. 46. Product markings . 67. Test requirements. 67.1 Design tests . 67.2 Routine tests. 87.3 Dielectric field tests . 108. Test procedures . 108.1 Preparation of test specimen . 108.2 Standard test conditions . 118.3 Correction fact

35、ors. 128.4 Design tests . 138.5 Routine tests. 208.6 Dielectric field tests . 219. Application guide. 229.1 Application at altitudes greater than 1000 m (3300 ft). 229.2 Effect of solar radiation (ultraviolet light). 229.3 Environmental exposure . 239.4 Accelerated contamination testing. 2410. Bibli

36、ography . 25IEEE Standard Test Proceduresand Requirements for Alternating-Current Cable Terminations2.5 kV Through 765 kV1. ScopeThis standard covers all indoor and outdoor cable terminations used on alternating-current cables havinglaminated or extruded insulation rated 2.5 kV through 765 kV, excep

37、t separable insulated connectors, whichare covered by IEEE Std 386-1995, IEEE Standard for Separable Insulated Connector Systems for PowerDistribution Systems Above 600 V B16.1Cable terminations and component parts shall be capable of withstanding the tests specified in this standard.2. ReferencesTh

38、is standard shall be used in conjunction with the following standards. When the following standards aresuperseded by an approved revision, the revision shall apply.IEC 270-1981, Partial Discharge Measurements.2IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing (ANSI).3IEEE Std 82-199

39、4, IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors(ANSI).IEEE Std 835-1994, IEEE Standard Power Cable Ampacity Tables (ANSI).1The numbers in brackets correspond to those of the bibliography in clause 10.2IEC publications are available from IEC Sales Department, Case Po

40、stale 131, 3, rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse. IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 11West 42nd Street, 13th Floor, New York, NY 10036, USA.3IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445

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